SE7804340L - Hogkenslig metcell for differentialrefraktometer av interferenstyp - Google Patents

Hogkenslig metcell for differentialrefraktometer av interferenstyp

Info

Publication number
SE7804340L
SE7804340L SE7804340A SE7804340A SE7804340L SE 7804340 L SE7804340 L SE 7804340L SE 7804340 A SE7804340 A SE 7804340A SE 7804340 A SE7804340 A SE 7804340A SE 7804340 L SE7804340 L SE 7804340L
Authority
SE
Sweden
Prior art keywords
interference type
channel
metcell
high sensitive
refractive index
Prior art date
Application number
SE7804340A
Other languages
Unknown language ( )
English (en)
Other versions
SE438208B (sv
Original Assignee
Silverbage Sten
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Silverbage Sten filed Critical Silverbage Sten
Priority to SE7804340A priority Critical patent/SE438208B/sv
Priority to DE19792914571 priority patent/DE2914571A1/de
Priority to GB7912782A priority patent/GB2020059B/en
Priority to US06/029,401 priority patent/US4229105A/en
Priority to FR7909457A priority patent/FR2423772A1/fr
Publication of SE7804340L publication Critical patent/SE7804340L/sv
Publication of SE438208B publication Critical patent/SE438208B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SE7804340A 1978-04-17 1978-04-17 Metcell for anvendning i en refraktometer SE438208B (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE7804340A SE438208B (sv) 1978-04-17 1978-04-17 Metcell for anvendning i en refraktometer
DE19792914571 DE2914571A1 (de) 1978-04-17 1979-04-10 Hochempfindliche messzelle fuer refraktometer
GB7912782A GB2020059B (en) 1978-04-17 1979-04-11 Optical measuring cell
US06/029,401 US4229105A (en) 1978-04-17 1979-04-12 Sensitive measuring cell for a differential refractometer of the interference type
FR7909457A FR2423772A1 (fr) 1978-04-17 1979-04-13 Cellule de mesure tres sensible pour un refractometre differentiel du type a interferences ou pour un autre type de detecteur servant dans des dispositifs d'analyses chimiques

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7804340A SE438208B (sv) 1978-04-17 1978-04-17 Metcell for anvendning i en refraktometer

Publications (2)

Publication Number Publication Date
SE7804340L true SE7804340L (sv) 1979-10-18
SE438208B SE438208B (sv) 1985-04-01

Family

ID=20334641

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7804340A SE438208B (sv) 1978-04-17 1978-04-17 Metcell for anvendning i en refraktometer

Country Status (5)

Country Link
US (1) US4229105A (sv)
DE (1) DE2914571A1 (sv)
FR (1) FR2423772A1 (sv)
GB (1) GB2020059B (sv)
SE (1) SE438208B (sv)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58124041A (ja) * 1982-01-19 1983-07-23 Nippon Denso Co Ltd 車両用空燃比制御装置
US4447153A (en) * 1982-06-08 1984-05-08 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for quantitative measurement of small differences in optical absorptivity between two samples using differential interferometry and the thermooptic effect
US4455089A (en) * 1982-08-25 1984-06-19 Iowa State University Research Foundation, Inc. Refractive index and absorption detector for liquid chromatography based on Fabry-Perot interferometry
CA1245878A (en) * 1985-12-31 1988-12-06 Jurgen H. Achtermann Precise determination of the compressibility factor of a gas from refractive index measurements
US4906095A (en) * 1988-01-25 1990-03-06 The United States Of America As Represented By The United States Department Of Energy Apparatus and method for performing two-frequency interferometry
US4952055A (en) * 1988-10-03 1990-08-28 Wyatt Technology Corporation Differential refractometer
EP0616210A1 (en) * 1993-03-17 1994-09-21 Ciba-Geigy Ag Flow cell for calorimetric measurements
US5870185A (en) * 1996-10-21 1999-02-09 C.F.C. Technology, Inc. Apparatus and method for fluid analysis
US6128080A (en) * 1997-06-06 2000-10-03 Wyatt Technology Corporation Extended range interferometric refractometer
DE19732619C2 (de) * 1997-07-29 1999-08-19 Fraunhofer Ges Forschung Optische Detektoreinrichtung
US9989459B2 (en) * 2013-03-15 2018-06-05 Waters Technologies Corporation Systems and methods for refractive index detection

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2964992A (en) * 1956-02-07 1960-12-20 Du Pont Differential refractometer cell
US3680963A (en) * 1970-09-04 1972-08-01 Hercules Inc Apparatus for measuring changes in the optical refractive index of fluids
US3778171A (en) * 1972-11-09 1973-12-11 Beckman Instruments Inc Sample cell for ultracentrifuge utilizing-multiple-beam interference optics
FR2210773B1 (sv) * 1972-12-20 1976-08-27 Devdariani Irakly
DE2306091C3 (de) * 1973-02-08 1975-10-30 Hewlett-Packard Gmbh, 7030 Boeblingen Interferenz-Refraktometer

Also Published As

Publication number Publication date
FR2423772B1 (sv) 1984-03-16
SE438208B (sv) 1985-04-01
US4229105A (en) 1980-10-21
GB2020059A (en) 1979-11-07
FR2423772A1 (fr) 1979-11-16
GB2020059B (en) 1982-10-27
DE2914571A1 (de) 1979-10-25

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