SE456532B - Arrangemang for ytavsokning av ett provobjekt - Google Patents

Arrangemang for ytavsokning av ett provobjekt

Info

Publication number
SE456532B
SE456532B SE8504912A SE8504912A SE456532B SE 456532 B SE456532 B SE 456532B SE 8504912 A SE8504912 A SE 8504912A SE 8504912 A SE8504912 A SE 8504912A SE 456532 B SE456532 B SE 456532B
Authority
SE
Sweden
Prior art keywords
sensor
arrangement
signal
edge
movement
Prior art date
Application number
SE8504912A
Other languages
English (en)
Swedish (sv)
Other versions
SE8504912D0 (sv
SE8504912L (sv
Inventor
L Svegander
B Tornblom
Original Assignee
Asea Ab
Tornbloms Kvalitetskontroll Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asea Ab, Tornbloms Kvalitetskontroll Ab filed Critical Asea Ab
Priority to SE8504912A priority Critical patent/SE456532B/sv
Publication of SE8504912D0 publication Critical patent/SE8504912D0/xx
Priority to DE198686850332T priority patent/DE219477T1/de
Priority to EP86850332A priority patent/EP0219477A1/de
Priority to US06/917,067 priority patent/US4761610A/en
Priority to JP61246457A priority patent/JPS6295459A/ja
Publication of SE8504912L publication Critical patent/SE8504912L/
Publication of SE456532B publication Critical patent/SE456532B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
SE8504912A 1985-10-18 1985-10-18 Arrangemang for ytavsokning av ett provobjekt SE456532B (sv)

Priority Applications (5)

Application Number Priority Date Filing Date Title
SE8504912A SE456532B (sv) 1985-10-18 1985-10-18 Arrangemang for ytavsokning av ett provobjekt
DE198686850332T DE219477T1 (de) 1985-10-18 1986-10-03 Vorrichtung zum abtasten der oberflaeche eines pruefteiles.
EP86850332A EP0219477A1 (de) 1985-10-18 1986-10-03 Vorrichtung zum Abtasten der Oberfläche eines Prüfteiles
US06/917,067 US4761610A (en) 1985-10-18 1986-10-08 Apparatus for determining the position of surface defects of a test objects with respect to an edge thereof
JP61246457A JPS6295459A (ja) 1985-10-18 1986-10-16 試験片表面の調査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8504912A SE456532B (sv) 1985-10-18 1985-10-18 Arrangemang for ytavsokning av ett provobjekt

Publications (3)

Publication Number Publication Date
SE8504912D0 SE8504912D0 (sv) 1985-10-18
SE8504912L SE8504912L (sv) 1987-04-19
SE456532B true SE456532B (sv) 1988-10-10

Family

ID=20361834

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8504912A SE456532B (sv) 1985-10-18 1985-10-18 Arrangemang for ytavsokning av ett provobjekt

Country Status (5)

