SG122896A1 - Plasma processing apparatus and methods for removing extraneous material from selected areas on a substrate - Google Patents
Plasma processing apparatus and methods for removing extraneous material from selected areas on a substrateInfo
- Publication number
- SG122896A1 SG122896A1 SG200507044A SG200507044A SG122896A1 SG 122896 A1 SG122896 A1 SG 122896A1 SG 200507044 A SG200507044 A SG 200507044A SG 200507044 A SG200507044 A SG 200507044A SG 122896 A1 SG122896 A1 SG 122896A1
- Authority
- SG
- Singapore
- Prior art keywords
- substrate
- methods
- processing apparatus
- plasma processing
- selected areas
- Prior art date
Links
- 239000000463 material Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F4/00—Processes for removing metallic material from surfaces, not provided for in group C23F1/00 or C23F3/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning In General (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/003,062 US7635418B2 (en) | 2004-12-03 | 2004-12-03 | Plasma processing apparatus and methods for removing extraneous material from selected areas on a substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
SG122896A1 true SG122896A1 (en) | 2006-06-29 |
Family
ID=36572886
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200507044A SG122896A1 (en) | 2004-12-03 | 2005-11-18 | Plasma processing apparatus and methods for removing extraneous material from selected areas on a substrate |
Country Status (5)
Country | Link |
---|---|
US (2) | US7635418B2 (ja) |
JP (1) | JP5301765B2 (ja) |
CN (1) | CN100468615C (ja) |
SG (1) | SG122896A1 (ja) |
TW (1) | TWI394865B (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7635418B2 (en) * | 2004-12-03 | 2009-12-22 | Nordson Corporation | Plasma processing apparatus and methods for removing extraneous material from selected areas on a substrate |
US20060201910A1 (en) * | 2004-12-22 | 2006-09-14 | Nordson Corporation | Methods for removing extraneous amounts of molding material from a substrate |
US7842223B2 (en) * | 2004-12-22 | 2010-11-30 | Nordson Corporation | Plasma process for removing excess molding material from a substrate |
DE102008064047A1 (de) * | 2008-10-02 | 2010-04-08 | Continental Teves Ag & Co. Ohg | Sensorelement und Trägerelement zur Herstellung eines Sensors |
DE102008064046A1 (de) * | 2008-10-02 | 2010-04-08 | Continental Teves Ag & Co. Ohg | Verfahren zur Herstellung eines Geschwindigkeits-Sensorelementes |
US8627835B2 (en) * | 2011-04-13 | 2014-01-14 | Intermolecular, Inc. | In-situ cleaning assembly |
US10983721B2 (en) * | 2018-07-13 | 2021-04-20 | Fungible, Inc. | Deterministic finite automata node construction and memory mapping for regular expression accelerator |
CN109136836A (zh) * | 2018-10-12 | 2019-01-04 | 京东方科技集团股份有限公司 | 掩膜板、晶圆、蒸镀装置及蒸镀方法 |
US11263190B2 (en) | 2019-09-26 | 2022-03-01 | Fungible, Inc. | Data ingestion and storage by data processing unit having stream-processing hardware accelerators |
US11636115B2 (en) | 2019-09-26 | 2023-04-25 | Fungible, Inc. | Query processing using data processing units having DFA/NFA hardware accelerators |
US11636154B2 (en) | 2019-09-26 | 2023-04-25 | Fungible, Inc. | Data flow graph-driven analytics platform using data processing units having hardware accelerators |
