SG11202008495TA - Semiconductor memory device - Google Patents
Semiconductor memory deviceInfo
- Publication number
- SG11202008495TA SG11202008495TA SG11202008495TA SG11202008495TA SG11202008495TA SG 11202008495T A SG11202008495T A SG 11202008495TA SG 11202008495T A SG11202008495T A SG 11202008495TA SG 11202008495T A SG11202008495T A SG 11202008495TA SG 11202008495T A SG11202008495T A SG 11202008495TA
- Authority
- SG
- Singapore
- Prior art keywords
- memory device
- semiconductor memory
- semiconductor
- memory
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/20—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels
- H10B41/23—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels
- H10B41/27—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/20—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels
- H10B43/23—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels
- H10B43/27—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
- H10B41/10—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the top-view layout
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/10—EEPROM devices comprising charge-trapping gate insulators characterised by the top-view layout
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018052558A JP2021089905A (en) | 2018-03-20 | 2018-03-20 | Semiconductor storage device |
PCT/JP2019/009686 WO2019181606A1 (en) | 2018-03-20 | 2019-03-11 | Semiconductor storage device |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202008495TA true SG11202008495TA (en) | 2020-10-29 |
Family
ID=67987758
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202008495TA SG11202008495TA (en) | 2018-03-20 | 2019-03-11 | Semiconductor memory device |
Country Status (6)
Country | Link |
---|---|
US (1) | US11569253B2 (en) |
JP (1) | JP2021089905A (en) |
CN (1) | CN111989776B (en) |
SG (1) | SG11202008495TA (en) |
TW (1) | TWI692853B (en) |
WO (1) | WO2019181606A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021141283A (en) * | 2020-03-09 | 2021-09-16 | キオクシア株式会社 | Semiconductor storage device |
JP7534046B2 (en) | 2020-08-19 | 2024-08-14 | 東京エレクトロン株式会社 | Etching method and plasma processing apparatus |
KR102603209B1 (en) * | 2021-03-26 | 2023-11-16 | 한양대학교 산학협력단 | 3d flash memory with improved stack connection and manufacturing method thereof |
WO2024057540A1 (en) * | 2022-09-16 | 2024-03-21 | キオクシア株式会社 | Semiconductor storage device and method of manufacturing semiconductor storage device |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5175525B2 (en) * | 2007-11-14 | 2013-04-03 | 株式会社東芝 | Nonvolatile semiconductor memory device |
JP4468433B2 (en) | 2007-11-30 | 2010-05-26 | 株式会社東芝 | Nonvolatile semiconductor memory device |
JP2010225741A (en) * | 2009-03-23 | 2010-10-07 | Toshiba Corp | Nonvolatile semiconductor memory device |
US8420480B2 (en) * | 2011-03-31 | 2013-04-16 | Freescale Semiconductor, Inc. | Patterning a gate stack of a non-volatile memory (NVM) with formation of a gate edge diode |
US9741736B2 (en) * | 2011-05-20 | 2017-08-22 | Kabushiki Kaisha Toshiba | Semiconductor memory device |
JP2013197419A (en) * | 2012-03-21 | 2013-09-30 | Toshiba Corp | Semiconductor device manufacturing method |
JP2014053447A (en) * | 2012-09-07 | 2014-03-20 | Toshiba Corp | Nonvolatile semiconductor storage device |
US9799671B2 (en) * | 2015-04-07 | 2017-10-24 | Sandisk Technologies Llc | Three-dimensional integration schemes for reducing fluorine-induced electrical shorts |
JP6434877B2 (en) * | 2015-08-26 | 2018-12-05 | 東芝メモリ株式会社 | Semiconductor device |
US9768191B2 (en) * | 2015-10-19 | 2017-09-19 | Toshiba Memory Corporation | Semiconductor device |
US20170141124A1 (en) * | 2015-11-17 | 2017-05-18 | Kabushiki Kaisha Toshiba | Semiconductor memory device and method for manufacturing same |
US10373967B2 (en) * | 2015-12-18 | 2019-08-06 | Floadia Corporation | Memory cell, nonvolatile semiconductor storage device, and method for manufacturing nonvolatile semiconductor storage device |
US9991280B2 (en) * | 2016-02-17 | 2018-06-05 | Sandisk Technologies Llc | Multi-tier three-dimensional memory devices containing annular dielectric spacers within memory openings and methods of making the same |
US10242994B2 (en) | 2016-03-16 | 2019-03-26 | Sandisk Technologies Llc | Three-dimensional memory device containing annular etch-stop spacer and method of making thereof |
US9780034B1 (en) * | 2016-03-16 | 2017-10-03 | Sandisk Technologies Llc | Three-dimensional memory device containing annular etch-stop spacer and method of making thereof |
US9768192B1 (en) | 2016-03-16 | 2017-09-19 | Sandisk Technologies Llc | Three-dimensional memory device containing annular etch-stop spacer and method of making thereof |
US9953993B2 (en) * | 2016-07-25 | 2018-04-24 | Toshiba Memory Corporation | Semiconductor memory device |
-
2018
- 2018-03-20 JP JP2018052558A patent/JP2021089905A/en active Pending
-
2019
- 2019-03-11 CN CN201980017141.5A patent/CN111989776B/en active Active
- 2019-03-11 SG SG11202008495TA patent/SG11202008495TA/en unknown
- 2019-03-11 WO PCT/JP2019/009686 patent/WO2019181606A1/en active Application Filing
- 2019-03-13 TW TW108108434A patent/TWI692853B/en active
-
2020
- 2020-09-01 US US17/008,975 patent/US11569253B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN111989776A (en) | 2020-11-24 |
US11569253B2 (en) | 2023-01-31 |
JP2021089905A (en) | 2021-06-10 |
US20200395371A1 (en) | 2020-12-17 |
TWI692853B (en) | 2020-05-01 |
TW201946254A (en) | 2019-12-01 |
WO2019181606A1 (en) | 2019-09-26 |
CN111989776B (en) | 2024-01-05 |
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