SG11201602839YA - Automated test system with event detection capability - Google Patents

Automated test system with event detection capability

Info

Publication number
SG11201602839YA
SG11201602839YA SG11201602839YA SG11201602839YA SG11201602839YA SG 11201602839Y A SG11201602839Y A SG 11201602839YA SG 11201602839Y A SG11201602839Y A SG 11201602839YA SG 11201602839Y A SG11201602839Y A SG 11201602839YA SG 11201602839Y A SG11201602839Y A SG 11201602839YA
Authority
SG
Singapore
Prior art keywords
test system
event detection
detection capability
automated test
automated
Prior art date
Application number
SG11201602839YA
Other languages
English (en)
Inventor
Ronald A Sartschev
Edward J Seng
Marc Reuben Hutner
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of SG11201602839YA publication Critical patent/SG11201602839YA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31722—Addressing or selecting of test units, e.g. transmission protocols for selecting test units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318594—Timing aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/0008—Modulated-carrier systems arrangements for allowing a transmitter or receiver to use more than one type of modulation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/18—Phase-modulated carrier systems, i.e. using phase-shift keying
    • H04L27/20—Modulator circuits; Transmitter circuits
    • H04L27/2032—Modulator circuits; Transmitter circuits for discrete phase modulation, e.g. in which the phase of the carrier is modulated in a nominally instantaneous manner
    • H04L27/2053—Modulator circuits; Transmitter circuits for discrete phase modulation, e.g. in which the phase of the carrier is modulated in a nominally instantaneous manner using more than one carrier, e.g. carriers with different phases
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/18—Phase-modulated carrier systems, i.e. using phase-shift keying
    • H04L27/22—Demodulator circuits; Receiver circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00—Modulated-carrier systems
    • H04L27/32—Carrier systems characterised by combinations of two or more of the types covered by groups H04L27/02, H04L27/10, H04L27/18 or H04L27/26
    • H04L27/34—Amplitude- and phase-modulated carrier systems, e.g. quadrature-amplitude modulated carrier systems
    • H04L27/38—Demodulator circuits; Receiver circuits
SG11201602839YA 2013-11-06 2014-10-23 Automated test system with event detection capability SG11201602839YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/073,739 US9244126B2 (en) 2013-11-06 2013-11-06 Automated test system with event detection capability
PCT/US2014/061933 WO2015069465A1 (en) 2013-11-06 2014-10-23 Automated test system with event detection capability

Publications (1)

Publication Number Publication Date
SG11201602839YA true SG11201602839YA (en) 2016-05-30

Family

ID=53007990

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201602839YA SG11201602839YA (en) 2013-11-06 2014-10-23 Automated test system with event detection capability

Country Status (6)

Country Link
US (1) US9244126B2 (zh)
JP (1) JP6509841B2 (zh)
KR (1) KR102213547B1 (zh)
CN (1) CN105849573B (zh)
SG (1) SG11201602839YA (zh)
WO (1) WO2015069465A1 (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10145893B2 (en) * 2016-12-25 2018-12-04 Nuvoton Technology Corporation Resolving automated test equipment (ATE) timing constraint violations
US11169203B1 (en) 2018-09-26 2021-11-09 Teradyne, Inc. Determining a configuration of a test system
US10859628B2 (en) * 2019-04-04 2020-12-08 Apple Ine. Power droop measurements using analog-to-digital converter during testing
US11461222B2 (en) 2020-04-16 2022-10-04 Teradyne, Inc. Determining the complexity of a test program
CN115297026A (zh) * 2022-08-29 2022-11-04 广东美的智能科技有限公司 通信系统及其检测方法

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JP4859854B2 (ja) * 2001-06-13 2012-01-25 株式会社アドバンテスト 半導体デバイス試験装置、及び半導体デバイス試験方法
WO2002103379A1 (fr) 2001-06-13 2002-12-27 Advantest Corporation Instrument destine a tester des dispositifs semi-conducteurs et procede destine a tester des dispositifs semi-conducteurs
US7171602B2 (en) * 2001-12-31 2007-01-30 Advantest Corp. Event processing apparatus and method for high speed event based test system
US6784819B2 (en) * 2002-06-27 2004-08-31 Teradyne, Inc. Measuring skew between digitizer channels using fourier transform
DE102004016359A1 (de) * 2004-04-02 2005-10-27 Texas Instruments Deutschland Gmbh Abtastverfahren und -vorrichtung
US7856578B2 (en) 2005-09-23 2010-12-21 Teradyne, Inc. Strobe technique for test of digital signal timing
US7573957B2 (en) 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for recovering a clock in a digital signal
US7349818B2 (en) 2005-11-10 2008-03-25 Teradyne, Inc. Determining frequency components of jitter
US7668235B2 (en) 2005-11-10 2010-02-23 Teradyne Jitter measurement algorithm using locally in-order strobes
JP4951534B2 (ja) 2006-01-25 2012-06-13 株式会社アドバンテスト 試験装置および試験方法
CN101082666B (zh) * 2006-06-02 2011-07-27 中国科学院电子学研究所 基于自动测试系统实现对雷达脉冲信号高精度调制的方法
US7734848B2 (en) 2006-11-08 2010-06-08 Verigy (Singapore) Pte. Ltd. System and method for frequency offset testing
CN101141190B (zh) * 2007-05-24 2010-12-08 中兴通讯股份有限公司 Edfa瞬态特性指标测试装置和方法
WO2009001451A1 (ja) * 2007-06-27 2008-12-31 Advantest Corporation 検出装置及び試験装置
CN101187693A (zh) * 2007-11-26 2008-05-28 天津理工大学 基于虚拟仪器的电机性能自动测试系统及其工作方法
JP5274551B2 (ja) 2008-05-09 2013-08-28 株式会社アドバンテスト デジタル変調信号の試験装置および試験方法
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Also Published As

Publication number Publication date
CN105849573B (zh) 2018-12-14
JP2016536583A (ja) 2016-11-24
JP6509841B2 (ja) 2019-05-08
US9244126B2 (en) 2016-01-26
KR20160082240A (ko) 2016-07-08
WO2015069465A1 (en) 2015-05-14
US20150128003A1 (en) 2015-05-07
CN105849573A (zh) 2016-08-10
KR102213547B1 (ko) 2021-02-08

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