SG126917A1 - Method and apparatus for x-ray diffraction analysis - Google Patents

Method and apparatus for x-ray diffraction analysis

Info

Publication number
SG126917A1
SG126917A1 SG200602902A SG200602902A SG126917A1 SG 126917 A1 SG126917 A1 SG 126917A1 SG 200602902 A SG200602902 A SG 200602902A SG 200602902 A SG200602902 A SG 200602902A SG 126917 A1 SG126917 A1 SG 126917A1
Authority
SG
Singapore
Prior art keywords
ray diffraction
diffraction analysis
analysis
ray
diffraction
Prior art date
Application number
SG200602902A
Other languages
English (en)
Inventor
Olaf Grassmann
Michael Hennig
Remo Anton Hochstrasser
Urs Schwitter
Original Assignee
Hoffmann La Roche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoffmann La Roche filed Critical Hoffmann La Roche
Publication of SG126917A1 publication Critical patent/SG126917A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SG200602902A 2005-05-02 2006-04-28 Method and apparatus for x-ray diffraction analysis SG126917A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05076024A EP1720006A1 (en) 2005-05-02 2005-05-02 Method and apparatus for x-ray diffraction analysis

Publications (1)

Publication Number Publication Date
SG126917A1 true SG126917A1 (en) 2006-11-29

Family

ID=34938235

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200602902A SG126917A1 (en) 2005-05-02 2006-04-28 Method and apparatus for x-ray diffraction analysis

Country Status (7)

Country Link
US (1) US7409041B2 (zh)
EP (1) EP1720006A1 (zh)
JP (1) JP2006313157A (zh)
CN (1) CN1858583B (zh)
CA (1) CA2544907C (zh)
ES (1) ES2374930T3 (zh)
SG (1) SG126917A1 (zh)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008035933A1 (de) * 2008-07-31 2010-02-04 Carl Zeiss Microlmaging Gmbh Vorrichtung zum Halten und Positionieren einer Probe relativ zu einem Mikroskopobjektiv
US8315358B2 (en) 2009-06-04 2012-11-20 Nextray, Inc. Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods
US8204174B2 (en) 2009-06-04 2012-06-19 Nextray, Inc. Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals
US7978820B2 (en) * 2009-10-22 2011-07-12 Panalytical B.V. X-ray diffraction and fluorescence
US8488740B2 (en) * 2010-11-18 2013-07-16 Panalytical B.V. Diffractometer
CN102507620B (zh) * 2011-10-18 2013-06-26 丹东奥龙射线仪器有限公司 一种获取晶体衍射斑点的装置
CN102980903B (zh) * 2012-12-04 2015-08-19 中国科学院上海硅酸盐研究所 一种用于分析电极材料电化学性能的同步辐射x射线衍射装置及其应用
EP2927945B1 (en) 2014-04-04 2023-05-31 Nordson Corporation X-ray inspection apparatus for inspecting semiconductor wafers
CN104701119B (zh) * 2015-03-25 2017-12-08 汇佳生物仪器（上海）有限公司 多x线源模块集中辐照转筒式辐照机
CN104776946B (zh) * 2015-05-06 2018-04-17 中国原子能科学研究院 用于放射性样品中子残余应力测量的屏蔽装置
IT201800004825A1 (it) * 2018-04-24 2019-10-24 Procedimento e dispositivo per il campionamento dello spazio di testa
TW202035977A (zh) * 2019-03-20 2020-10-01 美商卡爾蔡司Ｓｍｔ公司 樣品固定架、系統及方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0645878Y2 (ja) * 1988-06-07 1994-11-24 理学電機株式会社 極図形測定装置用スリット装置
JPH05264477A (ja) * 1992-03-18 1993-10-12 Sumitomo Metal Ind Ltd 結晶相の配向度分析法
JP3553362B2 (ja) * 1998-03-19 2004-08-11 日本電子株式会社 Ｘ線分析装置
WO2000010191A1 (en) * 1998-08-12 2000-02-24 Gatan, Inc. Double tilt and rotate specimen holder for a transmission electron microscope
US6163592A (en) * 1999-01-28 2000-12-19 Bruker Axs, Inc. Beam scattering measurement system with transmitted beam energy detection
CN2496018Y (zh) * 2001-10-08 2002-06-19 中国科学院物理研究所 一种多功能x射线衍射仪
US7702071B2 (en) * 2002-01-15 2010-04-20 Avantium International B.V. Method for performing power diffraction analysis
US6859520B2 (en) * 2002-03-21 2005-02-22 Bruker Axs, Inc. Transmission mode X-ray diffraction screening system
JP3883060B2 (ja) * 2002-06-17 2007-02-21 株式会社リガク 結晶評価装置
JP3697246B2 (ja) * 2003-03-26 2005-09-21 株式会社リガク Ｘ線回折装置
DE10317678A1 (de) * 2003-04-17 2004-11-18 Bruker Axs Gmbh Röntgen-optisches System zum kombinatorischen Screening einer Probenbibliothek

Also Published As

Publication number Publication date
CA2544907A1 (en) 2006-11-02
CN1858583B (zh) 2012-07-11
CA2544907C (en) 2015-07-14
JP2006313157A (ja) 2006-11-16
ES2374930T3 (es) 2012-02-23
CN1858583A (zh) 2006-11-08
US7409041B2 (en) 2008-08-05
US20060245544A1 (en) 2006-11-02
EP1720006A1 (en) 2006-11-08

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