SG11201908188SA - Reduced footprint platform architecture with linear vacuum transfer module - Google Patents
Reduced footprint platform architecture with linear vacuum transfer moduleInfo
- Publication number
- SG11201908188SA SG11201908188SA SG11201908188SA SG11201908188SA SG 11201908188S A SG11201908188S A SG 11201908188SA SG 11201908188S A SG11201908188S A SG 11201908188SA SG 11201908188S A SG11201908188S A SG 11201908188SA
- Authority
- SG
- Singapore
- Prior art keywords
- transfer module
- international
- atv
- transfer
- california
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67178—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers vertical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67769—Storage means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/139—Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Prostheses (AREA)
- Input Circuits Of Receivers And Coupling Of Receivers And Audio Equipment (AREA)
Abstract
208 ▪ 224 • 212 204 216. 220 FIG. 2A W O 20 18/ 17 0 10 4 Al (12) INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 20 September 2018 (20.09.2018) WIP0 I PCT o mons °nolo it oloim mrnom oimIE (10) International Publication Number WO 2018/170104 Al (51) International Patent Classification: HO1L 21/677 (2006.01) HO1L 21/67 (2006.01) (21) International Application Number: PCT/US2018/022397 (22) International Filing Date: 14 March 2018 (14.03.2018) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 62/471,478 15 March 2017 (15.03.2017) US (71) Applicant: LAM RESEARCH CORPORATION [US/US]; 4650 Cushing Parkway, Fremont, California 94538 (US). (72) Inventors: GOULD, Richard H.; 4367 Torres Ave., Fre- mont, California 94536 (US). BLANK, Richard; 5033 Paseo Olivos, San Jose, California 95130 (US). (74) Agent: AQUINO, Damian M. et al.; Harness, Dickey & Published: Pierce, P.L.C., P.O. Box 828, Bloomfield Hills, Michigan 48303 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Declarations under Rule 4.17: — of inventorship (Rule 4.17(iv)) — with international search report (Art. 21(3)) (54) Title: REDUCED FOOTPRINT PLATFORM ARCHITECTURE WITH LINEAR VACUUM TRANSFER MODULE (57) : An atmosphere-to-vacuum (ATV) transfer module for a substrate pro- 200-1 236 cessing tool includes a first side configured to interface with at least one loading sta- tion, a transfer robot assembly arranged within the ATV transfer module, and a sec- ond side opposite the first side. The transfer robot assembly is configured to transfer 240 substrates between the at least one loading station and at least one load lock arranged 232 between the ATV transfer module and a vacuum transfer module (VTM). The second side is configured to interface with the at least one load lock. The transfer robot as- sembly is arranged adjacent to the second side, and the at least one load lock extends through the second side into an interior volume of the ATV transfer module.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762471478P | 2017-03-15 | 2017-03-15 | |
PCT/US2018/022397 WO2018170104A1 (en) | 2017-03-15 | 2018-03-14 | Reduced footprint platform architecture with linear vacuum transfer module |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201908188SA true SG11201908188SA (en) | 2019-10-30 |
Family
ID=63523643
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201908188S SG11201908188SA (en) | 2017-03-15 | 2018-03-14 | Reduced footprint platform architecture with linear vacuum transfer module |
SG10202110040S SG10202110040SA (en) | 2017-03-15 | 2018-03-14 | Reduced footprint platform architecture with linear vacuum transfer module |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202110040S SG10202110040SA (en) | 2017-03-15 | 2018-03-14 | Reduced footprint platform architecture with linear vacuum transfer module |
Country Status (8)
Country | Link |
---|---|
US (3) | US11521869B2 (en) |
EP (1) | EP3596752A4 (en) |
JP (2) | JP7275039B2 (en) |
KR (2) | KR20230131969A (en) |
CN (1) | CN110447095B (en) |
SG (2) | SG11201908188SA (en) |
TW (2) | TWI765984B (en) |
WO (1) | WO2018170104A1 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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US11164769B2 (en) * | 2019-07-30 | 2021-11-02 | Brooks Automation, Inc. | Robot embedded vision apparatus |
CN111081619B (en) * | 2019-12-27 | 2022-11-25 | 上海至纯洁净系统科技股份有限公司 | Wafer transmission device and method |
JP2023520600A (en) * | 2020-04-06 | 2023-05-17 | ラム リサーチ コーポレーション | Sliding and pivoting assemblies for process module bias assemblies in substrate processing systems |
CN113644005A (en) * | 2020-05-11 | 2021-11-12 | 中微半导体设备(上海)股份有限公司 | Semiconductor processing system |
JP2024518235A (en) * | 2021-04-28 | 2024-05-01 | ラム リサーチ コーポレーション | Semiconductor Tool Configuration |
JP2023070364A (en) | 2021-11-09 | 2023-05-19 | 東京エレクトロン株式会社 | Substrate processing system |
WO2023086848A1 (en) * | 2021-11-11 | 2023-05-19 | Lam Research Corporation | Nesting atmospheric robot arms for high throughput |
WO2023205361A1 (en) * | 2022-04-22 | 2023-10-26 | Lam Research Corporation | Shallow-depth equipment front end module with robot |
