SE457216B - Foerfarande och anordning foer maetning av maengden silikonbelaeggning vid papper eller kartong, som roer sig som en kontinuerlig aemnesbana - Google Patents

Foerfarande och anordning foer maetning av maengden silikonbelaeggning vid papper eller kartong, som roer sig som en kontinuerlig aemnesbana

Info

Publication number
SE457216B
SE457216B SE8403403A SE8403403A SE457216B SE 457216 B SE457216 B SE 457216B SE 8403403 A SE8403403 A SE 8403403A SE 8403403 A SE8403403 A SE 8403403A SE 457216 B SE457216 B SE 457216B
Authority
SE
Sweden
Prior art keywords
radiation
radiation source
detector
primary radiation
primary
Prior art date
Application number
SE8403403A
Other languages
English (en)
Swedish (sv)
Other versions
SE8403403L (sv
SE8403403D0 (sv
Inventor
P Puumalainen
Original Assignee
Enso Gutzeit Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Enso Gutzeit Oy filed Critical Enso Gutzeit Oy
Publication of SE8403403D0 publication Critical patent/SE8403403D0/xx
Publication of SE8403403L publication Critical patent/SE8403403L/
Publication of SE457216B publication Critical patent/SE457216B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
SE8403403A 1983-06-28 1984-06-27 Foerfarande och anordning foer maetning av maengden silikonbelaeggning vid papper eller kartong, som roer sig som en kontinuerlig aemnesbana SE457216B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI832344A FI68322C (fi) 1983-06-28 1983-06-28 Foerfarande och anordning foer maetning av maengden av siliciumbelaeggning vid papper eller kartong

Publications (3)

Publication Number Publication Date
SE8403403D0 SE8403403D0 (sv) 1984-06-27
SE8403403L SE8403403L (sv) 1984-12-29
SE457216B true SE457216B (sv) 1988-12-05

Family

ID=8517420

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8403403A SE457216B (sv) 1983-06-28 1984-06-27 Foerfarande och anordning foer maetning av maengden silikonbelaeggning vid papper eller kartong, som roer sig som en kontinuerlig aemnesbana

Country Status (7)

Country Link
US (1) US4639942A (fi)
JP (1) JPS6057205A (fi)
DE (1) DE3423708A1 (fi)
FI (1) FI68322C (fi)
FR (1) FR2548371B1 (fi)
GB (1) GB2144217B (fi)
SE (1) SE457216B (fi)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3638932A1 (de) * 1986-11-14 1988-05-26 Kaemmerer Gmbh Verfahren zur messung von beschichtungsmengen, insbesondere von silikon-beschichtungen auf papier oder kunststoffolie
US5145750A (en) * 1990-10-24 1992-09-08 Bridgestone Corporation Rubber product identification by tagging
FI109215B (fi) 1996-10-28 2002-06-14 Metso Paper Inc Menetelmä ja sovitelma liikkuvan paperi- tai kartonkiradan päällystämiseksi
DE19820861B4 (de) * 1998-05-09 2004-09-16 Bruker Axs Gmbh Simultanes Röntgenfluoreszenz-Spektrometer
FI110638B (fi) 1998-10-06 2003-02-28 Metso Paper Automation Oy Menetelmä ja laite liikkuvalla alustalla olevan silikonipäällysteen määrän mittaamiseksi
US6179918B1 (en) * 1998-11-20 2001-01-30 Honeywell International Inc. Silicone coat weight measuring and control apparatus
CN102128847B (zh) * 2010-01-15 2012-11-14 江苏天瑞仪器股份有限公司 用于x射线荧光光谱仪的光谱信号获取装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3102952A (en) * 1954-05-27 1963-09-03 Philips Corp X-ray fluorescence analysis of multi-component systems
US2925497A (en) * 1956-08-09 1960-02-16 Philips Corp Fluorescence analysis
US3351755A (en) * 1964-09-25 1967-11-07 Applied Res Lab Inc Method of and apparatus for spectroscopic analysis having compensating means for uncontrollable variables
FI40587B (fi) * 1967-04-01 1968-11-30 Valmet Oy
FI40753B (fi) * 1968-04-03 1969-01-31 Valmet Oy
US3925660A (en) * 1972-05-08 1975-12-09 Richard D Albert Selectable wavelength X-ray source, spectrometer and assay method
US3889113A (en) * 1973-05-03 1975-06-10 Columbia Scient Ind Inc Radioisotope-excited, energy-dispersive x-ray fluorescence apparatus
US4147931A (en) * 1976-12-13 1979-04-03 Pertti Puumalainen Procedure for measuring unit area weights
FI59489C (fi) * 1978-11-21 1981-08-10 Enso Gutzeit Oy Foerfarande foer maetning av belaeggningsmaengder
JPS5594149A (en) * 1979-01-12 1980-07-17 Yokogawa Hokushin Electric Corp Reflecting type ash content meter
SU958932A1 (ru) * 1981-02-12 1982-09-15 Научно-исследовательский институт ядерной физики при Томском политехническом институте им.С.М.Кирова Устройство дл рентгеноспектрального флуоресцентного анализа

