SG11201400496VA - Double layer transfer method - Google Patents

Double layer transfer method

Info

Publication number
SG11201400496VA
SG11201400496VA SG11201400496VA SG11201400496VA SG11201400496VA SG 11201400496V A SG11201400496V A SG 11201400496VA SG 11201400496V A SG11201400496V A SG 11201400496VA SG 11201400496V A SG11201400496V A SG 11201400496VA SG 11201400496V A SG11201400496V A SG 11201400496VA
Authority
SG
Singapore
Prior art keywords
double layer
transfer method
layer transfer
double
transfer
Prior art date
Application number
SG11201400496VA
Other languages
English (en)
Inventor
Frank Fournel
Maxime Argoud
Fonseca Jérémy Da
Hubert Moriceau
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Publication of SG11201400496VA publication Critical patent/SG11201400496VA/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/185—Joining of semiconductor bodies for junction formation
    • H01L21/187—Joining of semiconductor bodies for junction formation by direct bonding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
    • H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
    • H01L21/76251—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques
    • H01L21/76259—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques with separation/delamination along a porous layer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
    • H01L21/2003—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy characterised by the substrate
    • H01L21/2007—Bonding of semiconductor wafers to insulating substrates or to semiconducting substrates using an intermediate insulating layer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0603—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1892—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof methods involving the use of temporary, removable substrates
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
SG11201400496VA 2011-10-04 2012-09-20 Double layer transfer method SG11201400496VA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1158944A FR2980919B1 (fr) 2011-10-04 2011-10-04 Procede de double report de couche
PCT/FR2012/052100 WO2013050683A1 (fr) 2011-10-04 2012-09-20 Procédé de double report de couche

Publications (1)

Publication Number Publication Date
SG11201400496VA true SG11201400496VA (en) 2014-09-26

Family

ID=47023003

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201400496VA SG11201400496VA (en) 2011-10-04 2012-09-20 Double layer transfer method

Country Status (8)

Country Link
US (1) US9076841B2 (zh)
EP (1) EP2764535B1 (zh)
JP (1) JP5676059B2 (zh)
KR (1) KR101991389B1 (zh)
CN (1) CN103875062B (zh)
FR (1) FR2980919B1 (zh)
SG (1) SG11201400496VA (zh)
WO (1) WO2013050683A1 (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2981940B1 (fr) * 2011-10-26 2014-06-06 Commissariat Energie Atomique Procede de collage direct d'une couche d'oxyde de silicium
WO2015109240A1 (en) * 2014-01-16 2015-07-23 Research Foundation Of The City University Of New York Center-side method of producing superhydrophobic surface
FR3029352B1 (fr) * 2014-11-27 2017-01-06 Soitec Silicon On Insulator Procede d'assemblage de deux substrats
CN104993011A (zh) * 2015-05-25 2015-10-21 中国电子科技集团公司第十八研究所 利用选择腐蚀衬底剥离制备薄膜太阳能电池的工艺
DE102015210384A1 (de) * 2015-06-05 2016-12-08 Soitec Verfahren zur mechanischen Trennung für eine Doppelschichtübertragung
US20160379943A1 (en) * 2015-06-25 2016-12-29 Skyworks Solutions, Inc. Method and apparatus for high performance passive-active circuit integration
FR3041364B1 (fr) * 2015-09-18 2017-10-06 Soitec Silicon On Insulator Procede de transfert de paves monocristallins
TW201737766A (zh) * 2016-01-21 2017-10-16 康寧公司 處理基板的方法
FR3087297B1 (fr) * 2018-10-12 2021-01-08 Commissariat Energie Atomique Procede de transfert de film mince
CH716104A1 (fr) * 2019-04-18 2020-10-30 Sy&Se Sa Procédé d'amélioration de l'adhérence d'une couche sur un substrat.
CN112760615B (zh) * 2020-12-17 2023-04-28 武汉新芯集成电路制造有限公司 一种二氧化硅薄膜及其低温制备方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100592467C (zh) * 1996-08-27 2010-02-24 精工爱普生株式会社 转移方法
JP3906653B2 (ja) * 2000-07-18 2007-04-18 ソニー株式会社 画像表示装置及びその製造方法
US6638835B2 (en) * 2001-12-11 2003-10-28 Intel Corporation Method for bonding and debonding films using a high-temperature polymer
FR2849268A1 (fr) * 2002-12-24 2004-06-25 Soitec Silicon On Insulator Procede de fabrication d'un substrat demontable
US20060240275A1 (en) * 2005-04-25 2006-10-26 Gadkaree Kishor P Flexible display substrates
JP2007088235A (ja) * 2005-09-22 2007-04-05 Seiko Epson Corp 薄膜素子の転写方法、製造方法、薄膜装置の製造方法及び電子機器
JP5284576B2 (ja) * 2006-11-10 2013-09-11 信越化学工業株式会社 半導体基板の製造方法
FR2925221B1 (fr) * 2007-12-17 2010-02-19 Commissariat Energie Atomique Procede de transfert d'une couche mince
EP2294607A2 (en) * 2008-05-17 2011-03-16 Astrowatt, Inc. Method of forming an electronic device using a separation technique
JP2010054695A (ja) * 2008-08-27 2010-03-11 National Institute Of Advanced Industrial Science & Technology 光デバイスの製造方法
JP5409084B2 (ja) * 2009-04-06 2014-02-05 キヤノン株式会社 半導体装置の製造方法

Also Published As

Publication number Publication date
CN103875062B (zh) 2016-08-03
KR101991389B1 (ko) 2019-06-20
JP2014534621A (ja) 2014-12-18
WO2013050683A9 (fr) 2014-12-31
WO2013050683A1 (fr) 2013-04-11
CN103875062A (zh) 2014-06-18
JP5676059B2 (ja) 2015-02-25
FR2980919A1 (fr) 2013-04-05
EP2764535A1 (fr) 2014-08-13
FR2980919B1 (fr) 2014-02-21
EP2764535B1 (fr) 2015-10-14
US9076841B2 (en) 2015-07-07
US20140295642A1 (en) 2014-10-02
KR20140082780A (ko) 2014-07-02

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