RU2004138074A - DEVICE AND METHOD FOR SPECTROSCOPIC DETERMINATION OF GAS COMPONENT CONCENTRATION BY MEASURING ONE SINGLE ABSORPTION LINE - Google Patents

DEVICE AND METHOD FOR SPECTROSCOPIC DETERMINATION OF GAS COMPONENT CONCENTRATION BY MEASURING ONE SINGLE ABSORPTION LINE Download PDF

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Publication number
RU2004138074A
RU2004138074A RU2004138074/28A RU2004138074A RU2004138074A RU 2004138074 A RU2004138074 A RU 2004138074A RU 2004138074/28 A RU2004138074/28 A RU 2004138074/28A RU 2004138074 A RU2004138074 A RU 2004138074A RU 2004138074 A RU2004138074 A RU 2004138074A
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RU
Russia
Prior art keywords
process gas
shielding element
laser
laser radiation
radiation
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RU2004138074/28A
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Russian (ru)
Inventor
ДИТРИХ Андреас (DE)
ДИТРИХ Андреас
КАСПЕРСОН Петер (NO)
КАСПЕРСОН Петер
ХАУГХОЛЬТ Карлхенрик (NO)
ХАУГХОЛЬТ Карлхенрик
Original Assignee
Линде Акциенгезельшафт (De)
Линде Акциенгезельшафт
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Publication of RU2004138074A publication Critical patent/RU2004138074A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/151—Gas blown
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3129—Determining multicomponents by multiwavelength light
    • G01N2021/3133—Determining multicomponents by multiwavelength light with selection of wavelengths before the sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/396—Type of laser source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/09—Cuvette constructions adapted to resist hostile environments or corrosive or abrasive materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/023—Controlling conditions in casing
    • G01N2201/0233—Gas purge

Claims (11)

1. Устройство для определения концентрации по меньшей мере одного компонента технологического газа с помощью лазера (2а), излучение которого пересекает заполненное технологическим газом пространство (1), отличающееся тем, что лазерное излучение частично свободно проходит сквозь технологический газ и частично экранировано от технологического газа, при этом измерительный участок (4) для спектроскопического измерения точно одной линии поглощения ограничен только тем отрезком траектории распространения лазерного излучения, на котором оно свободно проходит сквозь технологический газ.1. A device for determining the concentration of at least one component of the process gas using a laser (2a), the radiation of which crosses the space filled with the process gas (1), characterized in that the laser radiation partially passes through the process gas and is partially shielded from the process gas, in this case, the measuring section (4) for spectroscopic measurement of exactly one absorption line is limited only by that segment of the laser radiation propagation path on which it passes freely through the process gas. 2. Устройство по п.1, отличающееся тем, что для экранирования лазерного излучения предусмотрен экранирующий элемент (3), выполненный в виде полого элемента (3).2. The device according to claim 1, characterized in that for shielding the laser radiation, a shielding element (3) is provided, made in the form of a hollow element (3). 3. Устройство по п.1, отличающееся тем, что в зоне экранирующего элемента (3) предусмотрены средства для подачи продувочного газа, предназначенного для вытеснения технологического газа из экранирующего элемента (3), прежде всего из полого элемента (3).3. The device according to claim 1, characterized in that in the area of the shielding element (3) means are provided for supplying a purge gas designed to displace the process gas from the shielding element (3), especially from the hollow element (3). 4. Устройство по п.1, отличающееся тем, что экранирующий элемент (3) выполнен трубчатой формы.4. The device according to claim 1, characterized in that the shielding element (3) is made tubular. 5. Устройство по одному из пп.1-4, отличающееся тем, что экранирующий элемент (3) выполнен в виде водоохлаждаемой трубки.5. The device according to one of claims 1 to 4, characterized in that the shielding element (3) is made in the form of a water-cooled tube. 6. Устройство по п.1, отличающееся тем, что экранирующий элемент (3) изготовлен из жаростойкого и/или кислотостойкого материала.6. The device according to claim 1, characterized in that the shielding element (3) is made of heat-resistant and / or acid-resistant material. 7. Устройство по п.1, отличающееся тем, что экранирующий элемент (3) изготовлен из керамического материала.7. The device according to claim 1, characterized in that the shielding element (3) is made of ceramic material. 8. Устройство по п.1, отличающееся тем, что экранирующий элемент (3) установлен у лазера (2а) в начале траектории распространения лазерного излучения, а также перед приемником (2b) излучения, на который падает лазерное излучение, и тем самым с обеих сторон ограничивает измерительный участок (4).8. The device according to claim 1, characterized in that the shielding element (3) is installed near the laser (2a) at the beginning of the propagation path of the laser radiation, as well as in front of the radiation receiver (2b) onto which the laser radiation is incident, and thereby from both of the sides is limited by the measuring section (4). 9. Способ определения концентрации по меньшей мере одного компонента технологического газа с помощью лазера (2а), излучение которого пересекает заполненное технологическим газом пространство (1), отличающийся тем, что лазерное излучение частично свободно пропускают сквозь технологический газ и частично экранируют от технологического газа, при этом под измерительным участком (4) понимают и используют для спектроскопического определения концентрации компонента технологического газа с помощью лазера (2а), при котором измеряют точно одну линию поглощения, только тот отрезок траектории распространения лазерного излучения, на котором оно свободно проходит сквозь технологический газ.9. A method for determining the concentration of at least one component of the process gas using a laser (2a), the radiation of which crosses the space filled with the process gas (1), characterized in that the laser radiation is partially freely passed through the process gas and partially shielded from the process gas, this, the measuring section (4) is understood and used for spectroscopic determination of the concentration of the process gas component using a laser (2a), in which exactly one absorption, only that part of the trajectory of the propagation of laser radiation, on which it freely passes through the process gas. 10. Способ по п.9, отличающийся тем, что для экранирования лазерного излучения используют экранирующий элемент (3), который продувают продувочным газом.10. The method according to claim 9, characterized in that for shielding the laser radiation using a shielding element (3), which is purged with purge gas. 11. Способ по п.10, отличающийся тем, что в качестве продувочного газа используют азот.11. The method according to claim 10, characterized in that nitrogen is used as the purge gas.
RU2004138074/28A 2002-05-24 2003-05-20 DEVICE AND METHOD FOR SPECTROSCOPIC DETERMINATION OF GAS COMPONENT CONCENTRATION BY MEASURING ONE SINGLE ABSORPTION LINE RU2004138074A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10223239.3 2002-05-24
DE10223239A DE10223239A1 (en) 2002-05-24 2002-05-24 Device and method for spectroscopic measurement of a gas concentration by determining a single absorption line