Also Published As

Publication number Publication date
US4639942A (en) 1987-01-27
FI68322C (fi) 1985-08-12
FI832344A0 (fi) 1983-06-28
FI832344L (fi) 1984-12-29
FR2548371B1 (fr) 1988-02-12
SE8403403L (sv) 1984-12-29
JPS6057205A (ja) 1985-04-03
GB2144217B (en) 1986-07-30
FI68322B (fi) 1985-04-30
FR2548371A1 (fr) 1985-01-04
GB8416463D0 (en) 1984-08-01
GB2144217A (en) 1985-02-27
SE8403403D0 (sv) 1984-06-27
DE3423708A1 (de) 1985-01-10

Similar Documents

Publication Publication Date Title
US6885727B2 (en) Apparatus and method for measuring thickness and composition of multi-layered sample
US6532276B1 (en) Method and apparatus for determining a material of a detected item
US5390229A (en) Lead-paint detector
CN104115005B (zh) 用于确定材料中元素含量的方法
US2642537A (en) Apparatus for determining coating thickness
JP2849665B2 (ja) 基板上の皮膜の厚さと組成を計測するための方法
SE457216B (sv) Foerfarande och anordning foer maetning av maengden silikonbelaeggning vid papper eller kartong, som roer sig som en kontinuerlig aemnesbana
SE444084B (sv) Sett att meta materialmengden i ett forsta och ett andra beleggningsskikt
SE431802B (sv) Anordning for bestemning av den spatiella absorptionsfordelningen i ett foremal
US3270204A (en) Determination of the ash content of coal by means of x-rays
US3417243A (en) Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
US3505520A (en) Measuring the incombustible content of mine dust using backscatter of low energy gamma rays
WO2010141709A1 (en) X-ray system and methods with detector interior to focusing element
US3755674A (en) Method of detecting pinhole defects in sheet material
SE433264B (sv) Forfarande for metning av ytvikterna i en emneskombination, som bestar av ett bottenskikt, ett mellanskikt samt atminstone ett ytskikt jemte anvendning av detta forfarande
US5612988A (en) Device for measuring the momentum transfer spectrum of X-ray quanta elastically scattered in an examination zone
DE7240626U (de) Optische drehmessvorrichtung
US2846589A (en) Apparatus for determining the thickness of zinc coating on a ferrous metal base
US20110182404A1 (en) Collimator with an adjustable focal length
US5025154A (en) Procedure and means for measuring paper formation
SU1191796A1 (ru) Малоугловой рентгеновский дифрактометр
Lundahl X-ray thickness gauge for cold rolled strip steel
SU693487A1 (ru) Счетчик гейгера-мюллера с экраном
SU754274A1 (ru) Способ рентгеноспёктрального флуоресцентного анализа вещества в легком наполнителе 1
FI75053B (fi) Roentgendiffraktionsfoerfarande och -anordning foer maetning av spaenningar.

Legal Events

Date Code Title Description
NUG Patent has lapsed

Ref document number: 8403403-2

Effective date: 19910131

Format of ref document f/p: F