SG11202105735WA - Mounting device - Google Patents
Mounting deviceInfo
- Publication number
- SG11202105735WA SG11202105735WA SG11202105735WA SG11202105735WA SG11202105735WA SG 11202105735W A SG11202105735W A SG 11202105735WA SG 11202105735W A SG11202105735W A SG 11202105735WA SG 11202105735W A SG11202105735W A SG 11202105735WA SG 11202105735W A SG11202105735W A SG 11202105735WA
- Authority
- SG
- Singapore
- Prior art keywords
- mounting device
- mounting
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/083—Quality monitoring using results from monitoring devices, e.g. feedback loops
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/046—Surface mounting
- H05K13/0465—Surface mounting by soldering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0817—Monitoring of soldering processes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3468—Applying molten solder
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/56—Measuring geometric parameters of semiconductor structures, e.g. profile, critical dimensions or trench depth
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018231104 | 2018-12-10 | ||
PCT/JP2019/048163 WO2020122033A1 (en) | 2018-12-10 | 2019-12-09 | Mounting device |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202105735WA true SG11202105735WA (en) | 2021-06-29 |
Family
ID=71076460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202105735WA SG11202105735WA (en) | 2018-12-10 | 2019-12-09 | Mounting device |
Country Status (7)
Country | Link |
---|---|
US (1) | US11910534B2 (en) |
JP (1) | JP7023020B2 (en) |
KR (1) | KR102454557B1 (en) |
CN (1) | CN113167570B (en) |
SG (1) | SG11202105735WA (en) |
TW (1) | TWI731492B (en) |
WO (1) | WO2020122033A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7157112B2 (en) * | 2020-10-07 | 2022-10-19 | Ckd株式会社 | Solder print inspection device |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0548256A (en) * | 1991-08-13 | 1993-02-26 | Matsushita Electric Ind Co Ltd | Surface mounting method for printed circuit board |
JPH05187838A (en) * | 1992-01-16 | 1993-07-27 | Hitachi Ltd | Device for monitoring applied state of solder paste |
JPH082085A (en) * | 1994-06-20 | 1996-01-09 | Fujitsu Ltd | Paste coating method |
JP2000039599A (en) * | 1998-07-23 | 2000-02-08 | Hitachi Ltd | Method and device for inspecting liquid crystal display substrate and liquid crystal display substrate |
JP3832622B2 (en) | 2001-03-15 | 2006-10-11 | シャープ株式会社 | Die bonding method and die bonding apparatus |
JP3858633B2 (en) * | 2001-06-25 | 2006-12-20 | 松下電器産業株式会社 | Bonding state inspection method |
JP4450223B2 (en) * | 2005-09-14 | 2010-04-14 | オムロン株式会社 | Board inspection method |
JP4746948B2 (en) * | 2005-09-21 | 2011-08-10 | 芝浦メカトロニクス株式会社 | Electronic component mounting apparatus and mounting method |
JP2015025656A (en) * | 2011-09-29 | 2015-02-05 | 株式会社日立ハイテクノロジーズ | Device for measuring shape formed on substrate |
JP5874508B2 (en) * | 2012-04-17 | 2016-03-02 | オムロン株式会社 | Solder wetting state inspection method, automatic visual inspection apparatus and board inspection system using this method |
JP5945699B2 (en) * | 2012-12-25 | 2016-07-05 | パナソニックIpマネジメント株式会社 | Electronic component mounting system and electronic component mounting method |
CN105164522B (en) * | 2013-02-03 | 2017-05-10 | 名古屋电机工业株式会社 | Inspection method for substrate with mounted parts and substrate manufacturing system employing same inspection method |
JP6450923B2 (en) * | 2013-12-20 | 2019-01-16 | パナソニックIpマネジメント株式会社 | Electronic component mounting system, electronic component mounting method, and electronic component mounting apparatus |
JP2016070810A (en) * | 2014-09-30 | 2016-05-09 | 三友工業株式会社 | Adhesive agent inspection device, adhesive agent coating device provided with adhesive agent inspection device, and adhesive agent inspection method |
JP6436141B2 (en) | 2016-09-20 | 2018-12-12 | オムロン株式会社 | X-ray inspection apparatus and control method thereof |
JP6822864B2 (en) * | 2017-01-31 | 2021-01-27 | アルファーデザイン株式会社 | Information processing equipment, information processing methods, programs, |
-
2019
- 2019-12-02 TW TW108143842A patent/TWI731492B/en active
- 2019-12-09 US US17/312,388 patent/US11910534B2/en active Active
- 2019-12-09 WO PCT/JP2019/048163 patent/WO2020122033A1/en active Application Filing
- 2019-12-09 CN CN201980078948.XA patent/CN113167570B/en active Active
- 2019-12-09 JP JP2020560104A patent/JP7023020B2/en active Active
- 2019-12-09 KR KR1020217007999A patent/KR102454557B1/en active IP Right Grant
- 2019-12-09 SG SG11202105735WA patent/SG11202105735WA/en unknown
Also Published As
Publication number | Publication date |
---|---|
KR20210044854A (en) | 2021-04-23 |
JPWO2020122033A1 (en) | 2021-09-02 |
KR102454557B1 (en) | 2022-10-14 |
US20220046838A1 (en) | 2022-02-10 |
CN113167570B (en) | 2023-01-24 |
US11910534B2 (en) | 2024-02-20 |
JP7023020B2 (en) | 2022-02-21 |
TWI731492B (en) | 2021-06-21 |
CN113167570A (en) | 2021-07-23 |
WO2020122033A1 (en) | 2020-06-18 |
TW202037883A (en) | 2020-10-16 |
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