SG11201610346TA - Bias estimation apparatus and method and failure diagnosis apparatus and method - Google Patents
Bias estimation apparatus and method and failure diagnosis apparatus and methodInfo
- Publication number
- SG11201610346TA SG11201610346TA SG11201610346TA SG11201610346TA SG11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA
- Authority
- SG
- Singapore
- Prior art keywords
- failure diagnosis
- bias estimation
- estimation apparatus
- diagnosis apparatus
- bias
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B13/00—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
- G05B13/02—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
- G05B13/04—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N5/00—Computing arrangements using knowledge-based models
- G06N5/04—Inference or reasoning models
- G06N5/048—Fuzzy inferencing
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B17/00—Systems involving the use of models or simulators of said systems
- G05B17/02—Systems involving the use of models or simulators of said systems electric
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
- G05B23/0245—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Software Systems (AREA)
- Automation & Control Theory (AREA)
- Theoretical Computer Science (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Computation (AREA)
- Medical Informatics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Data Mining & Analysis (AREA)
- Health & Medical Sciences (AREA)
- Computational Linguistics (AREA)
- Fuzzy Systems (AREA)
- Complex Calculations (AREA)
- Testing And Monitoring For Control Systems (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014189355A JP6240050B2 (ja) | 2014-09-17 | 2014-09-17 | バイアス推定装置、その方法およびプログラム、並びに故障診断装置、その方法およびプログラム |
PCT/JP2015/004771 WO2016042774A1 (en) | 2014-09-17 | 2015-09-17 | Bias estimation apparatus and method and failure diagnosis apparatus and method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201610346TA true SG11201610346TA (en) | 2017-01-27 |
Family
ID=54325020
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201610346TA SG11201610346TA (en) | 2014-09-17 | 2015-09-17 | Bias estimation apparatus and method and failure diagnosis apparatus and method |
Country Status (6)
Country | Link |
---|---|
US (1) | US11410059B2 (ja) |
EP (1) | EP3195068B1 (ja) |
JP (1) | JP6240050B2 (ja) |
CN (1) | CN106662472B (ja) |
SG (1) | SG11201610346TA (ja) |
WO (1) | WO2016042774A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6837893B2 (ja) * | 2017-03-31 | 2021-03-03 | 住友重機械工業株式会社 | 故障診断システム |
JP7020876B2 (ja) * | 2017-11-20 | 2022-02-16 | 株式会社東芝 | 決定装置、補正装置、決定システム、決定方法及びコンピュータプログラム |
KR102305787B1 (ko) * | 2017-12-14 | 2021-09-28 | 미쓰비시덴키 가부시키가이샤 | 검색 시스템 및 감시 시스템 |
JP6782260B2 (ja) | 2018-01-04 | 2020-11-11 | 株式会社東芝 | 情報処理装置、情報処理方法およびプログラム |
JP7038629B2 (ja) * | 2018-08-31 | 2022-03-18 | 三菱電機ビルテクノサービス株式会社 | 機器状態監視装置及びプログラム |
CN110119097B (zh) * | 2019-04-08 | 2021-08-17 | 上海机电工程研究所 | 武器系统半实物仿真数据相似性检验方法 |
CN114043875B (zh) * | 2021-11-16 | 2024-01-26 | 江苏爱玛车业科技有限公司 | 基于大数据的剩余里程预估偏差分析方法和系统 |
CN114048880B (zh) * | 2021-11-26 | 2024-05-24 | 江苏科技大学 | 一种基于粒子群优化的开度阀故障诊断方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2723174B2 (ja) * | 1994-12-02 | 1998-03-09 | 工業技術院長 | 異種センサ画像間レジストレーション補正方法 |
US6577976B1 (en) * | 1999-09-17 | 2003-06-10 | Hrl Laboratories, Llc | Method for dynamic autocalibration of a multi-sensor tracking system and apparatus incorporating it therein |
JP2001184121A (ja) | 1999-12-22 | 2001-07-06 | Mitsubishi Heavy Ind Ltd | センサ劣化検知装置 |
US20020183971A1 (en) * | 2001-04-10 | 2002-12-05 | Wegerich Stephan W. | Diagnostic systems and methods for predictive condition monitoring |
JP2003207373A (ja) | 2002-01-16 | 2003-07-25 | Mitsubishi Heavy Ind Ltd | 検出器校正支援装置、検出器校正支援方法およびその方法をコンピュータに実行させるプログラムを記録したコンピュータ読み取り可能な記録媒体 |
JP2007003381A (ja) | 2005-06-24 | 2007-01-11 | Mitsubishi Heavy Ind Ltd | 検出器の校正支援装置及びその方法並びにプログラム |
ATE501594T1 (de) * | 2007-06-27 | 2011-03-15 | Panasonic Corp | Bildgebungsgerät, verfahren, systemintegrierte schaltung und programm |
US7716000B2 (en) | 2007-08-28 | 2010-05-11 | Kabushiki Kaisha Toshiba | Sensor apparatus having sensor element |
JP2009053110A (ja) * | 2007-08-28 | 2009-03-12 | Toshiba Corp | センサ装置 |
DE102009006887B3 (de) * | 2009-01-30 | 2010-07-15 | Advanced Micro Devices, Inc., Sunnyvale | Verfahren und System zur Halbleiterprozesssteuerung und Überwachung unter Anwendung eines Datenqualitätsmaßes |
FR2948798B1 (fr) * | 2009-07-31 | 2011-09-16 | Astrium Sas | Procede d'estimation de decalages d'images lignes obtenues par un capteur a defilement spatial ou aeroporte |
JP2011145846A (ja) | 2010-01-14 | 2011-07-28 | Hitachi Ltd | 異常検知方法、異常検知システム、及び異常検知プログラム |
JP5712373B2 (ja) | 2010-10-19 | 2015-05-07 | 株式会社国際電気通信基礎技術研究所 | 距離センサのキャリブレーション装置、キャリブレーションプログラムおよびキャリブレーション方法 |
JP5813317B2 (ja) | 2010-12-28 | 2015-11-17 | 株式会社東芝 | プロセス状態監視装置 |
US8682454B2 (en) * | 2011-02-28 | 2014-03-25 | United Technologies Corporation | Method and system for controlling a multivariable system with limits |
KR101886210B1 (ko) * | 2011-12-26 | 2018-08-08 | 재단법인 포항산업과학연구원 | 계측기 신뢰성 평가 장치 및 그의 동작 방법 |
CN103118333B (zh) * | 2013-01-25 | 2015-06-24 | 河南科技大学 | 基于相似度的无线传感器网络移动节点定位方法 |
-
2014
- 2014-09-17 JP JP2014189355A patent/JP6240050B2/ja active Active
-
2015
- 2015-09-17 EP EP15780948.4A patent/EP3195068B1/en active Active
- 2015-09-17 SG SG11201610346TA patent/SG11201610346TA/en unknown
- 2015-09-17 WO PCT/JP2015/004771 patent/WO2016042774A1/en active Application Filing
- 2015-09-17 CN CN201580036704.7A patent/CN106662472B/zh active Active
-
2017
- 2017-01-31 US US15/420,640 patent/US11410059B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP3195068B1 (en) | 2020-03-18 |
US20170140287A1 (en) | 2017-05-18 |
CN106662472B (zh) | 2019-06-25 |
CN106662472A (zh) | 2017-05-10 |
WO2016042774A1 (en) | 2016-03-24 |
US11410059B2 (en) | 2022-08-09 |
JP2016061658A (ja) | 2016-04-25 |
EP3195068A1 (en) | 2017-07-26 |
JP6240050B2 (ja) | 2017-11-29 |
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