SE9903749D0 - Method and apparatus for measuring parameters of lacquer layers - Google Patents

Method and apparatus for measuring parameters of lacquer layers

Info

Publication number
SE9903749D0
SE9903749D0 SE9903749A SE9903749A SE9903749D0 SE 9903749 D0 SE9903749 D0 SE 9903749D0 SE 9903749 A SE9903749 A SE 9903749A SE 9903749 A SE9903749 A SE 9903749A SE 9903749 D0 SE9903749 D0 SE 9903749D0
Authority
SE
Sweden
Prior art keywords
paint film
parameter
measuring
movement
target point
Prior art date
Application number
SE9903749A
Other languages
Swedish (sv)
Other versions
SE9903749L (en
SE518278C2 (en
Inventor
Ole Arnt Anfindsen
Original Assignee
Abb Flexible Automation As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abb Flexible Automation As filed Critical Abb Flexible Automation As
Priority to SE9903749A priority Critical patent/SE518278C2/en
Publication of SE9903749D0 publication Critical patent/SE9903749D0/en
Priority to PCT/IB2000/001506 priority patent/WO2001031293A1/en
Priority to AU10453/01A priority patent/AU1045301A/en
Publication of SE9903749L publication Critical patent/SE9903749L/en
Publication of SE518278C2 publication Critical patent/SE518278C2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spray Control Apparatus (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)

Abstract

A device for measuring at least one parameter of a fluid paint film applied by machine on an object comprises a means (7) adapted to radiate the paint film for heating thereof, a member (9) adapted to detect heat radiation emitted by the paint film and members (15) for calculating a dimension of said parameter on the basis of temperature information received from the detecting member. An arrangement (11) is adapted to cause a movement of the radiation means with respect to the film. The radiation means is adapted to continuously radiate a target point in this way moving along the paint film during at least a part of the movement. The detecting member is adapted to detect the emission of heat radiation of the moving target point with a predetermined delay for measuring said parameter of the paint film along a continuous elongated field of the paint film.
SE9903749A 1999-10-19 1999-10-19 Method and apparatus for measuring parameters of lacquer layers SE518278C2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE9903749A SE518278C2 (en) 1999-10-19 1999-10-19 Method and apparatus for measuring parameters of lacquer layers
PCT/IB2000/001506 WO2001031293A1 (en) 1999-10-19 2000-10-19 A method and a device for measuring parameters of paint films
AU10453/01A AU1045301A (en) 1999-10-19 2000-10-19 A method and a device for measuring parameters of paint films

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9903749A SE518278C2 (en) 1999-10-19 1999-10-19 Method and apparatus for measuring parameters of lacquer layers

Publications (3)

Publication Number Publication Date
SE9903749D0 true SE9903749D0 (en) 1999-10-19
SE9903749L SE9903749L (en) 2001-04-20
SE518278C2 SE518278C2 (en) 2002-09-17

Family

ID=20417391

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9903749A SE518278C2 (en) 1999-10-19 1999-10-19 Method and apparatus for measuring parameters of lacquer layers

Country Status (3)

Country Link
AU (1) AU1045301A (en)
SE (1) SE518278C2 (en)
WO (1) WO2001031293A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2672981T3 (en) * 2014-07-18 2018-06-19 Optisense Gmbh & Co. Kg Photothermal measuring instrument for the measurement of layer thicknesses as well as a procedure for photothermal measurement
WO2018185891A1 (en) * 2017-04-05 2018-10-11 株式会社ニコン Coating film state analysis device and film thickness measurement device
CN107030734B (en) * 2017-06-22 2023-05-16 北京兴信易成机电工程有限公司 Automatic detection system for paint film robot
DE102019104260A1 (en) * 2019-02-20 2020-08-20 Stefan Böttger Method and device for determining a layer thickness of a layer applied to a substrate

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4818118A (en) * 1984-11-26 1989-04-04 General Electric Company Coating thickness measurement
DE3820862A1 (en) * 1988-06-21 1989-12-28 Soelter Hans Joachim Dipl Phys METHOD AND DEVICE FOR CONTACTLESS EXAMINATION OF SURFACES AND INTERNAL STRUCTURES OF A FIXED TEST BODY
DE4003407A1 (en) * 1990-02-05 1991-08-08 Siemens Ag Testing surfaces of moving objects - by photo-thermal heat wave analysis using fixed measurement arrangement with measurement spot inside thermal radiation spot
DE4343076C2 (en) * 1993-12-16 1997-04-03 Phototherm Dr Petry Gmbh Device for photothermal testing of a surface of an object in particular being moved
DE19520788C2 (en) * 1995-01-13 2001-08-16 Optisense Ges Fuer Optische Pr Method and device for determining the layer thickness, the conductivity and / or the layer contact quality of layers applied to substrates

Also Published As

Publication number Publication date
SE9903749L (en) 2001-04-20
WO2001031293A1 (en) 2001-05-03
SE518278C2 (en) 2002-09-17
AU1045301A (en) 2001-05-08

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