SE7510483L - BOLD WITH INSULATED, FLOATING STEERING - Google Patents

BOLD WITH INSULATED, FLOATING STEERING

Info

Publication number
SE7510483L
SE7510483L SE7510483A SE7510483A SE7510483L SE 7510483 L SE7510483 L SE 7510483L SE 7510483 A SE7510483 A SE 7510483A SE 7510483 A SE7510483 A SE 7510483A SE 7510483 L SE7510483 L SE 7510483L
Authority
SE
Sweden
Prior art keywords
gate
channel
charges
bold
insulated
Prior art date
Application number
SE7510483A
Other languages
Swedish (sv)
Other versions
SE402186B (en
Inventor
B Rossler
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE2445079A external-priority patent/DE2445079C3/en
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of SE7510483L publication Critical patent/SE7510483L/en
Publication of SE402186B publication Critical patent/SE402186B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/788Field effect transistors with field effect produced by an insulated gate with floating gate
    • H01L29/7881Programmable transistors with only two possible levels of programmation
    • H01L29/7884Programmable transistors with only two possible levels of programmation charging by hot carrier injection
    • H01L29/7885Hot carrier injection from the channel
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/403Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
    • G11C11/404Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with one charge-transfer gate, e.g. MOS transistor, per cell
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0416Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0425Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a merged floating gate and select transistor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/14Circuits for erasing electrically, e.g. erase voltage switching circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • G11C16/14Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G11C16/16Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Non-Volatile Memory (AREA)
  • Thin Film Transistor (AREA)

Abstract

1483555 Field effect transistors SIEMENS AG 22 Aug 1975 [20 Sept 1974] 34866/75 Heading H1K A FET for use as a storage element has a floating gate G and a channel K containing an inhomogeneous region V which accelerates charges into the gate G which charges up accordingly. The inhomogeneity may be produced by one or more tapered or constricted channel zones produced by shaping the gate electrode G appropriately and/or by variations in the thickness of the gate insulation A. The channel K may be P or N type and the transistor operated in the enhancement or depletion mode, and an external electrode GHA may be capacitively coupled to the gate electrode G.
SE7510483A 1974-09-20 1975-09-18 FAT ELEMENT WITH ATMINSTONE A BOARD, NAMELY ONE OF AN INSULATOR COMPLETELY SURROUNDED FLOATING MEMORY BOARD SE402186B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2445079A DE2445079C3 (en) 1974-09-20 1974-09-20 Storage field effect transistor

Publications (2)

Publication Number Publication Date
SE7510483L true SE7510483L (en) 1976-03-22
SE402186B SE402186B (en) 1978-06-19

Family

ID=5926358

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7510483A SE402186B (en) 1974-09-20 1975-09-18 FAT ELEMENT WITH ATMINSTONE A BOARD, NAMELY ONE OF AN INSULATOR COMPLETELY SURROUNDED FLOATING MEMORY BOARD

Country Status (10)

Country Link
JP (1) JPS5157291A (en)
AT (1) AT376845B (en)
BE (1) BE833632A (en)
CH (1) CH591763A5 (en)
DK (1) DK141545C (en)
FR (1) FR2285719A1 (en)
GB (1) GB1483555A (en)
IT (1) IT1042654B (en)
NL (1) NL163373C (en)
SE (1) SE402186B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5826846Y2 (en) * 1978-10-26 1983-06-10 三菱自動車工業株式会社 Guide mounting structure for seat belt support member
JPS5857750A (en) * 1981-10-01 1983-04-06 Seiko Instr & Electronics Ltd Non-volatile semiconductor memory
JPS5887877A (en) * 1981-11-19 1983-05-25 Sanyo Electric Co Ltd Semiconductor nonvolatile memory
JPH06252392A (en) * 1993-03-01 1994-09-09 Nec Corp Field effect transistor
KR0149571B1 (en) * 1995-05-04 1998-10-01 김주용 Transistor
JP2016006894A (en) * 2015-08-03 2016-01-14 スパンション エルエルシー Semiconductor device and manufacturing method of the same

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1071384A (en) * 1963-06-24 1967-06-07 Hitachi Ltd Method for manufacture of field effect semiconductor devices
US3745426A (en) * 1970-06-01 1973-07-10 Rca Corp Insulated gate field-effect transistor with variable gain
US3660819A (en) * 1970-06-15 1972-05-02 Intel Corp Floating gate transistor and method for charging and discharging same
AU461729B2 (en) * 1971-01-14 1975-06-05 Rca Corporation Charge coupled circuits
NL7212151A (en) * 1972-09-07 1974-03-11

Also Published As

Publication number Publication date
ATA629275A (en) 1984-05-15
NL163373C (en) 1980-08-15
CH591763A5 (en) 1977-09-30
DK141545B (en) 1980-04-14
BE833632A (en) 1976-03-19
DK423275A (en) 1976-03-21
JPS5528554B2 (en) 1980-07-29
IT1042654B (en) 1980-01-30
JPS5157291A (en) 1976-05-19
NL7510942A (en) 1976-03-23
FR2285719B1 (en) 1979-03-23
SE402186B (en) 1978-06-19
GB1483555A (en) 1977-08-24
FR2285719A1 (en) 1976-04-16
DK141545C (en) 1980-09-29
AT376845B (en) 1985-01-10

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