RU2618764C2 - Устройство, система и способ обнаружения предмета - Google Patents
Устройство, система и способ обнаружения предмета Download PDFInfo
- Publication number
- RU2618764C2 RU2618764C2 RU2014128890A RU2014128890A RU2618764C2 RU 2618764 C2 RU2618764 C2 RU 2618764C2 RU 2014128890 A RU2014128890 A RU 2014128890A RU 2014128890 A RU2014128890 A RU 2014128890A RU 2618764 C2 RU2618764 C2 RU 2618764C2
- Authority
- RU
- Russia
- Prior art keywords
- light
- mirror
- scanning element
- plane
- light source
- Prior art date
Links
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
- G02B26/105—Scanning systems with one or more pivoting mirrors or galvano-mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/845—Objects on a conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/105—Purely optical scan
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Mechanical Optical Scanning Systems (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO20120074 | 2012-01-24 | ||
NO20120074A NO336441B1 (no) | 2012-01-24 | 2012-01-24 | Anordning, system og fremgangsmåte for optisk detektering av materie |
PCT/NO2013/000001 WO2013115650A1 (en) | 2012-01-24 | 2013-01-24 | Apparatus, system and method for detecting matter |
Publications (2)
Publication Number | Publication Date |
---|---|
RU2014128890A RU2014128890A (ru) | 2016-03-20 |
RU2618764C2 true RU2618764C2 (ru) | 2017-05-11 |
Family
ID=47750784
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
RU2014128890A RU2618764C2 (ru) | 2012-01-24 | 2013-01-24 | Устройство, система и способ обнаружения предмета |
Country Status (9)
Country | Link |
---|---|
US (1) | US9557265B2 ( ) |
EP (1) | EP2807469B1 ( ) |
JP (1) | JP6209536B2 ( ) |
CN (1) | CN104067109B ( ) |
BR (1) | BR112014017631B1 ( ) |
NO (1) | NO336441B1 ( ) |
PL (1) | PL2807469T3 ( ) |
RU (1) | RU2618764C2 ( ) |
WO (1) | WO2013115650A1 ( ) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2664261C2 (ru) | 2013-11-01 | 2018-08-15 | Томра Сортинг Нв | Способ и устройство для детектирования вещества |
MX360408B (es) * | 2013-11-04 | 2018-10-29 | Tomra Sorting Nv | Aparato de inspeccion. |
JP2015230229A (ja) * | 2014-06-04 | 2015-12-21 | 株式会社リコー | 非接触レーザスキャニング分光画像取得装置及び分光画像取得方法 |
EP3196634A1 (en) | 2016-01-22 | 2017-07-26 | Buhler Sortex Ltd. | Inspection apparatus |
FR3048369B1 (fr) | 2016-03-01 | 2018-03-02 | Pellenc Selective Technologies | Machine et procede d'inspection d'objets defilant en flux |
EP3242124A1 (en) | 2016-05-03 | 2017-11-08 | TOMRA Sorting NV | Detection of foreign matter in animal products |
FR3112295B1 (fr) | 2020-07-10 | 2022-07-29 | Pellenc Selective Tech | Dispositif d'inspection d'objets en flux défilant et machine comprenant un tel dispositif |
KR20240117607A (ko) | 2021-12-07 | 2024-08-01 | 톰라 소팅 게엠베하 | 물질 조명 장치(apparatus for illuminating matter) |
DE102022134456A1 (de) | 2022-12-22 | 2024-06-27 | Carl Zeiss Spectroscopy Gmbh | Spektrometer zur spektralen Analyse einer Probe |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5331396A (en) * | 1991-10-08 | 1994-07-19 | Matsushita Electric Industrial Co., Ltd. | Foreign matter detection device |
US5363187A (en) * | 1990-09-12 | 1994-11-08 | Nikon Corporation | Light scanning apparatus for detecting foreign particles on surface having circuit pattern |
US6473168B1 (en) * | 1997-03-28 | 2002-10-29 | Marc Ruymen | Method and apparatus for detecting irregularities in a product |
EP1698888A2 (en) * | 2000-03-20 | 2006-09-06 | Titech Visionsort As | Inspection of matter |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE621843A ( ) | 1961-09-05 | |||
US4171744A (en) * | 1977-05-17 | 1979-10-23 | Pitney-Bowes, Inc. | Document classifier |
JPH0621901B2 (ja) * | 1983-08-18 | 1994-03-23 | 富士写真フイルム株式会社 | レーザビームの合波方法 |
