SE9903749D0 - Förfarande samt anordning för mätning av parameter hos lackskikt - Google Patents

Förfarande samt anordning för mätning av parameter hos lackskikt

Info

Publication number
SE9903749D0
SE9903749D0 SE9903749A SE9903749A SE9903749D0 SE 9903749 D0 SE9903749 D0 SE 9903749D0 SE 9903749 A SE9903749 A SE 9903749A SE 9903749 A SE9903749 A SE 9903749A SE 9903749 D0 SE9903749 D0 SE 9903749D0
Authority
SE
Sweden
Prior art keywords
paint film
parameter
measuring
movement
target point
Prior art date
Application number
SE9903749A
Other languages
English (en)
Other versions
SE518278C2 (sv
SE9903749L (sv
Inventor
Ole Arnt Anfindsen
Original Assignee
Abb Flexible Automation As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abb Flexible Automation As filed Critical Abb Flexible Automation As
Priority to SE9903749A priority Critical patent/SE518278C2/sv
Publication of SE9903749D0 publication Critical patent/SE9903749D0/sv
Priority to PCT/IB2000/001506 priority patent/WO2001031293A1/en
Priority to AU10453/01A priority patent/AU1045301A/en
Publication of SE9903749L publication Critical patent/SE9903749L/sv
Publication of SE518278C2 publication Critical patent/SE518278C2/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Spray Control Apparatus (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
SE9903749A 1999-10-19 1999-10-19 Förfarande samt anordning för mätning av parameter hos lackskikt SE518278C2 (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE9903749A SE518278C2 (sv) 1999-10-19 1999-10-19 Förfarande samt anordning för mätning av parameter hos lackskikt
PCT/IB2000/001506 WO2001031293A1 (en) 1999-10-19 2000-10-19 A method and a device for measuring parameters of paint films
AU10453/01A AU1045301A (en) 1999-10-19 2000-10-19 A method and a device for measuring parameters of paint films

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9903749A SE518278C2 (sv) 1999-10-19 1999-10-19 Förfarande samt anordning för mätning av parameter hos lackskikt

Publications (3)

Publication Number Publication Date
SE9903749D0 true SE9903749D0 (sv) 1999-10-19
SE9903749L SE9903749L (sv) 2001-04-20
SE518278C2 SE518278C2 (sv) 2002-09-17

Family

ID=20417391

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9903749A SE518278C2 (sv) 1999-10-19 1999-10-19 Förfarande samt anordning för mätning av parameter hos lackskikt

Country Status (3)

Country Link
AU (1) AU1045301A (sv)
SE (1) SE518278C2 (sv)
WO (1) WO2001031293A1 (sv)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2672981T3 (es) * 2014-07-18 2018-06-19 Optisense Gmbh & Co. Kg Instrumento de medición fototérmica para la medición de espesores de capas así como procedimiento para la medición fototérmica
WO2018185891A1 (ja) * 2017-04-05 2018-10-11 株式会社ニコン 塗膜状態解析装置および膜厚測定装置
CN107030734B (zh) * 2017-06-22 2023-05-16 北京兴信易成机电工程有限公司 一种漆膜机器人自动检测系统
DE102019104260A1 (de) * 2019-02-20 2020-08-20 Stefan Böttger Verfahren und Vorrichtung zur Bestimmung einer Schichtdicke einer auf ein Substrat aufgebrachten Schicht

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4818118A (en) * 1984-11-26 1989-04-04 General Electric Company Coating thickness measurement
DE3820862A1 (de) * 1988-06-21 1989-12-28 Soelter Hans Joachim Dipl Phys Verfahren und vorrichtung zur kontaktlosen untersuchung von oberflaechen und inneren strukturen eines festen pruefkoerpers
DE4003407A1 (de) * 1990-02-05 1991-08-08 Siemens Ag Verfahren und anordnung zum pruefen der oberflaeche von bewegten objekten
DE4343076C2 (de) * 1993-12-16 1997-04-03 Phototherm Dr Petry Gmbh Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes
DE19520788C2 (de) * 1995-01-13 2001-08-16 Optisense Ges Fuer Optische Pr Verfahren und Vorrichtung zur Bestimmung der Schichtdicke, der Leitfähigkeit und/oder der Schichtkontaktgüte von auf Substraten aufgetragenen Schichten

Also Published As

Publication number Publication date
AU1045301A (en) 2001-05-08
SE518278C2 (sv) 2002-09-17
SE9903749L (sv) 2001-04-20
WO2001031293A1 (en) 2001-05-03

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Legal Events

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