SG110203A1 - Printed circuit board test access point structures and method for making the same - Google Patents

Printed circuit board test access point structures and method for making the same

Info

Publication number
SG110203A1
SG110203A1 SG200405968A SG200405968A SG110203A1 SG 110203 A1 SG110203 A1 SG 110203A1 SG 200405968 A SG200405968 A SG 200405968A SG 200405968 A SG200405968 A SG 200405968A SG 110203 A1 SG110203 A1 SG 110203A1
Authority
SG
Singapore
Prior art keywords
making
circuit board
printed circuit
access point
same
Prior art date
Application number
SG200405968A
Other languages
English (en)
Inventor
P Parker Kenneth
J Peiffer Ronald
E Leinbach Glen
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of SG110203A1 publication Critical patent/SG110203A1/en

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09—Shape and layout
    • H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/0989—Coating free areas, e.g. areas other than pads or lands free of solder resist
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/04—Soldering or other types of metallurgic bonding
    • H05K2203/043—Reflowing of solder coated conductors, not during connection of components, e.g. reflowing solder paste
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3452—Solder masks
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457—Solder materials or compositions; Methods of application thereof
    • H05K3/3485—Applying solder paste, slurry or powder

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
SG200405968A 2003-09-24 2004-09-09 Printed circuit board test access point structures and method for making the same SG110203A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/670,649 US7307222B2 (en) 2003-09-24 2003-09-24 Printed circuit board test access point structures and method for making the same

Publications (1)

Publication Number Publication Date
SG110203A1 true SG110203A1 (en) 2005-04-28

Family

ID=34313859

Family Applications (2)

Application Number Title Priority Date Filing Date
SG200405968A SG110203A1 (en) 2003-09-24 2004-09-09 Printed circuit board test access point structures and method for making the same
SG200700067A SG129435A1 (en) 2003-09-24 2004-09-09 Printed circuit board test access point structuresand method for making the same

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG200700067A SG129435A1 (en) 2003-09-24 2004-09-09 Printed circuit board test access point structuresand method for making the same

Country Status (6)

Country Link
US (1) US7307222B2 (zh)
CN (1) CN1602138A (zh)
DE (1) DE102004045719B4 (zh)
MY (1) MY137474A (zh)
SG (2) SG110203A1 (zh)
TW (1) TW200520637A (zh)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7292452B2 (en) * 2004-06-10 2007-11-06 Intel Corporation Reference layer openings
US7138792B2 (en) * 2004-10-25 2006-11-21 Lsi Logic Corporation Programmable power personality card
US7190157B2 (en) * 2004-10-25 2007-03-13 Agilent Technologies, Inc. Method and apparatus for layout independent test point placement on a printed circuit board
US7504589B2 (en) * 2004-10-25 2009-03-17 Agilent Technologies, Inc. Method and apparatus for manufacturing and probing printed circuit board test access point structures
US20060129955A1 (en) * 2004-12-10 2006-06-15 Jacobsen Chris R Printed circuit board development cycle using probe location automation and bead probe technology
US7518384B2 (en) * 2005-01-31 2009-04-14 Agilent Technologies, Inc. Method and apparatus for manufacturing and probing test probe access structures on vias
KR100663364B1 (ko) * 2005-07-12 2007-01-02 삼성전자주식회사 퓨즈 분리 장벽을 갖는 퓨즈 영역을 구비하는 반도체소자및 그 제조방법들
US7797663B2 (en) * 2007-04-04 2010-09-14 Cisco Technology, Inc. Conductive dome probes for measuring system level multi-GHZ signals
US8310256B2 (en) 2009-12-22 2012-11-13 Teradyne, Inc. Capacitive opens testing in low signal environments
US8760185B2 (en) * 2009-12-22 2014-06-24 Anthony J. Suto Low capacitance probe for testing circuit assembly
CN102209433A (zh) * 2010-03-30 2011-10-05 鸿富锦精密工业（深圳）有限公司 电路板引脚布局架构
US20130277095A1 (en) * 2010-10-15 2013-10-24 Advanced Flexible Circuits Co., Ltd. Double-side-conducting flexible-circuit flat cable with cluster section
DE102012013347B4 (de) * 2012-07-06 2022-10-13 Stiebel Eltron Gmbh & Co. Kg Elektronische Leiterplatine und Verfahren zum Installieren eines Sensors an einem Heizblock für einen Durchlauferhitzer
US9370097B2 (en) * 2013-03-01 2016-06-14 Qualcomm Incorporated Package substrate with testing pads on fine pitch traces
EP3100283A4 (en) * 2014-01-27 2017-11-29 Angiometrix Corporation Methods and apparatus for electrically stable connectors
JP6659253B2 (ja) * 2015-06-24 2020-03-04 住友電工プリントサーキット株式会社 フレキシブルプリント配線板及びフレキシブルプリント配線板の製造方法
DE102015220025A1 (de) * 2015-10-15 2017-04-20 Continental Automotive Gmbh Mehrschichtige Leiterplatte
CN105611713A (zh) * 2015-12-22 2016-05-25 广东欧珀移动通信有限公司 Pcb板及其制作方法
KR102552431B1 (ko) * 2018-09-14 2023-07-07 삼성디스플레이 주식회사 연성 필름, 연성 필름 패키지 및 연성 필름의 제조 방법
US10893605B2 (en) * 2019-05-28 2021-01-12 Seagate Technology Llc Textured test pads for printed circuit board testing
CN110501567B (zh) * 2019-08-01 2022-07-19 RealMe重庆移动通信有限公司 一种功耗测试装置
TWI712136B (zh) * 2020-02-26 2020-12-01 頎邦科技股份有限公司 覆晶接合結構及其線路基板
TWI796549B (zh) * 2020-02-26 2023-03-21 頎邦科技股份有限公司 線路板
US20220098472A1 (en) * 2020-09-29 2022-03-31 Cnpc Usa Corporation Composition and Method for Breaking Synthetic-Polymer-Type Stimulation Fluids
CN114398850B (zh) * 2022-03-25 2022-06-03 苏州浪潮智能科技有限公司 一种防止pcb丝印影响高速信号阻抗变化的方法和装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06164091A (ja) * 1992-11-26 1994-06-10 Sankyo Seiki Mfg Co Ltd 回路基板
US5326428A (en) * 1993-09-03 1994-07-05 Micron Semiconductor, Inc. Method for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability
JPH07140209A (ja) * 1993-09-20 1995-06-02 Fujitsu Ltd 回路配線基板の検査装置およびその検査方法
US5539153A (en) * 1994-08-08 1996-07-23 Hewlett-Packard Company Method of bumping substrates by contained paste deposition
JP4066522B2 (ja) * 1998-07-22 2008-03-26 イビデン株式会社 プリント配線板
US6444561B1 (en) * 2000-10-02 2002-09-03 Industrial Technology Research Institute Method for forming solder bumps for flip-chip bonding by using perpendicularly laid masking strips
US6922049B2 (en) * 2003-02-04 2005-07-26 Mitac International Corp. Testing method for a printed circuit board formed with conductive traces for high-frequency differential signal transmission

Also Published As

Publication number Publication date
TW200520637A (en) 2005-06-16
DE102004045719B4 (de) 2007-01-25
SG129435A1 (en) 2007-02-26
US20050061540A1 (en) 2005-03-24
CN1602138A (zh) 2005-03-30
DE102004045719A1 (de) 2005-08-11
MY137474A (en) 2009-01-30
US7307222B2 (en) 2007-12-11

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