SG11201610346TA - Bias estimation apparatus and method and failure diagnosis apparatus and method - Google Patents

Bias estimation apparatus and method and failure diagnosis apparatus and method

Info

Publication number
SG11201610346TA
SG11201610346TA SG11201610346TA SG11201610346TA SG11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA SG 11201610346T A SG11201610346T A SG 11201610346TA
Authority
SG
Singapore
Prior art keywords
failure diagnosis
bias estimation
estimation apparatus
diagnosis apparatus
bias
Prior art date
Application number
SG11201610346TA
Inventor
Takuro Moriyama
Hideyuki Aisu
Hisaaki Hatano
Kenichi Fujiwara
Original Assignee
Toshiba Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Kk filed Critical Toshiba Kk
Publication of SG11201610346TA publication Critical patent/SG11201610346TA/en

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B13/00—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
    • G05B13/02—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
    • G05B13/04—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/04—Inference or reasoning models
    • G06N5/048—Fuzzy inferencing
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B17/00—Systems involving the use of models or simulators of said systems
    • G05B17/02—Systems involving the use of models or simulators of said systems electric
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0245—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
SG11201610346TA 2014-09-17 2015-09-17 Bias estimation apparatus and method and failure diagnosis apparatus and method SG11201610346TA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014189355A JP6240050B2 (en) 2014-09-17 2014-09-17 Bias estimation apparatus, method and program thereof, and fault diagnosis apparatus, method and program thereof
PCT/JP2015/004771 WO2016042774A1 (en) 2014-09-17 2015-09-17 Bias estimation apparatus and method and failure diagnosis apparatus and method

Publications (1)

Publication Number Publication Date
SG11201610346TA true SG11201610346TA (en) 2017-01-27

Family

ID=54325020

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201610346TA SG11201610346TA (en) 2014-09-17 2015-09-17 Bias estimation apparatus and method and failure diagnosis apparatus and method

Country Status (6)

Country Link
US (1) US11410059B2 (en)
EP (1) EP3195068B1 (en)
JP (1) JP6240050B2 (en)
CN (1) CN106662472B (en)
SG (1) SG11201610346TA (en)
WO (1) WO2016042774A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6837893B2 (en) * 2017-03-31 2021-03-03 住友重機械工業株式会社 Failure diagnosis system
JP7020876B2 (en) * 2017-11-20 2022-02-16 株式会社東芝 Decision device, correction device, decision system, decision method and computer program
CN111492371B (en) * 2017-12-14 2023-05-26 三菱电机株式会社 Search system and monitoring system
JP6782260B2 (en) 2018-01-04 2020-11-11 株式会社東芝 Information processing equipment, information processing methods and programs
JP7038629B2 (en) * 2018-08-31 2022-03-18 三菱電機ビルテクノサービス株式会社 Equipment condition monitoring device and program
CN110119097B (en) * 2019-04-08 2021-08-17 上海机电工程研究所 Weapon system hardware-in-the-loop simulation data similarity inspection method
CN114043875B (en) * 2021-11-16 2024-01-26 江苏爱玛车业科技有限公司 Residual mileage pre-estimated deviation analysis method and system based on big data

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JP2723174B2 (en) * 1994-12-02 1998-03-09 工業技術院長 Registration correction method between heterogeneous sensor images
US6577976B1 (en) * 1999-09-17 2003-06-10 Hrl Laboratories, Llc Method for dynamic autocalibration of a multi-sensor tracking system and apparatus incorporating it therein
JP2001184121A (en) 1999-12-22 2001-07-06 Mitsubishi Heavy Ind Ltd Sensor deterioration detection device
US20020183971A1 (en) * 2001-04-10 2002-12-05 Wegerich Stephan W. Diagnostic systems and methods for predictive condition monitoring
JP2003207373A (en) 2002-01-16 2003-07-25 Mitsubishi Heavy Ind Ltd Sensor calibration assistance system, sensor calibration assistance method, and computer readable recording medium storing program for computer execution of the same
JP2007003381A (en) 2005-06-24 2007-01-11 Mitsubishi Heavy Ind Ltd Calibration support device for detector, technique thereof, and program
WO2009001512A1 (en) * 2007-06-27 2008-12-31 Panasonic Corporation Imaging apparatus, method, system integrated circuit, and program
US7716000B2 (en) 2007-08-28 2010-05-11 Kabushiki Kaisha Toshiba Sensor apparatus having sensor element
JP2009053110A (en) * 2007-08-28 2009-03-12 Toshiba Corp Sensor device
DE102009006887B3 (en) * 2009-01-30 2010-07-15 Advanced Micro Devices, Inc., Sunnyvale Method and system for semiconductor process control and monitoring using a data quality measure
FR2948798B1 (en) * 2009-07-31 2011-09-16 Astrium Sas METHOD FOR ESTIMATING LINE-BASED IMAGE SHIFTS OBTAINED BY A SPATIAL OR AEROPORTIVE SCALE SENSOR
JP2011145846A (en) 2010-01-14 2011-07-28 Hitachi Ltd Anomaly detection method, anomaly detection system and anomaly detection program
JP5712373B2 (en) 2010-10-19 2015-05-07 株式会社国際電気通信基礎技術研究所 Distance sensor calibration apparatus, calibration program, and calibration method
JP5813317B2 (en) 2010-12-28 2015-11-17 株式会社東芝 Process status monitoring device
US8682454B2 (en) * 2011-02-28 2014-03-25 United Technologies Corporation Method and system for controlling a multivariable system with limits
KR101886210B1 (en) * 2011-12-26 2018-08-08 재단법인 포항산업과학연구원 Measuring instrument reliability evaluation apparatus and operating method thereof
CN103118333B (en) * 2013-01-25 2015-06-24 河南科技大学 Similarity based wireless sensor network mobile node positioning method

Also Published As

Publication number Publication date
US20170140287A1 (en) 2017-05-18
JP6240050B2 (en) 2017-11-29
EP3195068B1 (en) 2020-03-18
US11410059B2 (en) 2022-08-09
CN106662472A (en) 2017-05-10
WO2016042774A1 (en) 2016-03-24
JP2016061658A (en) 2016-04-25
CN106662472B (en) 2019-06-25
EP3195068A1 (en) 2017-07-26

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