SG11201809861XA - Method for fabricating a strained semiconductor-on-insulator substrate - Google Patents
Method for fabricating a strained semiconductor-on-insulator substrateInfo
- Publication number
- SG11201809861XA SG11201809861XA SG11201809861XA SG11201809861XA SG11201809861XA SG 11201809861X A SG11201809861X A SG 11201809861XA SG 11201809861X A SG11201809861X A SG 11201809861XA SG 11201809861X A SG11201809861X A SG 11201809861XA SG 11201809861X A SG11201809861X A SG 11201809861XA
- Authority
- SG
- Singapore
- Prior art keywords
- layer
- substrate
- monocrystalline
- international
- strained
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76251—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques
- H01L21/76254—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques with separation/delamination along an ion implanted layer, e.g. Smart-cut, Unibond
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76264—SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
- H01L21/76275—Vertical isolation by bonding techniques
Abstract
INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property :::` , Organization 03 111111111111111111111111111111111111111111111111111111111111111111111111111111 International Bureau (10) International Publication Number (43) International Publication Date ......°' WO 2017/198687 Al 23 November 2017 (23.11.2017) WIPO I PCT (51) International Patent Classification: LE TOUVET (FR). DAVAL, Nicolas; Fontcouvert, 38570 HO1L 21/762 (2006.01) GONCELIN (FR). (21) International Application Number: (74) Agent: REGIMBEAU; 139 Rue Vendome, 69477 LYON PCT/EP2017/061793 CEDEX 06 (FR). (22) International Filing Date: (81) Designated States (unless otherwise indicated, for every 17 May 2017 (17.05.2017) kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, (25) Filing Language: English CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, (26) Publication Language: English DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, (30) Priority Data: KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, 1654369 17 May 2016 (17.05.2016) FR MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, (71) Applicant: SOITEC [FR/FR]; Parc Technologique des PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, Fontaines, Chemin des Franques, 38190 BERNIN (FR). SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (72) Inventors: SCHWARZENBACH, Walter; 19, Chemin du Mollard, 38330 SAINT NAZAIRE LES EYMES (FR). (84) Designated States (unless otherwise indicated, for every CHABANNE, Guillaume; 34 Rue des Gaillardes, 38660 kind of regional protection available): ARIPO (BW, GH, (54) Title: METHOD FOR FABRICATING A STRAINED SEMICONDUCTOR-ON-INSULATOR SUBSTRATE = (57) : The invention relates to a method for fabricating a strained sSOI T =semiconductor-on-insulator substrate, comprising: (a) the provision of a 12 donor substrate (1) comprising a monocrystalline semiconductor layer (12); (b) the provision of a receiving substrate (2) comprising a surface 13 layer (20) of a strained monocrystalline semiconductor material; (c) the / / z zoo. MY A — = bonding donor dielec- 20 of the substrate (1) to the receiving substrate (2), a tric layer (13, 22) being at the interface; (d) the transfer of the monocrys- - 2 — = portion talline semiconductor layer (12) from the donor substrate to the receiv- ing substrate; (e) the cutting, by means of trench isolations (T) extending into the receiving substrate (2) beyond the strained semiconductor ma- terial layer (20), of a from a stack formed from the transferred monocrystalline semiconductor layer, from the dielectric layer and from = _ the strained semiconductor material layer, said cutting operation result- FIGURE 'IF ing in the relaxation of the strain in the strained semiconductor material, = = and in the application of at least a part of said strain to the transferred monocrystalline semiconductor layer. The donor substrate (1) compris- = es a monocrystalline carrier substrate (10), an intermediate layer (11) = and said monocrystalline semiconductor layer (12), the intermediate layer =_ (11) forming an etch-stop layer with respect to the carrier substrate mate- rial (10) and to the material of the monocrystalline semiconductor layer (12), step (d) comprising the transfer of the monocrystalline semiconduc- tor layer (12), of the intermediate layer (11) and of a portion (15) of the carrier substrate (10). Between steps (d) and (e), a first operation of — se- lectively etching said portion (15) of the carrier substrate with respect to 1-1 said intermediate layer (11) and a second operation of selectively etching said intermediate layer (11) with respect to the monocrystalline semicon- IN ductor layer (12) are implemented. GC GC 0\ 1-1 --.... IN 1-1 0 ei C [Continued on next page] WO 2017/198687 Al MIDEDIM011010EIROIDEM0MOHHE1H1111111111111111111111111111 GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Declarations under Rule 4.17: — of inventorship (Rule 4.17(iv)) Published: — with international search report (Art. 21(3))
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1654369A FR3051596B1 (en) | 2016-05-17 | 2016-05-17 | METHOD FOR MANUFACTURING A STRESSED-ON-INSULATOR SEMICONDUCTOR-TYPE SUBSTRATE |
PCT/EP2017/061793 WO2017198687A1 (en) | 2016-05-17 | 2017-05-17 | Method for fabricating a strained semiconductor-on-insulator substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201809861XA true SG11201809861XA (en) | 2018-12-28 |