Country Link
US (1) US4761610A (de)
EP (1) EP0219477A1 (de)
JP (1) JPS6295459A (de)
DE (1) DE219477T1 (de)
SE (1) SE456532B (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE456611B (sv) * 1986-04-18 1988-10-17 Tornbloms Kvalitetskontroll Ab Anordning for signallagring och/eller signalbehandling av fran en givare erhallna signaler
GB2224575B (en) * 1988-11-04 1993-07-14 Technical Software Consultants Electromagnetic microscope
JP2681673B2 (ja) * 1988-11-30 1997-11-26 原電子測器株式会社 平面探傷用交流漏洩磁束探傷装置
JP2735126B2 (ja) * 1988-12-27 1998-04-02 キヤノン株式会社 ロボットの制御方法及びその制御装置
US4922201A (en) * 1989-01-09 1990-05-01 The United States Of America As Represented By The Secretary Of The Navy Eddy current method for measuring electrical resistivity and device for providing accurate phase detection
US4924182A (en) * 1989-01-09 1990-05-08 The United States Of America As Represented By The Secretary Of The Navy Eddy current method to measure distance between scanned surface and a subsurface defect
USH879H (en) * 1989-06-30 1991-01-01 The United States Of America As Represented By The Secretary Of The Navy Method and device for inspecting circumferentially conducting materials
US5130651A (en) * 1990-09-10 1992-07-14 United Technologies Corporation Method and apparatus for providing compensation for variations in probe-surface separation in non-contact eddy current inspection systems
GB9100589D0 (en) * 1991-01-11 1991-02-27 Technical Software Consultants A.c.field measurement testing system
EP0518635B1 (de) * 1991-06-11 2003-05-21 Newt Holdings Limited Sonde
DE19642981C2 (de) * 1996-10-18 1998-11-12 Mtu Muenchen Gmbh Verfahren und Vorrichtung zum Abtasten einer Bauteiloberfläche mittels einer Wirbelstromsonde
GB0112983D0 (en) * 2001-05-30 2001-07-18 Advanced Eng Solutions Ltd Pipe condition detecting apparatus
US7026811B2 (en) * 2004-03-19 2006-04-11 General Electric Company Methods and apparatus for eddy current inspection of metallic posts
US7518359B2 (en) * 2005-03-09 2009-04-14 General Electric Company Inspection of non-planar parts using multifrequency eddy current with phase analysis
US10861146B2 (en) 2005-04-15 2020-12-08 Custom Industrial Automation Inc. Delayed petroleum coking vessel inspection device and method
US9524542B1 (en) 2005-04-15 2016-12-20 Custom Industrial Automation Inc. Delayed petroleum coking vessel inspection device and method
US7940298B2 (en) * 2005-04-15 2011-05-10 Custom Industrial Automation, Inc. Delayed petroleum coking vessel inspection device and method
US20080278151A1 (en) * 2007-05-07 2008-11-13 General Electric Company System and methods for inspecting internal cracks
GB201110678D0 (en) 2011-06-23 2011-08-10 Sarclad Ltd A method of detecting defects in a metallic surface
US11525805B2 (en) * 2020-06-03 2022-12-13 Olympus NDT Canada Inc. Non-contact speed encoder

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3268805A (en) * 1962-11-16 1966-08-23 Air Reduction Seam tracking and flaw detection
US3311819A (en) * 1963-06-03 1967-03-28 Mckay Machine Co Automatic billet scanning apparatus with edge sensing means for reversing scan
US3311820A (en) * 1963-06-07 1967-03-28 Mckay Machine Co Actuating circuit for automatically reversing a reciprocal scanner
NO136430C (no) * 1971-11-30 1977-08-31 Ferranti Ltd Kretsanordning for bruk sammen med en feildetektor for en bevegelig flate
GB1366369A (en) * 1971-11-30 1974-09-11 Ferranti Ltd Detection of faults on surfaces
US3916301A (en) * 1974-05-20 1975-10-28 Republic Steel Corp Magnetic flaw detection apparatus
DE2431173A1 (de) * 1974-06-28 1976-01-15 Graenges Staal Oxeloesund Verfahren und vorrichtung zum produzieren von metallischen rohlingen, insbesondere stahlbrammen, die zumindest in einem vorbestimmten oberflaechenbereich im wesentlichen keine fehler aufweisen
US3939404A (en) * 1974-07-10 1976-02-17 Dominion Foundries And Steel, Limited Method of testing for and preventing the possibility of cracking, spalling or like defects in rolling mill rolls by determining the rate of change in hardness
DE2611539C3 (de) * 1976-03-18 1982-09-09 Agfa-Gevaert Ag, 5090 Leverkusen Verfahren zum Erkennen und Orten von sich in Längsrichtung einer laufenden Materialbahn erstreckenden Fehlern
US4476434A (en) * 1982-01-25 1984-10-09 The United States Of America As Represented By The United States Department Of Energy Non-destructive testing method and apparatus utilizing phase multiplication holography
DE3230368A1 (de) * 1982-08-14 1984-02-16 Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co KG, 7410 Reutlingen Verfahren und vorrichtung zum abtasten der oberflaeche eines teiles
FR2541773B1 (fr) * 1983-02-24 1985-06-14 Aerospatiale Dispositif portable pour l'examen non destructif d'une surface le long d'une ligne
US4644274A (en) * 1983-04-01 1987-02-17 General Electric Company Apparatus for supporting an eddy current probe used to scan an irregular surface
JPH0750405B2 (ja) * 1984-09-27 1995-05-31 三菱電機株式会社 産業用ロボツト装置

Also Published As

Publication number Publication date
SE8504912D0 (sv) 1985-10-18
SE8504912L (sv) 1987-04-19
DE219477T1 (de) 1988-01-14
EP0219477A1 (de) 1987-04-22
US4761610A (en) 1988-08-02
JPS6295459A (ja) 1987-05-01

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