SG10201404394QA - Composition for metal plating comprising suppressing agent for void free submicron feature filing - Google Patents

Composition for metal plating comprising suppressing agent for void free submicron feature filing

Info

Publication number
SG10201404394QA
SG10201404394QA SG10201404394QA SG10201404394QA SG10201404394QA SG 10201404394Q A SG10201404394Q A SG 10201404394QA SG 10201404394Q A SG10201404394Q A SG 10201404394QA SG 10201404394Q A SG10201404394Q A SG 10201404394QA SG 10201404394Q A SG10201404394Q A SG 10201404394QA
Authority
SG
Singapore
Prior art keywords
filing
composition
metal plating
suppressing agent
void free
Prior art date
Application number
SG10201404394QA
Other languages
English (en)
Inventor
Cornelia Röger-Göpfert
Roman Benedikt Raether
Alexandra Haag
Dieter Mayer
Charlotte Emnet
Original Assignee
Basf Se
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Basf Se filed Critical Basf Se
Publication of SG10201404394QA publication Critical patent/SG10201404394QA/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/12Semiconductors
    • C25D7/123Semiconductors first coated with a seed layer or a conductive layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/288Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
    • H01L21/2885Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76877Filling of holes, grooves or trenches, e.g. vias, with conductive material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/42Plated through-holes or plated via connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Organic Chemistry (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Electroplating And Plating Baths Therefor (AREA)
  • Paints Or Removers (AREA)
SG10201404394QA 2009-07-30 2010-07-16 Composition for metal plating comprising suppressing agent for void free submicron feature filing SG10201404394QA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22980309P 2009-07-30 2009-07-30

Publications (1)

Publication Number Publication Date
SG10201404394QA true SG10201404394QA (en) 2014-10-30

Family

ID=43425023

Family Applications (2)

Application Number Title Priority Date Filing Date
SG10201404394QA SG10201404394QA (en) 2009-07-30 2010-07-16 Composition for metal plating comprising suppressing agent for void free submicron feature filing
SG2012003315A SG177685A1 (en) 2009-07-30 2010-07-16 Composition for metal plating comprising suppressing agent for void free submicron feature filling

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG2012003315A SG177685A1 (en) 2009-07-30 2010-07-16 Composition for metal plating comprising suppressing agent for void free submicron feature filling

Country Status (11)

Country Link
US (1) US9869029B2 (zh)
EP (1) EP2459778B1 (zh)
JP (1) JP5714581B2 (zh)
KR (1) KR101752018B1 (zh)
CN (1) CN102597329B (zh)
IL (1) IL217536A (zh)
MY (1) MY157126A (zh)
RU (1) RU2539897C2 (zh)
SG (2) SG10201404394QA (zh)
TW (1) TWI487813B (zh)
WO (1) WO2011012462A2 (zh)

