SE7510483L - BOLD WITH INSULATED, FLOATING STEERING - Google Patents
BOLD WITH INSULATED, FLOATING STEERINGInfo
- Publication number
- SE7510483L SE7510483L SE7510483A SE7510483A SE7510483L SE 7510483 L SE7510483 L SE 7510483L SE 7510483 A SE7510483 A SE 7510483A SE 7510483 A SE7510483 A SE 7510483A SE 7510483 L SE7510483 L SE 7510483L
- Authority
- SE
- Sweden
- Prior art keywords
- gate
- channel
- charges
- bold
- insulated
- Prior art date
Links
- 230000005669 field effect Effects 0.000 abstract 1
- 238000009413 insulation Methods 0.000 abstract 1
- 238000007493 shaping process Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
- H01L29/7881—Programmable transistors with only two possible levels of programmation
- H01L29/7884—Programmable transistors with only two possible levels of programmation charging by hot carrier injection
- H01L29/7885—Hot carrier injection from the channel
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/403—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
- G11C11/404—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with one charge-transfer gate, e.g. MOS transistor, per cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0416—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0425—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a merged floating gate and select transistor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Junction Field-Effect Transistors (AREA)
- Non-Volatile Memory (AREA)
- Thin Film Transistor (AREA)
Abstract
1483555 Field effect transistors SIEMENS AG 22 Aug 1975 [20 Sept 1974] 34866/75 Heading H1K A FET for use as a storage element has a floating gate G and a channel K containing an inhomogeneous region V which accelerates charges into the gate G which charges up accordingly. The inhomogeneity may be produced by one or more tapered or constricted channel zones produced by shaping the gate electrode G appropriately and/or by variations in the thickness of the gate insulation A. The channel K may be P or N type and the transistor operated in the enhancement or depletion mode, and an external electrode GHA may be capacitively coupled to the gate electrode G.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2445079A DE2445079C3 (en) | 1974-09-20 | 1974-09-20 | Storage field effect transistor |
Publications (2)
Publication Number | Publication Date |
---|---|
SE7510483L true SE7510483L (en) | 1976-03-22 |
SE402186B SE402186B (en) | 1978-06-19 |
Family
ID=5926358
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE7510483A SE402186B (en) | 1974-09-20 | 1975-09-18 | FAT ELEMENT WITH ATMINSTONE A BOARD, NAMELY ONE OF AN INSULATOR COMPLETELY SURROUNDED FLOATING MEMORY BOARD |
Country Status (10)
Country | Link |
---|---|
JP (1) | JPS5157291A (en) |
AT (1) | AT376845B (en) |
BE (1) | BE833632A (en) |
CH (1) | CH591763A5 (en) |
DK (1) | DK141545C (en) |
FR (1) | FR2285719A1 (en) |
GB (1) | GB1483555A (en) |
IT (1) | IT1042654B (en) |
NL (1) | NL163373C (en) |
SE (1) | SE402186B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5826846Y2 (en) * | 1978-10-26 | 1983-06-10 | 三菱自動車工業株式会社 | Guide mounting structure for seat belt support member |
JPS5857750A (en) * | 1981-10-01 | 1983-04-06 | Seiko Instr & Electronics Ltd | Non-volatile semiconductor memory |
JPS5887877A (en) * | 1981-11-19 | 1983-05-25 | Sanyo Electric Co Ltd | Semiconductor nonvolatile memory |
JPH06252392A (en) * | 1993-03-01 | 1994-09-09 | Nec Corp | Field effect transistor |
KR0149571B1 (en) * | 1995-05-04 | 1998-10-01 | 김주용 | Transistor |
JP2016006894A (en) * | 2015-08-03 | 2016-01-14 | スパンション エルエルシー | Semiconductor device and manufacturing method of the same |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1071384A (en) * | 1963-06-24 | 1967-06-07 | Hitachi Ltd | Method for manufacture of field effect semiconductor devices |
US3745426A (en) * | 1970-06-01 | 1973-07-10 | Rca Corp | Insulated gate field-effect transistor with variable gain |
US3660819A (en) * | 1970-06-15 | 1972-05-02 | Intel Corp | Floating gate transistor and method for charging and discharging same |
AU461729B2 (en) * | 1971-01-14 | 1975-06-05 | Rca Corporation | Charge coupled circuits |
NL7212151A (en) * | 1972-09-07 | 1974-03-11 |
-
1975
- 1975-08-13 AT AT629275A patent/AT376845B/en not_active IP Right Cessation
- 1975-08-22 GB GB3486675A patent/GB1483555A/en not_active Expired
- 1975-09-16 FR FR7528362A patent/FR2285719A1/en active Granted
- 1975-09-16 CH CH1198175A patent/CH591763A5/xx not_active IP Right Cessation
- 1975-09-17 NL NL7510942A patent/NL163373C/en not_active IP Right Cessation
- 1975-09-18 SE SE7510483A patent/SE402186B/en not_active IP Right Cessation
- 1975-09-18 IT IT2736975A patent/IT1042654B/en active
- 1975-09-19 DK DK423275A patent/DK141545C/en not_active IP Right Cessation
- 1975-09-19 JP JP11352375A patent/JPS5157291A/en active Granted
- 1975-09-19 BE BE160217A patent/BE833632A/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
ATA629275A (en) | 1984-05-15 |
NL163373C (en) | 1980-08-15 |
CH591763A5 (en) | 1977-09-30 |
DK141545B (en) | 1980-04-14 |
BE833632A (en) | 1976-03-19 |
DK423275A (en) | 1976-03-21 |
JPS5528554B2 (en) | 1980-07-29 |
IT1042654B (en) | 1980-01-30 |
JPS5157291A (en) | 1976-05-19 |
NL7510942A (en) | 1976-03-23 |
FR2285719B1 (en) | 1979-03-23 |
SE402186B (en) | 1978-06-19 |
GB1483555A (en) | 1977-08-24 |
FR2285719A1 (en) | 1976-04-16 |
DK141545C (en) | 1980-09-29 |
AT376845B (en) | 1985-01-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |
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