SE7405630L - Anordning for skikttjockleksbestemning alternativt yttopografimetning - Google Patents

Anordning for skikttjockleksbestemning alternativt yttopografimetning

Info

Publication number
SE7405630L
SE7405630L SE7405630A SE7405630A SE7405630L SE 7405630 L SE7405630 L SE 7405630L SE 7405630 A SE7405630 A SE 7405630A SE 7405630 A SE7405630 A SE 7405630A SE 7405630 L SE7405630 L SE 7405630L
Authority
SE
Sweden
Prior art keywords
light
layer
shield
thickness
indicator
Prior art date
Application number
SE7405630A
Other languages
Unknown language ( )
English (en)
Other versions
SE383922B (sv
Inventor
Treforskningsinstitute Svenska
Original Assignee
Svenska Traeforskningsinst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Svenska Traeforskningsinst filed Critical Svenska Traeforskningsinst
Priority to SE7405630A priority Critical patent/SE383922B/sv
Priority to US05/570,914 priority patent/US3997268A/en
Priority to DE19752518518 priority patent/DE2518518A1/de
Publication of SE7405630L publication Critical patent/SE7405630L/sv
Publication of SE383922B publication Critical patent/SE383922B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SE7405630A 1974-04-26 1974-04-26 Anordning for skikttjockleksbestemning alternativt yttopografimetning SE383922B (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE7405630A SE383922B (sv) 1974-04-26 1974-04-26 Anordning for skikttjockleksbestemning alternativt yttopografimetning
US05/570,914 US3997268A (en) 1974-04-26 1975-04-23 Device for determination of layer thickness, or alternatively, measurement of surface topography
DE19752518518 DE2518518A1 (de) 1974-04-26 1975-04-25 Vorrichtung zur bestimmung einer schichtdicke bzw. zur messung einer oberflaechentopographie

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7405630A SE383922B (sv) 1974-04-26 1974-04-26 Anordning for skikttjockleksbestemning alternativt yttopografimetning

Publications (2)

Publication Number Publication Date
SE7405630L true SE7405630L (sv) 1975-10-27
SE383922B SE383922B (sv) 1976-04-05

Family

ID=20320966

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7405630A SE383922B (sv) 1974-04-26 1974-04-26 Anordning for skikttjockleksbestemning alternativt yttopografimetning

Country Status (3)

Country Link
US (1) US3997268A (sv)
DE (1) DE2518518A1 (sv)
SE (1) SE383922B (sv)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2043239A (en) * 1979-01-03 1980-10-01 Univ Manchester Transducer
US4705037A (en) * 1985-02-08 1987-11-10 Peyman Gholam A Topographical mapping, depth measurement, and cutting systems for performing radial keratotomy and the like
US4676936A (en) * 1985-12-23 1987-06-30 The Dow Chemical Company Controlled coextrusion of barrier sheet
US5003823A (en) * 1989-08-21 1991-04-02 Sundstrand Corporation Noncontact rotating liquid film thickness sensor
DE4113749A1 (de) * 1991-04-26 1992-11-05 Lba Labor Fuer Bioanalytik Und Vorrichtung und verfahren zum bestimmen der dicke einer fettschicht
DE4342212C1 (de) * 1993-12-10 1995-05-24 Daimler Benz Aerospace Ag Optisches Meßgerät
DE10054227A1 (de) * 2000-11-02 2002-08-01 Musa Kazalan Messvorrichtung zur Überwachung der Aussenkontur von Profilen bei der Herstellung
GB0815860D0 (en) * 2008-09-01 2008-10-08 Oxley Dev Co Ltd Light emitting device
US7929128B2 (en) * 2008-09-26 2011-04-19 Siemens Aktiengesellschaft Apparatus for the optical inspection of the thermal protection tiles of a space shuttle
CN102661713B (zh) * 2012-05-09 2014-08-13 南京乐金熊猫电器有限公司 涂漆品质检查装置
JP6324113B2 (ja) 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計
JP6324114B2 (ja) * 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1503543A (en) * 1923-08-07 1924-08-05 Pittsburgh Plate Glass Co Glass-thickness gauge
DE1045110B (de) * 1957-08-21 1958-11-27 Dresden Feinmess Geraet zur optischen Messung der Wandstaerke, insbesondere von Hohlglaskoerpern
DE1083060B (de) * 1959-04-04 1960-06-09 Dresden Feinmess Geraet zur optischen Messung der Wandstaerken, insbesondere von Hohlglaskoerpern

Also Published As

Publication number Publication date
DE2518518A1 (de) 1975-11-13
SE383922B (sv) 1976-04-05
US3997268A (en) 1976-12-14

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