US4723659A (en) * | 1985-06-28 | 1988-02-09 | Supernova Systems, Inc. | Apparatus for detecting impurities in translucent bodies |
NL8901380A (nl) * | 1989-02-14 | 1990-09-03 | Heuft Qualiplus Bv | Simultane dubbele inspectie. |
JPH0395543A (ja) * | 1989-09-07 | 1991-04-19 | Fuji Photo Film Co Ltd | 放射線画像情報読取装置 |
JPH0862123A (ja) | 1994-08-23 | 1996-03-08 | Olympus Optical Co Ltd | 走査型光学測定装置 |
DE19717488C2 (de) | 1997-04-25 | 2003-05-15 | Baumer Optronic Gmbh | Vorrichtung zur Inspektion der Oberfläche von Objekten |
CA2367815C (en) | 1999-03-19 | 2010-04-27 | Borre Bengt Ulrichsen | Inspection of matter |
EP1105715B1 (de) * | 1999-05-14 | 2016-12-07 | Krieg, Gunther, Prof.Dr.Ing. | Verfahren und vorrichtung zur detektion und unterscheidung zwischen kontaminationen und gutstoffen sowie zwischen verschiedenen farben in feststoffpartikeln |
WO2000074504A1 (fr) * | 1999-06-08 | 2000-12-14 | Japan Tobacco Inc. | Procede et appareil de detection d'une matiere etrangere dans une matiere premiere |
US6864970B1 (en) * | 2000-10-11 | 2005-03-08 | Best N.V. | Apparatus and method for scanning products with a light beam to detect and remove impurities or irregularities in a conveyed stream of the products |
JP3974565B2 (ja) | 2002-09-16 | 2007-09-12 | 三星電子株式会社 | 電子写真方式画像形成装置の光走査ユニットおよび電子写真方式画像形成装置 |
JP4014571B2 (ja) | 2004-02-25 | 2007-11-28 | アンリツ株式会社 | 印刷はんだ検査装置 |
EP1975603A1 (en) * | 2007-03-27 | 2008-10-01 | Visys NV | Method and system for use in inspecting and/or removing unsuitable objects from a stream of products and a sorting apparatus implementing the same |
CN101690244A (zh) | 2007-06-27 | 2010-03-31 | 皇家飞利浦电子股份有限公司 | 激光扫描投影设备 |
JP2009092481A (ja) | 2007-10-05 | 2009-04-30 | Olympus Corp | 外観検査用照明装置及び外観検査装置 |
BE1017898A3 (nl) | 2007-12-14 | 2009-10-06 | Technology & Design B V B A | Sorteerapparaat en werkwijze voor het sorteren van producten. |
US8279418B2 (en) | 2010-03-17 | 2012-10-02 | Microsoft Corporation | Raster scanning for depth detection |
-
2012
- 2012-01-24 NO NO20120074A patent/NO336441B1/no unknown
-
2013
- 2013-01-24 BR BR112014017631-0A patent/BR112014017631B1/pt active IP Right Grant
- 2013-01-24 JP JP2014553271A patent/JP6209536B2/ja active Active
- 2013-01-24 US US14/373,928 patent/US9557265B2/en active Active
- 2013-01-24 RU RU2014128890A patent/RU2618764C2/ru active
- 2013-01-24 EP EP13706315.2A patent/EP2807469B1/en active Active
- 2013-01-24 PL PL13706315.2T patent/PL2807469T3/pl unknown
- 2013-01-24 CN CN201380006071.6A patent/CN104067109B/zh active Active
- 2013-01-24 WO PCT/NO2013/000001 patent/WO2013115650A1/en active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5363187A (en) * | 1990-09-12 | 1994-11-08 | Nikon Corporation | Light scanning apparatus for detecting foreign particles on surface having circuit pattern |
US5331396A (en) * | 1991-10-08 | 1994-07-19 | Matsushita Electric Industrial Co., Ltd. | Foreign matter detection device |
US6473168B1 (en) * | 1997-03-28 | 2002-10-29 | Marc Ruymen | Method and apparatus for detecting irregularities in a product |
EP1698888A2 (en) * | 2000-03-20 | 2006-09-06 | Titech Visionsort As | Inspection of matter |
Also Published As
Publication number | Publication date |
---|---|
BR112014017631A8 (pt) | 2017-07-11 |
RU2014128890A (ru) | 2016-03-20 |
US20140362382A1 (en) | 2014-12-11 |
EP2807469A1 (en) | 2014-12-03 |
NO20120074A1 (no) | 2013-07-25 |
NO336441B1 (no) | 2015-08-17 |
BR112014017631B1 (pt) | 2020-12-08 |
US9557265B2 (en) | 2017-01-31 |
BR112014017631A2 ( ) | 2017-06-20 |
CN104067109A (zh) | 2014-09-24 |
EP2807469B1 (en) | 2024-03-27 |
WO2013115650A1 (en) | 2013-08-08 |
JP6209536B2 (ja) | 2017-10-04 |
JP2015509194A (ja) | 2015-03-26 |
CN104067109B (zh) | 2017-03-22 |
PL2807469T3 (pl) | 2024-07-29 |
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