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WO2011012475A1 (en) * 2009-07-30 2011-02-03 Basf Se Composition for metal plating comprising suppressing agent for void free submicron feature filling
US8790426B2 (en) 2010-04-27 2014-07-29 Basf Se Quaternized terpolymer
MY170653A (en) 2010-12-21 2019-08-23 Basf Se Composition for metal electroplating comprising leveling agent
BR112013021062A2 (pt) * 2011-02-22 2019-09-24 Basf Se polímero, processo para a preparação de um polímero, e, uso de um polímero
SG192737A1 (en) * 2011-02-22 2013-09-30 Basf Se Polymers based on glycerol carbonate
KR101952568B1 (ko) 2011-06-01 2019-02-27 바스프 에스이 상호연결 피처 및 실리콘 관통 전극의 보텀-업 충전을 위한 첨가제를 포함하는 금속 전기도금 조성물
EP2530102A1 (en) 2011-06-01 2012-12-05 Basf Se Additive and composition for metal electroplating comprising an additive for bottom-up filling of though silicon vias
US20130133243A1 (en) 2011-06-28 2013-05-30 Basf Se Quaternized nitrogen compounds and use thereof as additives in fuels and lubricants
CN104797633B (zh) 2012-11-09 2018-04-24 巴斯夫欧洲公司 用于金属电镀的包含调平剂的组合物
BR112015022373B1 (pt) * 2013-03-13 2020-08-18 Basf Se Composição umectante e solo tratado
PL406197A1 (pl) * 2013-11-22 2015-05-25 Inphotech Spółka Z Ograniczoną Odpowiedzialnością Sposób łączenia włókien światłowodowych pokrytych warstwą przewodzącą z elementami metalowymi
JP6474410B2 (ja) * 2013-12-09 2019-02-27 アヴニ 電気化学的に不活性なカチオンを含む銅電着浴
US9617648B2 (en) * 2015-03-04 2017-04-11 Lam Research Corporation Pretreatment of nickel and cobalt liners for electrodeposition of copper into through silicon vias
EP3885475A1 (en) * 2016-07-18 2021-09-29 Basf Se Composition for cobalt plating comprising additive for void-free submicron feature filling
JP2020502370A (ja) 2016-12-20 2020-01-23 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se ボイドフリーでの埋め込みのための抑制剤を含む金属めっきのための組成物
WO2019043146A1 (en) 2017-09-04 2019-03-07 Basf Se COMPOSITION FOR METALLIC ELECTROPLATING COMPRISING A LEVELING AGENT
JP2021503560A (ja) * 2017-11-20 2021-02-12 ビーエイエスエフ・ソシエタス・エウロパエアBasf Se レベリング剤を含んだコバルト電気メッキ用組成物
JP7383632B2 (ja) * 2018-03-29 2023-11-20 ビーエーエスエフ ソシエタス・ヨーロピア 錯化剤を含むスズ-銀合金電気メッキ用組成物
US10529622B1 (en) 2018-07-10 2020-01-07 International Business Machines Corporation Void-free metallic interconnect structures with self-formed diffusion barrier layers
US20220333262A1 (en) 2019-09-27 2022-10-20 Basf Se Composition for copper bump electrodeposition comprising a leveling agent
CN114450438A (zh) 2019-09-27 2022-05-06 巴斯夫欧洲公司 用于铜凸块电沉积的包含流平剂的组合物
EP4127025A1 (en) 2020-04-03 2023-02-08 Basf Se Composition for copper bump electrodeposition comprising a polyaminoamide type leveling agent
EP3922662A1 (en) 2020-06-10 2021-12-15 Basf Se Polyalkanolamine
US11384446B2 (en) 2020-08-28 2022-07-12 Macdermid Enthone Inc. Compositions and methods for the electrodeposition of nanotwinned copper
KR20240070557A (ko) 2021-10-01 2024-05-21 바스프 에스이 폴리아미노아미드 타입 레벨링제를 포함하는 구리 전착용 조성물
WO2024008562A1 (en) 2022-07-07 2024-01-11 Basf Se Use of a composition comprising a polyaminoamide type compound for copper nanotwin electrodeposition

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SG174264A1 (en) 2009-04-07 2011-10-28 Basf Se Composition for metal plating comprising suppressing agent for void free submicron feature filling
SG174393A1 (en) 2009-04-07 2011-11-28 Basf Se Composition for metal plating comprising suppressing agent for void free submicron feature filling
EP2417284B1 (en) 2009-04-07 2015-01-14 Basf Se Composition for metal plating comprising suppressing agent for void free submicron feature filling

Also Published As

Publication number Publication date
KR101752018B1 (ko) 2017-06-28
IL217536A (en) 2016-05-31
MY157126A (en) 2016-05-13
SG177685A1 (en) 2012-02-28
TW201109477A (en) 2011-03-16
US20120128888A1 (en) 2012-05-24
JP5714581B2 (ja) 2015-05-07
WO2011012462A2 (en) 2011-02-03
CN102597329B (zh) 2015-12-16
EP2459778B1 (en) 2015-01-14
US9869029B2 (en) 2018-01-16
IL217536A0 (en) 2012-02-29
JP2013500394A (ja) 2013-01-07
TWI487813B (zh) 2015-06-11
WO2011012462A3 (en) 2012-01-19
RU2539897C2 (ru) 2015-01-27
EP2459778A2 (en) 2012-06-06
CN102597329A (zh) 2012-07-18
RU2012107133A (ru) 2013-09-10
KR20120051721A (ko) 2012-05-22

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