SE517457C2 - Metod och anordning för bakgrundskalibrering av A/D- omvandlare - Google Patents
Metod och anordning för bakgrundskalibrering av A/D- omvandlareInfo
- Publication number
- SE517457C2 SE517457C2 SE0102079A SE0102079A SE517457C2 SE 517457 C2 SE517457 C2 SE 517457C2 SE 0102079 A SE0102079 A SE 0102079A SE 0102079 A SE0102079 A SE 0102079A SE 517457 C2 SE517457 C2 SE 517457C2
- Authority
- SE
- Sweden
- Prior art keywords
- background calibration
- calibration
- operating condition
- condition parameter
- exceeds
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 27
- 230000008859 change Effects 0.000 claims abstract description 27
- 230000007704 transition Effects 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 16
- 238000006243 chemical reaction Methods 0.000 description 5
- 239000013598 vector Substances 0.000 description 5
- 241000859095 Bero Species 0.000 description 4
- 101100478363 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) BER1 gene Proteins 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 238000005070 sampling Methods 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 230000000977 initiatory effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000013139 quantization Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
- Measurement Of Current Or Voltage (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Priority Applications (10)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE0102079A SE517457C2 (sv) | 2000-08-29 | 2001-06-12 | Metod och anordning för bakgrundskalibrering av A/D- omvandlare |
| JP2002523718A JP4776143B2 (ja) | 2000-08-29 | 2001-08-24 | A/dコンバータの較正 |
| CNB018148689A CN1254018C (zh) | 2000-08-29 | 2001-08-24 | 模-数转换器后台校准装置和方法 |
| AU2001282788A AU2001282788B2 (en) | 2000-08-29 | 2001-08-24 | A/D converter calibration |
| AT01961528T ATE309642T1 (de) | 2000-08-29 | 2001-08-24 | A/d-umsetzerkalibrierung |
| PCT/SE2001/001803 WO2002019531A1 (en) | 2000-08-29 | 2001-08-24 | A/d converter calibration |
| DE60114854T DE60114854T2 (de) | 2000-08-29 | 2001-08-24 | A/d-umsetzerkalibrierung |
| AU8278801A AU8278801A (en) | 2000-08-29 | 2001-08-24 | A/d converter calibration |
| EP01961528A EP1316150B1 (de) | 2000-08-29 | 2001-08-24 | A/d-umsetzerkalibrierung |
| US10/372,138 US6717536B2 (en) | 2000-08-29 | 2003-02-25 | Selective background calibration for A/D converter |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE0003043A SE517536C2 (sv) | 2000-03-14 | 2000-08-29 | Anordning samt metod för bakgrundskalibrering av A/D- omvandlare |
| SE0102079A SE517457C2 (sv) | 2000-08-29 | 2001-06-12 | Metod och anordning för bakgrundskalibrering av A/D- omvandlare |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| SE0102079D0 SE0102079D0 (sv) | 2001-06-12 |
| SE0102079L SE0102079L (sv) | 2002-03-01 |
| SE517457C2 true SE517457C2 (sv) | 2002-06-11 |
Family
ID=26655221
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE0102079A SE517457C2 (sv) | 2000-08-29 | 2001-06-12 | Metod och anordning för bakgrundskalibrering av A/D- omvandlare |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6717536B2 (de) |
| EP (1) | EP1316150B1 (de) |
| JP (1) | JP4776143B2 (de) |
| CN (1) | CN1254018C (de) |
| AT (1) | ATE309642T1 (de) |
| AU (2) | AU8278801A (de) |
| DE (1) | DE60114854T2 (de) |
| SE (1) | SE517457C2 (de) |
| WO (1) | WO2002019531A1 (de) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1629491A2 (de) * | 2003-05-19 | 2006-03-01 | Koninklijke Philips Electronics N.V. | Plattenlaufwerk und verfahren zur zeitlichen steuerung der rekalibrierung in einem plattenlaufwerk |
| US6967603B1 (en) * | 2004-07-19 | 2005-11-22 | Realtek Semiconductor Corp. | ADC background calibration timing |
| US7102417B2 (en) * | 2004-11-05 | 2006-09-05 | International Business Machines Corporation | Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit |
| KR100730896B1 (ko) | 2005-03-17 | 2007-06-21 | (주)에스디시스템 | 공급전압 변동에도 안정적인 에이디씨 입력값의 측정이가능한 에이디씨 측정회로장치 |
| US7460045B1 (en) * | 2006-08-15 | 2008-12-02 | Pmc-Sierra, Inc. | Background calibration technique for pipelined A/D converters using simplified histogram-based testing |
