SG10201705433VA - X-Ray Back Scattering For Inspection Of Part - Google Patents

X-Ray Back Scattering For Inspection Of Part

Info

Publication number
SG10201705433VA
SG10201705433VA SG10201705433VA SG10201705433VA SG10201705433VA SG 10201705433V A SG10201705433V A SG 10201705433VA SG 10201705433V A SG10201705433V A SG 10201705433VA SG 10201705433V A SG10201705433V A SG 10201705433VA SG 10201705433V A SG10201705433V A SG 10201705433VA
Authority
SG
Singapore
Prior art keywords
inspection
back scattering
ray back
ray
scattering
Prior art date
Application number
SG10201705433VA
Other languages
English (en)
Inventor
Safai Morteza
Original Assignee
Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boeing Co filed Critical Boeing Co
Publication of SG10201705433VA publication Critical patent/SG10201705433VA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H01J35/065—Field emission, photo emission or secondary emission cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SG10201705433VA 2016-09-14 2017-06-30 X-Ray Back Scattering For Inspection Of Part SG10201705433VA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US15/264,845 US10541102B2 (en) 2016-09-14 2016-09-14 X-ray back scattering for inspection of part

Publications (1)

Publication Number Publication Date
SG10201705433VA true SG10201705433VA (en) 2018-04-27

Family

ID=59021295

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201705433VA SG10201705433VA (en) 2016-09-14 2017-06-30 X-Ray Back Scattering For Inspection Of Part

Country Status (5)

Country Link
US (1) US10541102B2 (ja)
EP (1) EP3297407B1 (ja)
JP (2) JP2018059911A (ja)
CN (1) CN107817257A (ja)
SG (1) SG10201705433VA (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10908100B2 (en) * 2018-09-24 2021-02-02 The Boeing Company Flexible aperture x-ray inspection
KR20200037733A (ko) * 2018-10-01 2020-04-09 사이언타 오미크론 악티에볼라그 경질 x-선 광전자 분광 장치 및 시스템
CN109350097B (zh) * 2018-12-17 2021-11-05 深圳先进技术研究院 X射线源阵列、x射线断层扫描系统和方法
US11293884B2 (en) * 2020-01-07 2022-04-05 The Boeing Company Multi source backscattering

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Also Published As

Publication number Publication date
US20180076000A1 (en) 2018-03-15
EP3297407A1 (en) 2018-03-21
EP3297407B1 (en) 2024-09-25
US10541102B2 (en) 2020-01-21
JP7440671B2 (ja) 2024-02-28
JP2023040235A (ja) 2023-03-22
JP2018059911A (ja) 2018-04-12
CN107817257A (zh) 2018-03-20

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