SG11201610346TA - Bias estimation apparatus and method and failure diagnosis apparatus and method - Google Patents

Bias estimation apparatus and method and failure diagnosis apparatus and method

Info

Publication number
SG11201610346TA
SG11201610346TA SG11201610346TA SG11201610346TA SG11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA
Authority
SG
Singapore
Prior art keywords
failure diagnosis
bias estimation
estimation apparatus
diagnosis apparatus
bias
Prior art date
Application number
SG11201610346TA
Other languages
English (en)
Inventor
Takuro Moriyama
Hideyuki Aisu
Hisaaki Hatano
Kenichi Fujiwara
Original Assignee
Toshiba Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Kk filed Critical Toshiba Kk
Publication of SG11201610346TA publication Critical patent/SG11201610346TA/en

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B13/00Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
    • G05B13/02Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
    • G05B13/04Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00Computing arrangements using knowledge-based models
    • G06N5/04Inference or reasoning models
    • G06N5/048Fuzzy inferencing
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B17/00Systems involving the use of models or simulators of said systems
    • G05B17/02Systems involving the use of models or simulators of said systems electric
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0245Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Automation & Control Theory (AREA)
  • Theoretical Computer Science (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Data Mining & Analysis (AREA)
  • Health & Medical Sciences (AREA)
  • Computational Linguistics (AREA)
  • Fuzzy Systems (AREA)
  • Complex Calculations (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
SG11201610346TA 2014-09-17 2015-09-17 Bias estimation apparatus and method and failure diagnosis apparatus and method SG11201610346TA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014189355A JP6240050B2 (ja) 2014-09-17 2014-09-17 バイアス推定装置、その方法およびプログラム、並びに故障診断装置、その方法およびプログラム
PCT/JP2015/004771 WO2016042774A1 (en) 2014-09-17 2015-09-17 Bias estimation apparatus and method and failure diagnosis apparatus and method

Publications (1)

Publication Number Publication Date
SG11201610346TA true SG11201610346TA (en) 2017-01-27

Family

ID=54325020

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201610346TA SG11201610346TA (en) 2014-09-17 2015-09-17 Bias estimation apparatus and method and failure diagnosis apparatus and method

Country Status (6)

Country Link
US (1) US11410059B2 (ja)
EP (1) EP3195068B1 (ja)
JP (1) JP6240050B2 (ja)
CN (1) CN106662472B (ja)
SG (1) SG11201610346TA (ja)
WO (1) WO2016042774A1 (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6837893B2 (ja) * 2017-03-31 2021-03-03 住友重機械工業株式会社 故障診断システム
JP7020876B2 (ja) * 2017-11-20 2022-02-16 株式会社東芝 決定装置、補正装置、決定システム、決定方法及びコンピュータプログラム
KR102305787B1 (ko) * 2017-12-14 2021-09-28 미쓰비시덴키 가부시키가이샤 검색 시스템 및 감시 시스템
JP6782260B2 (ja) 2018-01-04 2020-11-11 株式会社東芝 情報処理装置、情報処理方法およびプログラム
JP7038629B2 (ja) * 2018-08-31 2022-03-18 三菱電機ビルテクノサービス株式会社 機器状態監視装置及びプログラム
CN110119097B (zh) * 2019-04-08 2021-08-17 上海机电工程研究所 武器系统半实物仿真数据相似性检验方法
CN114043875B (zh) * 2021-11-16 2024-01-26 江苏爱玛车业科技有限公司 基于大数据的剩余里程预估偏差分析方法和系统
CN114048880B (zh) * 2021-11-26 2024-05-24 江苏科技大学 一种基于粒子群优化的开度阀故障诊断方法

Family Cites Families (17)

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Publication number Priority date Publication date Assignee Title
JP2723174B2 (ja) * 1994-12-02 1998-03-09 工業技術院長 異種センサ画像間レジストレーション補正方法
US6577976B1 (en) * 1999-09-17 2003-06-10 Hrl Laboratories, Llc Method for dynamic autocalibration of a multi-sensor tracking system and apparatus incorporating it therein
JP2001184121A (ja) 1999-12-22 2001-07-06 Mitsubishi Heavy Ind Ltd センサ劣化検知装置
US20020183971A1 (en) * 2001-04-10 2002-12-05 Wegerich Stephan W. Diagnostic systems and methods for predictive condition monitoring
JP2003207373A (ja) 2002-01-16 2003-07-25 Mitsubishi Heavy Ind Ltd 検出器校正支援装置、検出器校正支援方法およびその方法をコンピュータに実行させるプログラムを記録したコンピュータ読み取り可能な記録媒体
JP2007003381A (ja) 2005-06-24 2007-01-11 Mitsubishi Heavy Ind Ltd 検出器の校正支援装置及びその方法並びにプログラム
ATE501594T1 (de) * 2007-06-27 2011-03-15 Panasonic Corp Bildgebungsgerät, verfahren, systemintegrierte schaltung und programm
US7716000B2 (en) 2007-08-28 2010-05-11 Kabushiki Kaisha Toshiba Sensor apparatus having sensor element
JP2009053110A (ja) * 2007-08-28 2009-03-12 Toshiba Corp センサ装置
DE102009006887B3 (de) * 2009-01-30 2010-07-15 Advanced Micro Devices, Inc., Sunnyvale Verfahren und System zur Halbleiterprozesssteuerung und Überwachung unter Anwendung eines Datenqualitätsmaßes
FR2948798B1 (fr) * 2009-07-31 2011-09-16 Astrium Sas Procede d'estimation de decalages d'images lignes obtenues par un capteur a defilement spatial ou aeroporte
JP2011145846A (ja) 2010-01-14 2011-07-28 Hitachi Ltd 異常検知方法、異常検知システム、及び異常検知プログラム
JP5712373B2 (ja) 2010-10-19 2015-05-07 株式会社国際電気通信基礎技術研究所 距離センサのキャリブレーション装置、キャリブレーションプログラムおよびキャリブレーション方法
JP5813317B2 (ja) 2010-12-28 2015-11-17 株式会社東芝 プロセス状態監視装置
US8682454B2 (en) * 2011-02-28 2014-03-25 United Technologies Corporation Method and system for controlling a multivariable system with limits
KR101886210B1 (ko) * 2011-12-26 2018-08-08 재단법인 포항산업과학연구원 계측기 신뢰성 평가 장치 및 그의 동작 방법
CN103118333B (zh) * 2013-01-25 2015-06-24 河南科技大学 基于相似度的无线传感器网络移动节点定位方法

Also Published As

Publication number Publication date
EP3195068B1 (en) 2020-03-18
US20170140287A1 (en) 2017-05-18
CN106662472B (zh) 2019-06-25
CN106662472A (zh) 2017-05-10
WO2016042774A1 (en) 2016-03-24
US11410059B2 (en) 2022-08-09
JP2016061658A (ja) 2016-04-25
EP3195068A1 (en) 2017-07-26
JP6240050B2 (ja) 2017-11-29

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