SG102006A1 - Method and apparatus for remotely testing semiconductors - Google Patents

Method and apparatus for remotely testing semiconductors

Info

Publication number
SG102006A1
SG102006A1 SG200105909A SG200105909A SG102006A1 SG 102006 A1 SG102006 A1 SG 102006A1 SG 200105909 A SG200105909 A SG 200105909A SG 200105909 A SG200105909 A SG 200105909A SG 102006 A1 SG102006 A1 SG 102006A1
Authority
SG
Singapore
Prior art keywords
remotely testing
testing semiconductors
semiconductors
remotely
testing
Prior art date
Application number
SG200105909A
Other languages
English (en)
Inventor
W Crist Fredrick
J Wagner Timothy
Original Assignee
Schlumberger Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Technologies Inc filed Critical Schlumberger Technologies Inc
Publication of SG102006A1 publication Critical patent/SG102006A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31718—Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
SG200105909A 2000-09-28 2001-09-27 Method and apparatus for remotely testing semiconductors SG102006A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/676,292 US6879940B1 (en) 2000-09-28 2000-09-28 Method and apparatus for remotely testing semiconductors

Publications (1)

Publication Number Publication Date
SG102006A1 true SG102006A1 (en) 2004-02-27

Family

ID=24713941

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200105909A SG102006A1 (en) 2000-09-28 2001-09-27 Method and apparatus for remotely testing semiconductors

Country Status (6)

Country Link
US (1) US6879940B1 (ja)
JP (1) JP3862984B2 (ja)
KR (1) KR100433241B1 (ja)
CN (1) CN1267980C (ja)
SG (1) SG102006A1 (ja)
TW (1) TW498416B (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8510476B2 (en) * 2001-02-15 2013-08-13 Brooks Automation, Inc. Secure remote diagnostic customer support network
JP4664618B2 (ja) 2004-04-30 2011-04-06 株式会社東芝 計測システム
US7253651B2 (en) * 2004-12-21 2007-08-07 Formfactor, Inc. Remote test facility with wireless interface to local test facilities
US7805948B2 (en) * 2005-12-15 2010-10-05 Pratt & Whitney Canada Corp. Internally mounted device for a pressure vessel
JP5464832B2 (ja) * 2008-09-26 2014-04-09 株式会社日立国際電気 基板処理システム、群管理装置、リモートアクセス方法及びリモート接続プログラム
JP5833500B2 (ja) * 2012-06-04 2015-12-16 株式会社アドバンテスト 試験システム
US20140006570A1 (en) * 2012-06-29 2014-01-02 Globalfoundries Inc. Method and system for customer specific test system allocation in a production environment

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6236952B1 (en) * 1997-06-30 2001-05-22 Samsung Electronics Co., Ltd. System and method for automatically creating and transmitting test conditions of integrated circuit devices

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5563524A (en) * 1989-05-19 1996-10-08 A.T.E. Solutions, Inc. Apparatus for testing electric circuits
JPH06120316A (ja) 1992-08-21 1994-04-28 Fujitsu Ltd 部品の試験方法
JP3919294B2 (ja) 1997-06-24 2007-05-23 キヤノン株式会社 産業用機器の遠隔保守システムおよび方法
US5889986A (en) * 1997-01-28 1999-03-30 Samsung Electronics Co., Ltd. Instruction fetch unit including instruction buffer and secondary or branch target buffer that transfers prefetched instructions to the instruction buffer
JPH10256109A (ja) 1997-03-11 1998-09-25 Canon Inc 半導体製造装置及びデバイス製造方法
KR100216066B1 (ko) * 1997-05-20 1999-08-16 윤종용 반도체 집적회로 소자 검사공정 제어 시스템 및 제어방법
JP3703618B2 (ja) * 1998-02-17 2005-10-05 横河電機株式会社 Ｉｃテストシステム
JP2000077290A (ja) 1998-08-28 2000-03-14 Oki Electric Ind Co Ltd 半導体製造工程管理システム
US6393591B1 (en) 1999-02-12 2002-05-21 Xilinx, Inc. Method for remotely testing microelectronic device over the internet

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6236952B1 (en) * 1997-06-30 2001-05-22 Samsung Electronics Co., Ltd. System and method for automatically creating and transmitting test conditions of integrated circuit devices

Also Published As

Publication number Publication date
CN1267980C (zh) 2006-08-02
JP3862984B2 (ja) 2006-12-27
US6879940B1 (en) 2005-04-12
JP2002203760A (ja) 2002-07-19
CN1347145A (zh) 2002-05-01
KR20020025769A (ko) 2002-04-04
KR100433241B1 (ko) 2004-05-24
TW498416B (en) 2002-08-11

Similar Documents

Publication Publication Date Title
GB2383422B (en) Method and apparatus for well testing
IL153050A0 (en) Method and apparatus for maximizing test coverage
EP1462789A4 (en) METHOD AND DEVICE FOR TIRE TESTING
GB2383640B (en) Method and apparatus for memory self testing
SG106081A1 (en) Apparatus and method for testing semiconductor devices
GB2382136B (en) Method and apparatus for flow measurement
GC0000239A (en) Apparatus and method for characterizing multiphaseeffluents
EP1167964A4 (en) METHOD AND DEVICE FOR NON-DESTRUCTIVE TESTING
GB0223715D0 (en) Device configuration method and apparatus
GB2369895B (en) Method and apparatus for characterizing a device under test
SG97186A1 (en) Method and apparatus for inspecting components
GB2389382B (en) Device and method for replacing lines
SG102006A1 (en) Method and apparatus for remotely testing semiconductors
GB2359138B (en) Method and apparatus for monitoring adsorbed water
GB0100248D0 (en) Method and apparatus for inspecting an object
HK1038985B (zh) 測試電路的方法和裝置
SG119154A1 (en) Apparatus and method for testing semiconductor devices
GB2366890B (en) Memory testing apparatus and method
GB2370141B (en) Clock-synchronism evaluating apparatus and method
GB2375270B (en) Method and apparatus for monitoring movement
GB2361144B (en) Monitoring apparatus and method
GB0001460D0 (en) Testing method and apparatus
GB2358785B (en) Method and apparatus for encapsulating the hand
GB2381578B (en) Device and method for testing a material
GB2370362B (en) Method and apparatus for testing circuitry