SG150446A1 - System and method for using a memory mapping function to map memory defects - Google Patents

System and method for using a memory mapping function to map memory defects

Info

Publication number
SG150446A1
SG150446A1 SG200805816-6A SG2008058166A SG150446A1 SG 150446 A1 SG150446 A1 SG 150446A1 SG 2008058166 A SG2008058166 A SG 2008058166A SG 150446 A1 SG150446 A1 SG 150446A1
Authority
SG
Singapore
Prior art keywords
memory
map
usable
defects
mapping function
Prior art date
Application number
SG200805816-6A
Other languages
English (en)
Inventor
Mukund P Khatri
Forrest E Norrod
Jimmy D Pike
Michael Shepherd
Paul D Stultz
Original Assignee
Dell Products Lp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dell Products Lp filed Critical Dell Products Lp
Publication of SG150446A1 publication Critical patent/SG150446A1/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16—Error detection or correction of the data by redundancy in hardware
    • G06F11/1666—Error detection or correction of the data by redundancy in hardware where the redundant component is memory or memory area
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/14—Error detection or correction of the data by redundancy in operation
    • G06F11/1402—Saving, restoring, recovering or retrying
    • G06F11/1415—Saving, restoring, recovering or retrying at system level
    • G06F11/1417—Boot up procedures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
    • G06F2212/72—Details relating to flash memory management
    • G06F2212/7207—Details relating to flash memory management management of metadata or control data
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0407—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals on power on
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
SG200805816-6A 2007-08-14 2008-08-04 System and method for using a memory mapping function to map memory defects SG150446A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/838,687 US7694195B2 (en) 2007-08-14 2007-08-14 System and method for using a memory mapping function to map memory defects

Publications (1)

Publication Number Publication Date
SG150446A1 true SG150446A1 (en) 2009-03-30

Family

ID=39870210

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200805816-6A SG150446A1 (en) 2007-08-14 2008-08-04 System and method for using a memory mapping function to map memory defects

Country Status (5)

Country Link
US (2) US7694195B2 (fr)
EP (1) EP2026209B1 (fr)
CN (1) CN101369246B (fr)
SG (1) SG150446A1 (fr)
TW (1) TWI356303B (fr)

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US8276029B2 (en) 2012-09-25
US7694195B2 (en) 2010-04-06
CN101369246B (zh) 2012-01-25
TWI356303B (en) 2012-01-11
EP2026209B1 (fr) 2016-07-20
CN101369246A (zh) 2009-02-18
US20100251044A1 (en) 2010-09-30
EP2026209A2 (fr) 2009-02-18
TW200912645A (en) 2009-03-16
US20090049270A1 (en) 2009-02-19

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