SG11201808205QA - Ti-Nb ALLOY SPUTTERING TARGET AND PRODUCTION METHOD THEREOF - Google Patents

Ti-Nb ALLOY SPUTTERING TARGET AND PRODUCTION METHOD THEREOF

Info

Publication number
SG11201808205QA
SG11201808205QA SG11201808205QA SG11201808205QA SG11201808205QA SG 11201808205Q A SG11201808205Q A SG 11201808205QA SG 11201808205Q A SG11201808205Q A SG 11201808205QA SG 11201808205Q A SG11201808205Q A SG 11201808205QA SG 11201808205Q A SG11201808205Q A SG 11201808205QA
Authority
SG
Singapore
Prior art keywords
alloy sputtering
sputtering target
production method
target
oxygen content
Prior art date
Application number
SG11201808205QA
Other languages
English (en)
Inventor
Kunihiro Oda
Takayuki Asano
Original Assignee
Jx Nippon Mining & Metals Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jx Nippon Mining & Metals Corp filed Critical Jx Nippon Mining & Metals Corp
Publication of SG11201808205QA publication Critical patent/SG11201808205QA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3414Targets
    • H01J37/3426Material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22DCASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D7/00Casting ingots, e.g. from ferrous metals
    • B22D7/005Casting ingots, e.g. from ferrous metals from non-ferrous metals
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C1/00Making non-ferrous alloys
    • C22C1/02Making non-ferrous alloys by melting
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C14/00Alloys based on titanium
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22FCHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/002Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working by rapid cooling or quenching; cooling agents used therefor
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22FCHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/16Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
    • C22F1/18High-melting or refractory metals or alloys based thereon
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22FCHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/16Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
    • C22F1/18High-melting or refractory metals or alloys based thereon
    • C22F1/183High-melting or refractory metals or alloys based thereon of titanium or alloys based thereon
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
SG11201808205QA 2016-03-25 2017-03-23 Ti-Nb ALLOY SPUTTERING TARGET AND PRODUCTION METHOD THEREOF SG11201808205QA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016062545 2016-03-25
PCT/JP2017/011696 WO2017164302A1 (ja) 2016-03-25 2017-03-23 Ti-Nb合金スパッタリングターゲット及びその製造方法

Publications (1)

Publication Number Publication Date
SG11201808205QA true SG11201808205QA (en) 2018-10-30

Family

ID=59900250

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201808205QA SG11201808205QA (en) 2016-03-25 2017-03-23 Ti-Nb ALLOY SPUTTERING TARGET AND PRODUCTION METHOD THEREOF

Country Status (7)

Country Link
US (1) US11837449B2 (ko)
EP (1) EP3418422B1 (ko)
JP (1) JP6440866B2 (ko)
KR (1) KR102236414B1 (ko)
SG (1) SG11201808205QA (ko)
TW (1) TWI721139B (ko)
WO (1) WO2017164302A1 (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111057905B (zh) * 2020-01-13 2022-03-04 西安理工大学 一种粉末冶金制备铌钛合金的方法
CN113290178B (zh) * 2021-05-21 2022-04-19 东莞市诺德金属科技有限公司 一种高Nb含量Ti-Nb合金铸锭开坯锻造方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5197393A (en) 1975-02-21 1976-08-26 x senshutsuryokuno seigyohoho
JPH01290766A (ja) 1988-05-18 1989-11-22 Nippon Mining Co Ltd Ti含有高純度Taターゲット及びその製造方法
US5224534A (en) * 1990-09-21 1993-07-06 Nippon Mining And Metals Company, Limited Method of producing refractory metal or alloy materials
US5102450A (en) * 1991-08-01 1992-04-07 General Electric Company Method for melting titanium aluminide alloys in ceramic crucible
US6309556B1 (en) * 1998-09-03 2001-10-30 Praxair S.T. Technology, Inc. Method of manufacturing enhanced finish sputtering targets
US6348113B1 (en) * 1998-11-25 2002-02-19 Cabot Corporation High purity tantalum, products containing the same, and methods of making the same
US6331484B1 (en) 1999-03-29 2001-12-18 Lucent Technologies, Inc. Titanium-tantalum barrier layer film and method for forming the same
JP3445557B2 (ja) 1999-05-24 2003-09-08 ルーセント テクノロジーズ インコーポレーテッド チタン−タンタル障壁層薄膜及びその形成方法
JP2001131737A (ja) * 1999-11-09 2001-05-15 Nikko Materials Co Ltd スパッタリングターゲット及びその研削方法
TWI256420B (en) * 2000-04-20 2006-06-11 Toshiba Corp Sputter target, barrier film and electronic component
US20030227068A1 (en) 2001-05-31 2003-12-11 Jianxing Li Sputtering target
WO2002014576A1 (en) 2000-08-15 2002-02-21 Honeywell International Inc. Sputtering target
JP3898044B2 (ja) * 2001-12-03 2007-03-28 株式会社東芝 スパッタリングターゲット
JP4923933B2 (ja) 2006-10-10 2012-04-25 東京エレクトロン株式会社 バリヤ層の形成方法及びプラズマ成膜装置
WO2010051040A1 (en) * 2008-11-03 2010-05-06 Tosoh Smd, Inc. Method of making a sputter target and sputter targets made thereby
JP2010123586A (ja) 2008-11-17 2010-06-03 Nec Electronics Corp 半導体装置、半導体装置の製造方法
EP2412844A4 (en) * 2009-03-27 2016-12-21 Jx Nippon Mining & Metals Corp SPUTTERING TARGET OF A SINTERED TI-NB OXID BODY, TI-NB OXID THIN LAYER AND METHOD FOR PRODUCING THE THIN LAYER
JP5550328B2 (ja) * 2009-12-22 2014-07-16 株式会社東芝 Moスパッタリングターゲットおよびその製造方法
JP5701879B2 (ja) 2010-07-16 2015-04-15 Jx日鉱日石金属株式会社 タンタル基焼結体スパッタリングターゲットの製造方法
JP5979927B2 (ja) * 2012-03-19 2016-08-31 シチズンホールディングス株式会社 金色硬質装飾部材

Also Published As

Publication number Publication date
EP3418422A1 (en) 2018-12-26
WO2017164302A1 (ja) 2017-09-28
JP6440866B2 (ja) 2018-12-19
EP3418422B1 (en) 2022-06-22
US20190115196A1 (en) 2019-04-18
EP3418422A4 (en) 2019-10-30
KR102236414B1 (ko) 2021-04-05
TWI721139B (zh) 2021-03-11
KR20180110111A (ko) 2018-10-08
US11837449B2 (en) 2023-12-05
JPWO2017164302A1 (ja) 2018-03-29
TW201805461A (zh) 2018-02-16

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