Family Cites Families (32)
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US5789890A (en) * | 1996-03-22 | 1998-08-04 | Genmark Automation | Robot having multiple degrees of freedom |
US6062798A (en) * | 1996-06-13 | 2000-05-16 | Brooks Automation, Inc. | Multi-level substrate processing apparatus |
US6050891A (en) * | 1998-02-06 | 2000-04-18 | Applied Materials, Inc. | Vacuum processing system with turbo-axial fan in clean-air supply system of front end environment |
US6142722A (en) * | 1998-06-17 | 2000-11-07 | Genmark Automation, Inc. | Automated opening and closing of ultra clean storage containers |
JP4558981B2 (en) | 2000-11-14 | 2010-10-06 | 株式会社ダイヘン | Transfer robot |
EP1535313B1 (en) | 2002-07-22 | 2018-10-31 | Brooks Automation, Inc. | Substrate processing apparatus |
JP4283559B2 (en) | 2003-02-24 | 2009-06-24 | 東京エレクトロン株式会社 | Conveying apparatus, vacuum processing apparatus, and atmospheric pressure conveying apparatus |
US7905960B2 (en) * | 2004-03-24 | 2011-03-15 | Jusung Engineering Co., Ltd. | Apparatus for manufacturing substrate |
US7246985B2 (en) * | 2004-04-16 | 2007-07-24 | Axcelis Technologies, Inc. | Work-piece processing system |
JP4907077B2 (en) * | 2004-11-30 | 2012-03-28 | 株式会社Sen | Wafer processing apparatus, wafer processing method, and ion implantation apparatus |
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JP5006122B2 (en) * | 2007-06-29 | 2012-08-22 | 株式会社Sokudo | Substrate processing equipment |
KR101413762B1 (en) * | 2007-08-22 | 2014-07-01 | 위순임 | Substrate processing system |
CN101383311B (en) * | 2007-09-04 | 2010-12-08 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Wafer transmission system |
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KR100998663B1 (en) * | 2010-05-24 | 2010-12-07 | 지이에스(주) | Apparatus for forming vacuum in load-lock chamber |
JP5387622B2 (en) * | 2011-06-17 | 2014-01-15 | 株式会社安川電機 | Transfer robot |
KR101829397B1 (en) | 2011-09-16 | 2018-02-19 | 퍼시몬 테크놀로지스 코포레이션 | Low variability robot |
CN103208447A (en) * | 2012-01-13 | 2013-07-17 | 诺发系统公司 | Dual Arm Vacuum Robot |
JP5810929B2 (en) | 2012-01-13 | 2015-11-11 | シンフォニアテクノロジー株式会社 | Wafer transfer device |
TWI629743B (en) | 2012-02-10 | 2018-07-11 | 布魯克斯自動機械公司 | Substrate processing apparatus |
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CN105378907A (en) * | 2013-07-24 | 2016-03-02 | 应用材料公司 | Cobalt substrate processing systems, apparatus, and methods |
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US9299598B2 (en) * | 2013-12-23 | 2016-03-29 | Lam Research Corp. | Robot with integrated aligner |
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US9818633B2 (en) * | 2014-10-17 | 2017-11-14 | Lam Research Corporation | Equipment front end module for transferring wafers and method of transferring wafers |
US10347516B2 (en) | 2014-11-11 | 2019-07-09 | Applied Materials, Inc. | Substrate transfer chamber |
KR102417929B1 (en) * | 2015-08-07 | 2022-07-06 | 에이에스엠 아이피 홀딩 비.브이. | Apparatus for substrate processing |
JP6710518B2 (en) * | 2015-12-03 | 2020-06-17 | 東京エレクトロン株式会社 | Conveying device and correction method |
JP2018174186A (en) * | 2017-03-31 | 2018-11-08 | 東京エレクトロン株式会社 | Substrate processing apparatus |
-
2018
- 2018-03-14 TW TW107108573A patent/TWI765984B/en active
- 2018-03-14 KR KR1020237030422A patent/KR20230131969A/en not_active Application Discontinuation
- 2018-03-14 JP JP2019548638A patent/JP7275039B2/en active Active
- 2018-03-14 WO PCT/US2018/022397 patent/WO2018170104A1/en unknown
- 2018-03-14 KR KR1020197030174A patent/KR102577199B1/en active IP Right Grant
- 2018-03-14 US US16/493,145 patent/US11521869B2/en active Active
- 2018-03-14 SG SG11201908188S patent/SG11201908188SA/en unknown
- 2018-03-14 SG SG10202110040S patent/SG10202110040SA/en unknown
- 2018-03-14 CN CN201880018373.8A patent/CN110447095B/en active Active
- 2018-03-14 EP EP18767005.4A patent/EP3596752A4/en active Pending
- 2018-03-14 TW TW111116765A patent/TWI793000B/en active
-
2022
- 2022-11-07 US US17/981,997 patent/US11908714B2/en active Active
-
2023
- 2023-05-02 JP JP2023076062A patent/JP2023099172A/en active Pending
-
2024
- 2024-02-19 US US18/581,084 patent/US20240194505A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US20240194505A1 (en) | 2024-06-13 |
SG10202110040SA (en) | 2021-10-28 |
TWI765984B (en) | 2022-06-01 |
JP2023099172A (en) | 2023-07-11 |
EP3596752A4 (en) | 2021-01-06 |
WO2018170104A1 (en) | 2018-09-20 |
CN110447095A (en) | 2019-11-12 |
CN110447095B (en) | 2024-04-26 |
US11908714B2 (en) | 2024-02-20 |
TWI793000B (en) | 2023-02-11 |
TW201901835A (en) | 2019-01-01 |
JP2020510310A (en) | 2020-04-02 |
TW202232632A (en) | 2022-08-16 |
KR20190120834A (en) | 2019-10-24 |
KR20230131969A (en) | 2023-09-14 |
US11521869B2 (en) | 2022-12-06 |
JP7275039B2 (en) | 2023-05-17 |
EP3596752A1 (en) | 2020-01-22 |
KR102577199B1 (en) | 2023-09-08 |
US20200083071A1 (en) | 2020-03-12 |
US20230062737A1 (en) | 2023-03-02 |
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