SG11201708112TA - Tantalum sputtering target, and production method therefor - Google Patents

Tantalum sputtering target, and production method therefor

Info

Publication number
SG11201708112TA
SG11201708112TA SG11201708112TA SG11201708112TA SG11201708112TA SG 11201708112T A SG11201708112T A SG 11201708112TA SG 11201708112T A SG11201708112T A SG 11201708112TA SG 11201708112T A SG11201708112T A SG 11201708112TA SG 11201708112T A SG11201708112T A SG 11201708112TA
Authority
SG
Singapore
Prior art keywords
production method
sputtering target
method therefor
tantalum sputtering
tantalum
Prior art date
Application number
SG11201708112TA
Other languages
English (en)
Inventor
Kotaro Nagatsu
Shinichiro Senda
Original Assignee
Jx Nippon Mining & Metals Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jx Nippon Mining & Metals Corp filed Critical Jx Nippon Mining & Metals Corp
Publication of SG11201708112TA publication Critical patent/SG11201708112TA/en

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22C—ALLOYS
    • C22C27/00—Alloys based on rhenium or a refractory metal not mentioned in groups C22C14/00 or C22C16/00
    • C22C27/02—Alloys based on vanadium, niobium, or tantalum
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering
    • C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21J—FORGING; HAMMERING; PRESSING METAL; RIVETING; FORGE FURNACES
    • B21J1/00—Preparing metal stock or similar ancillary operations prior, during or post forging, e.g. heating or cooling
    • B21J1/02—Preliminary treatment of metal stock without particular shaping, e.g. salvaging segregated zones, forging or pressing in the rough
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22F—CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS AND NON-FERROUS ALLOYS
    • C22F1/00—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
    • C22F1/16—Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of other metals or alloys based thereon
    • C22F1/18—High-melting or refractory metals or alloys based thereon

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
SG11201708112TA 2015-05-22 2016-05-17 Tantalum sputtering target, and production method therefor SG11201708112TA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015104295 2015-05-22
PCT/JP2016/064537 WO2016190159A1 (ja) 2015-05-22 2016-05-17 タンタルスパッタリングターゲット及びその製造方法

Publications (1)

Publication Number Publication Date
SG11201708112TA true SG11201708112TA (en) 2017-11-29

Family

ID=57392751

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201708112TA SG11201708112TA (en) 2015-05-22 2016-05-17 Tantalum sputtering target, and production method therefor

Country Status (9)

Country Link
US (1) US10570505B2 (ja)
EP (1) EP3260572A4 (ja)
JP (1) JP6293928B2 (ja)
KR (1) KR102074047B1 (ja)
CN (1) CN107532287B (ja)
IL (1) IL255349B (ja)
SG (1) SG11201708112TA (ja)
TW (1) TWI676691B (ja)
WO (1) WO2016190159A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107109634B (zh) 2015-05-22 2020-08-28 捷客斯金属株式会社 钽溅射靶及其制造方法
CN109338316B (zh) * 2018-09-12 2020-04-28 中南大学 一种组织及织构可控的超高纯钽及其制备方法和应用
CN114892136A (zh) * 2022-05-25 2022-08-12 同创(丽水)特种材料有限公司 一种钽靶材及其制备方法与应用

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* Cited by examiner, † Cited by third party
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JPH1180942A (ja) 1997-09-10 1999-03-26 Japan Energy Corp Ｔａスパッタターゲットとその製造方法及び組立体
US6348139B1 (en) 1998-06-17 2002-02-19 Honeywell International Inc. Tantalum-comprising articles
US6348113B1 (en) * 1998-11-25 2002-02-19 Cabot Corporation High purity tantalum, products containing the same, and methods of making the same
JP2001020065A (ja) 1999-07-07 2001-01-23 Hitachi Metals Ltd スパッタリング用ターゲット及びその製造方法ならびに高融点金属粉末材料
US6331233B1 (en) * 2000-02-02 2001-12-18 Honeywell International Inc. Tantalum sputtering target with fine grains and uniform texture and method of manufacture
JP2001295035A (ja) 2000-04-11 2001-10-26 Toshiba Corp スパッタリングターゲットおよびその製造方法
KR100966682B1 (ko) 2001-02-20 2010-06-29 에이치. 씨. 스타아크 아이앤씨 균일한 조직을 갖는 내화성 금속판 및 이 금속판의 제작방법
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KR20140054203A (ko) * 2011-11-30 2014-05-08 제이엑스 닛코 닛세키 킨조쿠 가부시키가이샤 탄탈 스퍼터링 타깃 및 그 제조 방법
KR101690394B1 (ko) 2012-03-21 2016-12-27 제이엑스금속주식회사 탄탈 스퍼터링 타깃의 제조 방법
EP2878700B1 (en) 2012-12-19 2021-01-20 JX Nippon Mining & Metals Corporation Method for producing tantalum sputtering target
SG11201501175TA (en) 2012-12-19 2015-05-28 Jx Nippon Mining & Metals Corp Tantalum sputtering target and method for producing same
KR20170092706A (ko) * 2013-03-04 2017-08-11 제이엑스금속주식회사 탄탈 스퍼터링 타깃 및 그 제조 방법
CN105593399B (zh) 2013-10-01 2018-05-25 吉坤日矿日石金属株式会社 钽溅射靶
JP6009683B2 (ja) 2014-03-27 2016-10-19 Ｊｘ金属株式会社 タンタルスパッタリングターゲット及びその製造方法
CN104480439A (zh) * 2014-12-31 2015-04-01 宁夏东方钽业股份有限公司 一种钽靶材的制备工艺
CN107109634B (zh) 2015-05-22 2020-08-28 捷客斯金属株式会社 钽溅射靶及其制造方法

Also Published As

Publication number Publication date
JP6293928B2 (ja) 2018-03-14
EP3260572A1 (en) 2017-12-27
IL255349A0 (en) 2017-12-31
KR102074047B1 (ko) 2020-02-05
EP3260572A4 (en) 2018-08-01
KR20170127548A (ko) 2017-11-21
TW201704493A (zh) 2017-02-01
CN107532287B (zh) 2019-11-05
WO2016190159A1 (ja) 2016-12-01
IL255349B (en) 2021-09-30
CN107532287A (zh) 2018-01-02
JPWO2016190159A1 (ja) 2017-06-15
US10570505B2 (en) 2020-02-25
US20180105926A1 (en) 2018-04-19
TWI676691B (zh) 2019-11-11

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