Publications (1)

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RU2004138074A true RU2004138074A (en) 2005-09-10

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RU2004138074/28A RU2004138074A (en) 2002-05-24 2003-05-20 DEVICE AND METHOD FOR SPECTROSCOPIC DETERMINATION OF GAS COMPONENT CONCENTRATION BY MEASURING ONE SINGLE ABSORPTION LINE

Country Status (9)

Country Link
EP (1) EP1508030A1 (en)
JP (1) JP2005526978A (en)
KR (1) KR20050013552A (en)
AU (1) AU2003238366A1 (en)
BR (1) BR0311244A (en)
DE (1) DE10223239A1 (en)
RU (1) RU2004138074A (en)
WO (1) WO2003100392A1 (en)
ZA (1) ZA200410367B (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5972760B2 (en) * 2012-11-09 2016-08-17 三菱重工業株式会社 Exhaust gas denitration system, exhaust gas denitration device regeneration method, and exhaust gas denitration device catalyst replacement method
JP6000083B2 (en) * 2012-11-16 2016-09-28 三菱重工業株式会社 Exhaust gas denitration system

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* Cited by examiner, † Cited by third party
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DE2340747A1 (en) * 1972-10-26 1974-05-09 Bailey Meter Co GAS ANALYZER
US3838925A (en) * 1972-12-07 1974-10-01 Baldwin Electronics Inc Photoelectric opacity measuring system
US4076425A (en) * 1976-02-17 1978-02-28 Julian Saltz Opacity measuring apparatus
US4225243A (en) * 1978-06-26 1980-09-30 Measurex Corporation Gas measuring apparatus with standardization means, and method therefor
US4247205A (en) * 1979-02-02 1981-01-27 Measurex Corporation Gas measuring apparatus with standardization means, and method therefor
GB2066947B (en) * 1980-01-09 1984-06-20 Measurex Corp Gas measuring apparatus with adjustable path length and method for operation and standardization therefor

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ZA200410367B (en) 2006-06-28
BR0311244A (en) 2005-03-15
AU2003238366A1 (en) 2003-12-12
JP2005526978A (en) 2005-09-08
EP1508030A1 (en) 2005-02-23
DE10223239A1 (en) 2003-12-04
WO2003100392A1 (en) 2003-12-04
KR20050013552A (en) 2005-02-04

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Effective date: 20080225