SG10201906019QA - Semiconductor Device - Google Patents

Semiconductor Device

Info

Publication number
SG10201906019QA
SG10201906019QA SG10201906019QA SG10201906019QA SG10201906019QA SG 10201906019Q A SG10201906019Q A SG 10201906019QA SG 10201906019Q A SG10201906019Q A SG 10201906019QA SG 10201906019Q A SG10201906019Q A SG 10201906019QA SG 10201906019Q A SG10201906019Q A SG 10201906019QA
Authority
SG
Singapore
Prior art keywords
semiconductor device
semiconductor
Prior art date
Application number
SG10201906019QA
Inventor
Jong Ho Park
Wan Don Kim
Weon Hong Kim
Hyeon Jun Baek
Byoung Hoon Lee
Jeong Hyuk Yim
Sang Jin Hyun
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of SG10201906019QA publication Critical patent/SG10201906019QA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409Unipolar field-effect transistors
    • H01L29/66477Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/6684Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a ferroelectric gate insulator
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312Gate electrodes for field effect devices
    • H01L29/42316Gate electrodes for field effect devices for field-effect transistors
    • H01L29/4232Gate electrodes for field effect devices for field-effect transistors with insulated gate
    • H01L29/42384Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor
    • H01L29/42392Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor fully surrounding the channel, e.g. gate-all-around
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/49Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
    • H01L29/51Insulating materials associated therewith
    • H01L29/516Insulating materials associated therewith with at least one ferroelectric layer

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Electrodes Of Semiconductors (AREA)
SG10201906019QA 2018-07-05 2019-06-27 Semiconductor Device SG10201906019QA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20180078126 2018-07-05
KR1020190001698A KR102557915B1 (en) 2018-07-05 2019-01-07 Semiconductor device

Publications (1)

Publication Number Publication Date
SG10201906019QA true SG10201906019QA (en) 2020-02-27

Family

ID=69156927

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201906019QA SG10201906019QA (en) 2018-07-05 2019-06-27 Semiconductor Device

Country Status (2)

Country Link
KR (1) KR102557915B1 (en)
SG (1) SG10201906019QA (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11664279B2 (en) * 2020-02-19 2023-05-30 Taiwan Semiconductor Manufacturing Co., Ltd. Multiple threshold voltage implementation through lanthanum incorporation
US11488873B2 (en) 2020-06-22 2022-11-01 Taiwan Semiconductor Manufacturing Company Metal gates and methods of forming thereby
KR20220142055A (en) 2021-04-14 2022-10-21 성기봉 space ejector extension
KR102669894B1 (en) 2022-04-18 2024-05-28 경희대학교 산학협력단 Filterless bilateral majority carrier type color photodetector and fabricating method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100868768B1 (en) * 2007-02-28 2008-11-13 삼성전자주식회사 CMOS semiconductor device and fabrication method the same
EP2112686B1 (en) * 2008-04-22 2011-10-12 Imec Method for fabricating a dual workfunction semiconductor device made thereof
KR20150037009A (en) * 2013-09-30 2015-04-08 에스케이하이닉스 주식회사 Method for fabricating semiconductor device with high―k dielectric layer and method for fabricating the same
KR102392991B1 (en) * 2016-03-10 2022-04-29 삼성전자주식회사 Semiconductor device and method for fabricating the same
US20170338350A1 (en) * 2016-05-17 2017-11-23 Globalfoundries Inc. Semiconductor device and method

Also Published As

Publication number Publication date
KR20200005418A (en) 2020-01-15
KR102557915B1 (en) 2023-07-21

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