SG10201906019QA - Semiconductor Device - Google Patents
Semiconductor DeviceInfo
- Publication number
- SG10201906019QA SG10201906019QA SG10201906019QA SG10201906019QA SG10201906019QA SG 10201906019Q A SG10201906019Q A SG 10201906019QA SG 10201906019Q A SG10201906019Q A SG 10201906019QA SG 10201906019Q A SG10201906019Q A SG 10201906019QA SG 10201906019Q A SG10201906019Q A SG 10201906019QA
- Authority
- SG
- Singapore
- Prior art keywords
- semiconductor device
- semiconductor
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/6684—Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a ferroelectric gate insulator
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/42384—Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor
- H01L29/42392—Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor fully surrounding the channel, e.g. gate-all-around
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/51—Insulating materials associated therewith
- H01L29/516—Insulating materials associated therewith with at least one ferroelectric layer
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20180078126 | 2018-07-05 | ||
KR1020190001698A KR102557915B1 (en) | 2018-07-05 | 2019-01-07 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201906019QA true SG10201906019QA (en) | 2020-02-27 |
Family
ID=69156927
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201906019QA SG10201906019QA (en) | 2018-07-05 | 2019-06-27 | Semiconductor Device |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR102557915B1 (en) |
SG (1) | SG10201906019QA (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11664279B2 (en) * | 2020-02-19 | 2023-05-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Multiple threshold voltage implementation through lanthanum incorporation |
US11488873B2 (en) | 2020-06-22 | 2022-11-01 | Taiwan Semiconductor Manufacturing Company | Metal gates and methods of forming thereby |
KR20220142055A (en) | 2021-04-14 | 2022-10-21 | 성기봉 | space ejector extension |
KR102669894B1 (en) | 2022-04-18 | 2024-05-28 | 경희대학교 산학협력단 | Filterless bilateral majority carrier type color photodetector and fabricating method thereof |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100868768B1 (en) * | 2007-02-28 | 2008-11-13 | 삼성전자주식회사 | CMOS semiconductor device and fabrication method the same |
EP2112686B1 (en) * | 2008-04-22 | 2011-10-12 | Imec | Method for fabricating a dual workfunction semiconductor device made thereof |
KR20150037009A (en) * | 2013-09-30 | 2015-04-08 | 에스케이하이닉스 주식회사 | Method for fabricating semiconductor device with high―k dielectric layer and method for fabricating the same |
KR102392991B1 (en) * | 2016-03-10 | 2022-04-29 | 삼성전자주식회사 | Semiconductor device and method for fabricating the same |
US20170338350A1 (en) * | 2016-05-17 | 2017-11-23 | Globalfoundries Inc. | Semiconductor device and method |
-
2019
- 2019-01-07 KR KR1020190001698A patent/KR102557915B1/en active IP Right Grant
- 2019-06-27 SG SG10201906019QA patent/SG10201906019QA/en unknown
Also Published As
Publication number | Publication date |
---|---|
KR20200005418A (en) | 2020-01-15 |
KR102557915B1 (en) | 2023-07-21 |
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