| US8890730B2 (en) * | 2013-03-15 | 2014-11-18 | Xilinx, Inc. | Calibration of a switching instant of a switch |
| DE102013105340A1 (de) * | 2013-05-24 | 2014-11-27 | Vorwerk & Co. Interholding Gmbh | Elektrisch betriebenes Gerät, Verfahren zur Kalibrierung eines Sensors und Computerprogrammprodukt |
| DE102013014876B3 (de) * | 2013-09-06 | 2014-12-11 | Hottinger Baldwin Messtechnik Gmbh | Messverstärker mit Hintergrundjustierung und Verfahren dafür |
| CN106546901A (zh) * | 2016-09-23 | 2017-03-29 | 上海为准电子科技有限公司 | 一种针对射频电路湿度性能的功率校准的方法与装置 |
| DE102018114092B4 (de) * | 2018-06-13 | 2021-04-29 | Infineon Technologies Ag | Verfahren, Vorrichtungen und Systeme zur Überwachung von Datenwandlern welche einen Kalibrierungsdatensatz aufweisen |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3703001A (en) * | 1969-05-22 | 1972-11-14 | Eugene B Hibbs Jr | Analog to digital converter |
| US4133036A (en) * | 1976-02-26 | 1979-01-02 | Republic Steel Corporation | Method and system for monitoring a physical condition of a medium |
| US4399426A (en) * | 1981-05-04 | 1983-08-16 | Tan Khen Sang | On board self-calibration of analog-to-digital and digital-to-analog converters |
| US5101206A (en) * | 1989-12-05 | 1992-03-31 | Hewlett-Packard Company | Integrating analog to digital converter |
| JPH03205921A (ja) * | 1990-01-08 | 1991-09-09 | Hitachi Denshi Ltd | デジタイザ回路 |
| US5450336A (en) * | 1991-03-05 | 1995-09-12 | Aradigm Corporation | Method for correcting the drift offset of a transducer |
| JPH04307818A (ja) * | 1991-04-04 | 1992-10-30 | Mitsubishi Electric Corp | ドリフト補償回路 |
| US6069576A (en) * | 1998-04-02 | 2000-05-30 | The United States Of America As Represented By The Secretary Of The Navy | Synchro-to-digital converter |
| JP3965773B2 (ja) * | 1998-05-06 | 2007-08-29 | 松下電器産業株式会社 | A/d変換装置 |
| US6346907B1 (en) * | 1998-08-07 | 2002-02-12 | Agere Systems Guardian Corp. | Analog-to-digital converter having voltage to-time converter and time digitizer, and method for using same |
| US6184809B1 (en) * | 1998-08-19 | 2001-02-06 | Texas Instruments Incorporated | User transparent self-calibration technique for pipelined ADC architecture |
| EP1024348B1 (de) * | 1999-01-28 | 2011-07-27 | Denso Corporation | Verfahren zur Unterdrückung von niederfrequentem Rauschen und zugehörige CMOS-Schaltung |
| SE517536C2 (sv) | 2000-03-14 | 2002-06-18 | Ericsson Telefon Ab L M | Anordning samt metod för bakgrundskalibrering av A/D- omvandlare |
| SE517675C2 (sv) | 2000-03-14 | 2002-07-02 | Ericsson Telefon Ab L M | Ett förfarande för A/D-omvandling samt ett A/D- omvandlingssystem |
| US6414612B1 (en) * | 2000-09-14 | 2002-07-02 | Scientific-Atlanta, Inc. | Enhanced bandwidth digitizer using multiple analog-to digital converters and self calibration |
-
2001
- 2001-06-12 SE SE0102079A patent/SE517457C2/sv unknown
- 2001-08-24 CN CNB018148689A patent/CN1254018C/zh not_active Expired - Fee Related
- 2001-08-24 AU AU8278801A patent/AU8278801A/xx active Pending
- 2001-08-24 AT AT01961528T patent/ATE309642T1/de not_active IP Right Cessation
- 2001-08-24 JP JP2002523718A patent/JP4776143B2/ja not_active Expired - Fee Related
- 2001-08-24 AU AU2001282788A patent/AU2001282788B2/en not_active Ceased
- 2001-08-24 WO PCT/SE2001/001803 patent/WO2002019531A1/en not_active Ceased
- 2001-08-24 DE DE60114854T patent/DE60114854T2/de not_active Expired - Lifetime
- 2001-08-24 EP EP01961528A patent/EP1316150B1/de not_active Expired - Lifetime
-
2003
- 2003-02-25 US US10/372,138 patent/US6717536B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| WO2002019531A1 (en) | 2002-03-07 |
| US6717536B2 (en) | 2004-04-06 |
| CN1449598A (zh) | 2003-10-15 |
| EP1316150B1 (de) | 2005-11-09 |
| EP1316150A1 (de) | 2003-06-04 |
| JP2004507965A (ja) | 2004-03-11 |
| DE60114854D1 (de) | 2005-12-15 |
| SE0102079L (sv) | 2002-03-01 |
| SE0102079D0 (sv) | 2001-06-12 |
| ATE309642T1 (de) | 2005-11-15 |
| DE60114854T2 (de) | 2006-06-01 |
| CN1254018C (zh) | 2006-04-26 |
| AU8278801A (en) | 2002-03-13 |
| JP4776143B2 (ja) | 2011-09-21 |
| AU2001282788B2 (en) | 2006-11-02 |
| US20030146863A1 (en) | 2003-08-07 |
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