US11934964B2 (en) | 2020-03-20 | 2024-03-19 | Microsoft Technology Licensing, Llc | Finite automata global counter in a data flow graph-driven analytics platform having analytics hardware accelerators |
Family Cites Families (41)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS59220934A (ja) * | 1983-05-31 | 1984-12-12 | Toshiba Corp | 樹脂封止型半導体装置の製造方法 |
US4534921A (en) | 1984-03-06 | 1985-08-13 | Asm Fico Tooling, B.V. | Method and apparatus for mold cleaning by reverse sputtering |
US4599970A (en) * | 1985-03-11 | 1986-07-15 | Rca Corporation | Apparatus for coating a selected area of the surface of an object |
DE3673773D1 (de) | 1985-06-11 | 1990-10-04 | American Telephone & Telegraph | Leiterrahmengratentfernung. |
JPH0643923B2 (ja) * | 1986-01-16 | 1994-06-08 | 東芝セラミツクス株式会社 | 溶融金属の連続測温計 |
US5208067A (en) | 1986-04-14 | 1993-05-04 | International Business Machines Corporation | Surface modification of organic materials to improve adhesion |
JPH05501526A (ja) | 1989-11-24 | 1993-03-25 | アーエスエム・フィーコ・トゥーリング・ベスローテン・フェンノートシャップ | 成形装置 |
JPH06285868A (ja) | 1993-03-30 | 1994-10-11 | Bridgestone Corp | 加硫金型の清浄方法 |
US5961860A (en) | 1995-06-01 | 1999-10-05 | National University Of Singapore | Pulse laser induced removal of mold flash on integrated circuit packages |
US6498074B2 (en) * | 1996-10-29 | 2002-12-24 | Tru-Si Technologies, Inc. | Thinning and dicing of semiconductor wafers using dry etch, and obtaining semiconductor chips with rounded bottom edges and corners |
JPH1177512A (ja) * | 1997-09-09 | 1999-03-23 | Oki Electric Ind Co Ltd | 表面実装パッケージのリード端子自動研磨方法及びその自動研磨装置 |
US6230719B1 (en) * | 1998-02-27 | 2001-05-15 | Micron Technology, Inc. | Apparatus for removing contaminants on electronic devices |
US6082375A (en) | 1998-05-21 | 2000-07-04 | Micron Technology, Inc. | Method of processing internal surfaces of a chemical vapor deposition reactor |
SG84519A1 (en) | 1998-12-07 | 2001-11-20 | Advanced Systems Automation | Method and apparatus for removal of mold flash |
JP3400770B2 (ja) | 1999-11-16 | 2003-04-28 | 松下電器産業株式会社 | エッチング方法、半導体装置及びその製造方法 |
US6489178B2 (en) | 2000-01-26 | 2002-12-03 | Texas Instruments Incorporated | Method of fabricating a molded package for micromechanical devices |
US6455479B1 (en) | 2000-08-03 | 2002-09-24 | Shipley Company, L.L.C. | Stripping composition |
US6439869B1 (en) | 2000-08-16 | 2002-08-27 | Micron Technology, Inc. | Apparatus for molding semiconductor components |
US6450074B1 (en) | 2000-09-01 | 2002-09-17 | Awea Mechantronic Co., Ltd. | Assembly for binding and locating an added head of numerical machine tool |
US20020031622A1 (en) | 2000-09-08 | 2002-03-14 | Ippel Scott C. | Plastic substrate for information devices and method for making same |
US6629880B1 (en) | 2000-12-14 | 2003-10-07 | National Semiconductor Corporation | Rotary mechanical buffing method for deflashing of molded integrated circuit packages |
JP2002184795A (ja) * | 2000-12-14 | 2002-06-28 | Hitachi Ltd | 半導体装置の製造方法 |
US6732913B2 (en) | 2001-04-26 | 2004-05-11 | Advanpack Solutions Pte Ltd. | Method for forming a wafer level chip scale package, and package formed thereby |
CN100410421C (zh) | 2001-05-04 | 2008-08-13 | 拉姆研究公司 | 处理室残留物的两步式等离子清洗 |
US20040235303A1 (en) | 2001-05-04 | 2004-11-25 | Lam Research Corporation | Endpoint determination of process residues in wafer-less auto clean process using optical emission spectroscopy |