Family
ID=56322203
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201809861XA SG11201809861XA (en) | 2016-05-17 | 2017-05-17 | Method for fabricating a strained semiconductor-on-insulator substrate |
Country Status (8)
Country | Link |
---|---|
US (3) | US10957577B2 (en) |
EP (1) | EP3459107B1 (en) |
JP (1) | JP6949879B2 (en) |
CN (1) | CN109155278B (en) |
FR (1) | FR3051596B1 (en) |
SG (1) | SG11201809861XA (en) |
TW (1) | TWI711118B (en) |
WO (1) | WO2017198687A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10833194B2 (en) | 2010-08-27 | 2020-11-10 | Acorn Semi, Llc | SOI wafers and devices with buried stressor |
FR3051596B1 (en) * | 2016-05-17 | 2022-11-18 | Soitec Silicon On Insulator | METHOD FOR MANUFACTURING A STRESSED-ON-INSULATOR SEMICONDUCTOR-TYPE SUBSTRATE |
WO2020000376A1 (en) * | 2018-06-29 | 2020-01-02 | 长江存储科技有限责任公司 | Semiconductor structure and forming method therefor |
US11610808B2 (en) * | 2019-08-23 | 2023-03-21 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor wafer with low defect count and method for manufacturing thereof |
CN112447771B (en) * | 2020-10-16 | 2023-12-01 | 广东省大湾区集成电路与系统应用研究院 | GeSiOI substrate and preparation method thereof, and GeSiOI device and preparation method thereof |
US11532642B2 (en) * | 2020-12-14 | 2022-12-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Multi-function substrate |
US11955374B2 (en) | 2021-08-29 | 2024-04-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for forming SOI substrate |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4521542B2 (en) * | 1999-03-30 | 2010-08-11 | ルネサスエレクトロニクス株式会社 | Semiconductor device and semiconductor substrate |
FR2842350B1 (en) * | 2002-07-09 | 2005-05-13 | METHOD FOR TRANSFERRING A LAYER OF CONCEALED SEMICONDUCTOR MATERIAL | |
EP1443550A1 (en) * | 2003-01-29 | 2004-08-04 | S.O.I. Tec Silicon on Insulator Technologies S.A. | A method for fabricating a strained crystalline layer on an insulator, a semiconductor structure therefor, and a fabricated semiconductor structure |
US6911379B2 (en) * | 2003-03-05 | 2005-06-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming strained silicon on insulator substrate |
US7329923B2 (en) * | 2003-06-17 | 2008-02-12 | International Business Machines Corporation | High-performance CMOS devices on hybrid crystal oriented substrates |
US6830962B1 (en) * | 2003-08-05 | 2004-12-14 | International Business Machines Corporation | Self-aligned SOI with different crystal orientation using wafer bonding and SIMOX processes |
US6815278B1 (en) * | 2003-08-25 | 2004-11-09 | International Business Machines Corporation | Ultra-thin silicon-on-insulator and strained-silicon-direct-on-insulator with hybrid crystal orientations |
US6992025B2 (en) * | 2004-01-12 | 2006-01-31 | Sharp Laboratories Of America, Inc. | Strained silicon on insulator from film transfer and relaxation by hydrogen implantation |
US7087965B2 (en) * | 2004-04-22 | 2006-08-08 | International Business Machines Corporation | Strained silicon CMOS on hybrid crystal orientations |
US7767541B2 (en) * | 2005-10-26 | 2010-08-03 | International Business Machines Corporation | Methods for forming germanium-on-insulator semiconductor structures using a porous layer and semiconductor structures formed by these methods |
EP2333824B1 (en) * | 2009-12-11 | 2014-04-16 | Soitec | Manufacture of thin SOI devices |
US9406798B2 (en) | 2010-08-27 | 2016-08-02 | Acorn Technologies, Inc. | Strained semiconductor using elastic edge relaxation of a stressor combined with buried insulating layer |
KR102189611B1 (en) * | 2014-01-23 | 2020-12-14 | 글로벌웨이퍼스 씨오., 엘티디. | High resistivity soi wafers and a method of manufacturing thereof |
FR3051596B1 (en) * | 2016-05-17 | 2022-11-18 | Soitec Silicon On Insulator | METHOD FOR MANUFACTURING A STRESSED-ON-INSULATOR SEMICONDUCTOR-TYPE SUBSTRATE |
FR3051595B1 (en) * | 2016-05-17 | 2022-11-18 | Soitec Silicon On Insulator | METHOD FOR MANUFACTURING A STRESSED-ON-INSULATOR SEMICONDUCTOR-TYPE SUBSTRATE |
-
2016
- 2016-05-17 FR FR1654369A patent/FR3051596B1/en active Active
-
2017
- 2017-05-17 SG SG11201809861XA patent/SG11201809861XA/en unknown
- 2017-05-17 US US16/301,276 patent/US10957577B2/en active Active
- 2017-05-17 CN CN201780030016.9A patent/CN109155278B/en active Active
- 2017-05-17 TW TW106116265A patent/TWI711118B/en active
- 2017-05-17 JP JP2018560481A patent/JP6949879B2/en active Active
- 2017-05-17 WO PCT/EP2017/061793 patent/WO2017198687A1/en unknown
- 2017-05-17 EP EP17729386.7A patent/EP3459107B1/en active Active
-
2021
- 2021-03-19 US US17/207,202 patent/US11728207B2/en active Active
-
2023
- 2023-08-14 US US18/449,298 patent/US20230386896A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
EP3459107B1 (en) | 2019-12-18 |
US20210225695A1 (en) | 2021-07-22 |
JP6949879B2 (en) | 2021-10-13 |
US10957577B2 (en) | 2021-03-23 |
CN109155278B (en) | 2023-06-27 |
US11728207B2 (en) | 2023-08-15 |
JP2019521510A (en) | 2019-07-25 |
WO2017198687A1 (en) | 2017-11-23 |
TWI711118B (en) | 2020-11-21 |
US20200321243A1 (en) | 2020-10-08 |
FR3051596A1 (en) | 2017-11-24 |
EP3459107A1 (en) | 2019-03-27 |
US20230386896A1 (en) | 2023-11-30 |
TW201806075A (en) | 2018-02-16 |
CN109155278A (en) | 2019-01-04 |
FR3051596B1 (en) | 2022-11-18 |
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