SG11202104391RA - Wire non-attachment inspection system, wire non-attachment detection device, and wire non-attachment detection method - Google Patents

Wire non-attachment inspection system, wire non-attachment detection device, and wire non-attachment detection method

Info

Publication number
SG11202104391RA
SG11202104391RA SG11202104391RA SG11202104391RA SG11202104391RA SG 11202104391R A SG11202104391R A SG 11202104391RA SG 11202104391R A SG11202104391R A SG 11202104391RA SG 11202104391R A SG11202104391R A SG 11202104391RA SG 11202104391R A SG11202104391R A SG 11202104391RA
Authority
SG
Singapore
Prior art keywords
wire non
attachment
attachment detection
inspection system
wire
Prior art date
Application number
SG11202104391RA
Inventor
Michael Kirkby
Takaya KINJO
Hiroshi Munakata
Original Assignee
Shinkawa Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinkawa Kk filed Critical Shinkawa Kk
Publication of SG11202104391RA publication Critical patent/SG11202104391RA/en

Links

Classifications

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    • G06T7/20Analysis of motion
    • G06T7/254Analysis of motion involving subtraction of images
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
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    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
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    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
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    • G06T7/20Analysis of motion
    • G06T7/269Analysis of motion using gradient-based methods
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    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
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    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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    • H01ELECTRIC ELEMENTS
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    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/065Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
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    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/07Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
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    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
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    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
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    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
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    • H01L24/42Wire connectors; Manufacturing methods related thereto
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    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Acoustics & Sound (AREA)
  • Manufacturing & Machinery (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)
SG11202104391RA 2019-03-13 2020-03-12 Wire non-attachment inspection system, wire non-attachment detection device, and wire non-attachment detection method SG11202104391RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019046296 2019-03-13
PCT/JP2020/010693 WO2020184644A1 (en) 2019-03-13 2020-03-12 Wire non-attachment inspection system, wire non-attachment detection device, and wire non-attachment detection method

Publications (1)

Publication Number Publication Date
SG11202104391RA true SG11202104391RA (en) 2021-05-28

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Country Status (7)

Country Link
US (1) US20220130026A1 (en)
JP (1) JP7019231B2 (en)
KR (1) KR102413267B1 (en)
CN (1) CN112997307A (en)
SG (1) SG11202104391RA (en)
TW (1) TWI760708B (en)
WO (1) WO2020184644A1 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116171485A (en) 2021-05-10 2023-05-26 雅马哈智能机器控股株式会社 Defect detection device and defect detection method

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JPH09181140A (en) * 1995-12-26 1997-07-11 Toshiba Microelectron Corp Semiconductor integrated circuit assembly inspection equipment and inspection method
JPH09213752A (en) 1996-01-31 1997-08-15 Kaijo Corp Bonding failure detecting circuit for wire bonding device
JP2000137026A (en) * 1998-10-30 2000-05-16 Suzuki Motor Corp Abnormality inspection method, and joining quality inspection system for wire bonding device
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