SG11201401016YA - Web inspection calibration system and related methods - Google Patents

Web inspection calibration system and related methods

Info

Publication number
SG11201401016YA
SG11201401016YA SG11201401016YA SG11201401016YA SG11201401016YA SG 11201401016Y A SG11201401016Y A SG 11201401016YA SG 11201401016Y A SG11201401016Y A SG 11201401016YA SG 11201401016Y A SG11201401016Y A SG 11201401016YA SG 11201401016Y A SG11201401016Y A SG 11201401016YA
Authority
SG
Singapore
Prior art keywords
related methods
calibration system
web inspection
inspection calibration
web
Prior art date
Application number
SG11201401016YA
Other languages
English (en)
Inventor
Justin W Wilhelm
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of SG11201401016YA publication Critical patent/SG11201401016YA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2557/00—Means for control not provided for in groups B65H2551/00 - B65H2555/00
    • B65H2557/60—Details of processes or procedures
    • B65H2557/61—Details of processes or procedures for calibrating

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
SG11201401016YA 2011-09-30 2012-09-26 Web inspection calibration system and related methods SG11201401016YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/249,468 US8553228B2 (en) 2011-09-30 2011-09-30 Web inspection calibration system and related methods
PCT/US2012/057167 WO2013049090A1 (en) 2011-09-30 2012-09-26 Web inspection calibration system and related methods

Publications (1)

Publication Number Publication Date
SG11201401016YA true SG11201401016YA (en) 2014-04-28

Family

ID=47143263

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201401016YA SG11201401016YA (en) 2011-09-30 2012-09-26 Web inspection calibration system and related methods

Country Status (8)

Country Link
US (1) US8553228B2 (enrdf_load_stackoverflow)
EP (1) EP2761270A1 (enrdf_load_stackoverflow)
JP (1) JP6122015B2 (enrdf_load_stackoverflow)
KR (1) KR20140067162A (enrdf_load_stackoverflow)
CN (1) CN103842800B (enrdf_load_stackoverflow)
BR (1) BR112014007577A2 (enrdf_load_stackoverflow)
SG (1) SG11201401016YA (enrdf_load_stackoverflow)
WO (1) WO2013049090A1 (enrdf_load_stackoverflow)

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US20160072579A1 (en) * 2013-05-01 2016-03-10 The University Of Sydney A system and a method for generating information indicative of an impairment of an optical signal
DE102013108485B4 (de) * 2013-08-06 2015-06-25 Khs Gmbh Vorrichtung und Verfahren zum Fehlertracking bei Bandmaterialien
US9910429B2 (en) * 2013-09-03 2018-03-06 The Procter & Gamble Company Systems and methods for adjusting target manufacturing parameters on an absorbent product converting line
US9841383B2 (en) 2013-10-31 2017-12-12 3M Innovative Properties Company Multiscale uniformity analysis of a material
US9151595B1 (en) * 2014-04-18 2015-10-06 Advanced Gauging Technologies, LLC Laser thickness gauge and method including passline angle correction
CN105329694B (zh) * 2014-07-22 2017-10-03 宁波弘讯科技股份有限公司 一种纠偏控制方法、控制器及纠偏控制系统
DE102015017470B4 (de) 2014-08-22 2025-07-17 Divergent Technologies, Inc. Fehlererkennung für additive fertigungssysteme
TWI559423B (zh) * 2014-11-04 2016-11-21 梭特科技股份有限公司 晶粒攝影裝置
US10786948B2 (en) 2014-11-18 2020-09-29 Sigma Labs, Inc. Multi-sensor quality inference and control for additive manufacturing processes
WO2016115284A1 (en) 2015-01-13 2016-07-21 Sigma Labs, Inc. Material qualification system and methodology
JP6475543B2 (ja) * 2015-03-31 2019-02-27 株式会社デンソー 車両制御装置、及び車両制御方法
US10207489B2 (en) 2015-09-30 2019-02-19 Sigma Labs, Inc. Systems and methods for additive manufacturing operations
US10067069B2 (en) * 2016-03-11 2018-09-04 Smart Vision Lights Machine vision systems incorporating polarized electromagnetic radiation emitters
EP3339845A3 (en) * 2016-11-30 2018-09-12 Sumitomo Chemical Company, Ltd Defect inspection device, defect inspection method, method for producing separator roll, and separator roll
JP6575824B2 (ja) * 2017-03-22 2019-09-18 トヨタ自動車株式会社 膜厚測定方法および膜厚測定装置
US11434028B2 (en) 2017-08-04 2022-09-06 Tetra Laval Holdings & Finance S.A. Method and an apparatus for applying a sealing strip to a web of packaging material
US10670745B1 (en) 2017-09-19 2020-06-02 The Government of the United States as Represented by the Secretary of the United States Statistical photo-calibration of photo-detectors for radiometry without calibrated light sources comprising an arithmetic unit to determine a gain and a bias from mean values and variance values
FR3074295B1 (fr) * 2017-11-30 2019-11-15 Saint-Gobain Glass France Procede de detection de defauts de laminage dans un verre imprime
TWI794400B (zh) * 2018-01-31 2023-03-01 美商3M新設資產公司 用於連續移動帶材的紅外光透射檢查
CN109060806B (zh) * 2018-08-29 2019-09-13 陈青 箱子底端材料类型辨识机构
WO2020219076A1 (en) * 2019-04-26 2020-10-29 Hewlett-Packard Development Company, L.P. Evaluating surfaces
US20220301282A1 (en) * 2019-09-11 2022-09-22 Siemens Aktiengesellschaft Method for Analyzing Image Information Using Assigned Scalar Values
CN111993798B (zh) * 2020-08-12 2022-04-12 福建实达电脑设备有限公司 一种页缝传感器的自动校正方法
CN112800907B (zh) * 2021-01-19 2024-06-07 广州华望半导体科技有限公司 鼻梁条用料情况检测方法、系统、装置和存储介质
US20220356026A1 (en) * 2021-05-06 2022-11-10 Applied Materials, Inc. Cross web tension measurement and control
CN117716204A (zh) * 2021-09-27 2024-03-15 东丽株式会社 片状物的凹凸测定装置、片状物的凹凸测定方法
CN114862843B (zh) * 2022-06-06 2024-11-01 东北大学 一种基于滤波器融合的金属带材表面缺陷快速检测方法

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US6647140B1 (en) * 1999-05-18 2003-11-11 Bank One Spectrum inverter apparatus and method
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JP2004003925A (ja) * 2002-03-29 2004-01-08 Mitsubishi Paper Mills Ltd 同時多点測定装置及び制御装置
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US7773226B2 (en) * 2008-06-05 2010-08-10 3M Innovative Properties Company Web inspection calibration system and related methods
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US8270701B2 (en) * 2010-01-08 2012-09-18 3M Innovative Properties Company Optical web-based defect detection using intrasensor uniformity correction

Also Published As

Publication number Publication date
EP2761270A1 (en) 2014-08-06
KR20140067162A (ko) 2014-06-03
US20130083324A1 (en) 2013-04-04
BR112014007577A2 (pt) 2017-04-11
WO2013049090A1 (en) 2013-04-04
CN103842800B (zh) 2016-04-20
CN103842800A (zh) 2014-06-04
JP2014528579A (ja) 2014-10-27
JP6122015B2 (ja) 2017-04-26
US8553228B2 (en) 2013-10-08

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