SG129370A1 - On-die heating circuit and control loop for rapid heating of the die - Google Patents

On-die heating circuit and control loop for rapid heating of the die

Info

Publication number
SG129370A1
SG129370A1 SG200604605A SG200604605A SG129370A1 SG 129370 A1 SG129370 A1 SG 129370A1 SG 200604605 A SG200604605 A SG 200604605A SG 200604605 A SG200604605 A SG 200604605A SG 129370 A1 SG129370 A1 SG 129370A1
Authority
SG
Singapore
Prior art keywords
die
heating
control loop
integrated circuit
heating circuit
Prior art date
Application number
SG200604605A
Other languages
English (en)
Inventor
Jody Greenberg
Sehat Sutardja
Original Assignee
Marvell World Trade Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/242,230 external-priority patent/US7375597B2/en
Priority claimed from US11/243,017 external-priority patent/US7852098B2/en
Application filed by Marvell World Trade Ltd filed Critical Marvell World Trade Ltd
Publication of SG129370A1 publication Critical patent/SG129370A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/345—Arrangements for heating
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Control Of Temperature (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
SG200604605A 2005-08-01 2006-07-12 On-die heating circuit and control loop for rapid heating of the die SG129370A1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US70439905P 2005-08-01 2005-08-01
US72222605P 2005-09-30 2005-09-30
US11/242,230 US7375597B2 (en) 2005-08-01 2005-10-03 Low-noise fine-frequency tuning
US11/243,017 US7852098B2 (en) 2005-08-01 2005-10-03 On-die heating circuit and control loop for rapid heating of the die

Publications (1)

Publication Number Publication Date
SG129370A1 true SG129370A1 (en) 2007-02-26

Family

ID=37026994

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200604605A SG129370A1 (en) 2005-08-01 2006-07-12 On-die heating circuit and control loop for rapid heating of the die

Country Status (6)

Country Link
EP (1) EP1750301A3 (ja)
JP (1) JP4758843B2 (ja)
CN (1) CN1975621B (ja)
SG (1) SG129370A1 (ja)
TW (1) TWI310123B (ja)
WO (1) WO2007016601A2 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5170395B2 (ja) * 2008-02-21 2013-03-27 日本電気株式会社 ウエハ及びその温度試験方法
CN111238669B (zh) * 2018-11-29 2022-05-13 拓荆科技股份有限公司 用于半导体射频处理装置的温度测量方法
US11243550B2 (en) * 2020-05-29 2022-02-08 Juniper Networks, Inc. Optical-electrical device using hybrid automated testing equipment
CN113326167B (zh) * 2021-05-13 2022-07-08 山东英信计算机技术有限公司 基于基板管理控制器通信的定温可调测试器和测试方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3383614A (en) 1965-06-28 1968-05-14 Texas Instruments Inc Temperature stabilized semiconductor devices
US4497998A (en) * 1982-12-23 1985-02-05 Fairchild Camera And Instrument Corp. Temperature stabilized stop-restart oscillator
US4980586A (en) * 1987-10-07 1990-12-25 Tektronix, Inc. Digital integrated circuit propagation delay regulator
FR2641127B1 (ja) * 1988-12-23 1993-12-24 Thomson Hybrides Microondes
US5309090A (en) * 1990-09-06 1994-05-03 Lipp Robert J Apparatus for heating and controlling temperature in an integrated circuit chip
DE19727972A1 (de) 1996-07-02 1998-01-08 Ihlenfeld Waldemar Gui Kuerten Halbleitersubstrat mit temperaturstabilisierbarer elektronischer Schaltung
US5793022A (en) * 1996-09-12 1998-08-11 Applied Materials, Inc. Adaptive temperture controller and method of operation
JP2000277686A (ja) * 1999-03-29 2000-10-06 Mitsumi Electric Co Ltd 半導体集積回路
JP4295896B2 (ja) * 1999-04-21 2009-07-15 株式会社アドバンテスト Ｃｍｏｓ集積回路及びこれを用いたタイミング信号発生装置
US7042301B2 (en) 2002-10-15 2006-05-09 Marvell International Ltd. Crystal oscillator emulator
US6954706B2 (en) * 2003-08-20 2005-10-11 Hewlett-Packard Development Company, L.P. Method for measuring integrated circuit processor power demand and associated system
US8037445B2 (en) 2003-08-20 2011-10-11 Hewlett-Packard Development Company, L.P. System for and method of controlling a VLSI environment

Also Published As

Publication number Publication date
TWI310123B (en) 2009-05-21
CN1975621B (zh) 2010-10-13
WO2007016601A2 (en) 2007-02-08
WO2007016601A3 (en) 2007-04-26
TW200707151A (en) 2007-02-16
JP4758843B2 (ja) 2011-08-31
CN1975621A (zh) 2007-06-06
JP2007043153A (ja) 2007-02-15
EP1750301A2 (en) 2007-02-07
EP1750301A3 (en) 2008-07-02

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