US20030005943A1 (en) | 2001-05-04 | 2003-01-09 | Lam Research Corporation | High pressure wafer-less auto clean for etch applications |
US6815362B1 (en) | 2001-05-04 | 2004-11-09 | Lam Research Corporation | End point determination of process residues in wafer-less auto clean process using optical emission spectroscopy |
KR100490534B1 (ko) * | 2001-12-05 | 2005-05-17 | 삼성에스디아이 주식회사 | 유기 전자 발광 소자의 박막 증착용 마스크 프레임 조립체 |
SG109495A1 (en) | 2002-04-16 | 2005-03-30 | Micron Technology Inc | Semiconductor packages with leadfame grid arrays and components and methods for making the same |
DE10237084A1 (de) | 2002-08-05 | 2004-02-19 | Osram Opto Semiconductors Gmbh | Verfahren zum Herstellen eines elektrischen Leiterrahmens und Verfahren zum Herstellen eines oberflächenmontierbaren Halbleiterbauelements |
US6750082B2 (en) | 2002-09-13 | 2004-06-15 | Advanpack Solutions Pte. Ltd. | Method of assembling a package with an exposed die backside with and without a heatsink for flip-chip |
US20040244423A1 (en) | 2003-03-28 | 2004-12-09 | Hoya Corporation | Method of manufacturing an optical glass element |
US20040220066A1 (en) | 2003-05-01 | 2004-11-04 | Rohm And Haas Electronic Materials, L.L.C. | Stripper |
JP2007514275A (ja) | 2003-10-28 | 2007-05-31 | ノードソン コーポレーション | プラズマ処理装置及びプラズマ処理方法 |
US7959819B2 (en) | 2004-06-29 | 2011-06-14 | Shouliang Lai | Method and apparatus for reducing aspect ratio dependent etching in time division multiplexed etch processes |
US7635418B2 (en) * | 2004-12-03 | 2009-12-22 | Nordson Corporation | Plasma processing apparatus and methods for removing extraneous material from selected areas on a substrate |
US20060201910A1 (en) | 2004-12-22 | 2006-09-14 | Nordson Corporation | Methods for removing extraneous amounts of molding material from a substrate |
US7842223B2 (en) | 2004-12-22 | 2010-11-30 | Nordson Corporation | Plasma process for removing excess molding material from a substrate |
US20070052132A1 (en) | 2005-09-02 | 2007-03-08 | Gutierrez Roman C | Method and system for cleaning molded items |
US7572675B2 (en) | 2006-01-24 | 2009-08-11 | Asm Technology Singapore Pte Ltd. | Mold flash removal process for electronic devices |
DE102006016200A1 (de) | 2006-04-06 | 2007-10-11 | Krauss-Maffei Kunststofftechnik Gmbh | Verfahren und Vorrichtung zur Herstellung von mehrkomponentigen Kunststoff-Formteilen |
-
2004
- 2004-12-03 US US11/003,062 patent/US7635418B2/en not_active Expired - Fee Related
-
2005
- 2005-11-18 SG SG200507044A patent/SG122896A1/en unknown
- 2005-11-22 TW TW094141008A patent/TWI394865B/zh not_active IP Right Cessation
- 2005-12-02 JP JP2005349156A patent/JP5301765B2/ja not_active Expired - Fee Related
- 2005-12-05 CN CN200510129527.5A patent/CN100468615C/zh not_active Expired - Fee Related
-
2009
- 2009-11-09 US US12/614,551 patent/US8329590B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP5301765B2 (ja) | 2013-09-25 |
US20100075505A1 (en) | 2010-03-25 |
CN1815685A (zh) | 2006-08-09 |
CN100468615C (zh) | 2009-03-11 |
US7635418B2 (en) | 2009-12-22 |
US20060118239A1 (en) | 2006-06-08 |
JP2006203174A (ja) | 2006-08-03 |
TW200632138A (en) | 2006-09-16 |
US8329590B2 (en) | 2012-12-11 |
TWI394865B (zh) | 2013-05-01 |
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