AU2003238366A1 - Device and method for spectroscopically measuring a gas concentration by determining a single absorption line - Google Patents
Device and method for spectroscopically measuring a gas concentration by determining a single absorption lineInfo
- Publication number
- AU2003238366A1 AU2003238366A1 AU2003238366A AU2003238366A AU2003238366A1 AU 2003238366 A1 AU2003238366 A1 AU 2003238366A1 AU 2003238366 A AU2003238366 A AU 2003238366A AU 2003238366 A AU2003238366 A AU 2003238366A AU 2003238366 A1 AU2003238366 A1 AU 2003238366A1
- Authority
- AU
- Australia
- Prior art keywords
- determining
- gas concentration
- absorption line
- single absorption
- spectroscopically measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000010521 absorption reaction Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
- G01N2021/151—Gas blown
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N2021/3129—Determining multicomponents by multiwavelength light
- G01N2021/3133—Determining multicomponents by multiwavelength light with selection of wavelengths before the sample
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
- G01N2021/396—Type of laser source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/09—Cuvette constructions adapted to resist hostile environments or corrosive or abrasive materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/023—Controlling conditions in casing
- G01N2201/0233—Gas purge
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Measuring Cells (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10223239.3 | 2002-05-24 | ||
DE10223239A DE10223239A1 (en) | 2002-05-24 | 2002-05-24 | Device and method for spectroscopic measurement of a gas concentration by determining a single absorption line |
PCT/EP2003/005296 WO2003100392A1 (en) | 2002-05-24 | 2003-05-20 | Device and method for spectroscopically measuring a gas concentration by determining a single absorption line |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2003238366A1 true AU2003238366A1 (en) | 2003-12-12 |
Family
ID=29414146
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2003238366A Abandoned AU2003238366A1 (en) | 2002-05-24 | 2003-05-20 | Device and method for spectroscopically measuring a gas concentration by determining a single absorption line |
Country Status (9)
Country | Link |
---|---|
EP (1) | EP1508030A1 (en) |
JP (1) | JP2005526978A (en) |
KR (1) | KR20050013552A (en) |
AU (1) | AU2003238366A1 (en) |
BR (1) | BR0311244A (en) |
DE (1) | DE10223239A1 (en) |
RU (1) | RU2004138074A (en) |
WO (1) | WO2003100392A1 (en) |
ZA (1) | ZA200410367B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5972760B2 (en) * | 2012-11-09 | 2016-08-17 | 三菱重工業株式会社 | Exhaust gas denitration system, exhaust gas denitration device regeneration method, and exhaust gas denitration device catalyst replacement method |
JP6000083B2 (en) * | 2012-11-16 | 2016-09-28 | 三菱重工業株式会社 | Exhaust gas denitration system |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2340747A1 (en) * | 1972-10-26 | 1974-05-09 | Bailey Meter Co | GAS ANALYZER |
US3838925A (en) * | 1972-12-07 | 1974-10-01 | Baldwin Electronics Inc | Photoelectric opacity measuring system |
US4076425A (en) * | 1976-02-17 | 1978-02-28 | Julian Saltz | Opacity measuring apparatus |
US4225243A (en) * | 1978-06-26 | 1980-09-30 | Measurex Corporation | Gas measuring apparatus with standardization means, and method therefor |
US4247205A (en) * | 1979-02-02 | 1981-01-27 | Measurex Corporation | Gas measuring apparatus with standardization means, and method therefor |
GB2066947B (en) * | 1980-01-09 | 1984-06-20 | Measurex Corp | Gas measuring apparatus with adjustable path length and method for operation and standardization therefor |
-
2002
- 2002-05-24 DE DE10223239A patent/DE10223239A1/en not_active Withdrawn
-
2003
- 2003-05-20 RU RU2004138074/28A patent/RU2004138074A/en not_active Application Discontinuation
- 2003-05-20 WO PCT/EP2003/005296 patent/WO2003100392A1/en active Application Filing
- 2003-05-20 KR KR10-2004-7018995A patent/KR20050013552A/en not_active Application Discontinuation
- 2003-05-20 BR BR0311244-6A patent/BR0311244A/en not_active IP Right Cessation
- 2003-05-20 JP JP2004507803A patent/JP2005526978A/en active Pending
- 2003-05-20 AU AU2003238366A patent/AU2003238366A1/en not_active Abandoned
- 2003-05-20 EP EP03732429A patent/EP1508030A1/en not_active Withdrawn
-
2004
- 2004-12-23 ZA ZA200410367A patent/ZA200410367B/en unknown
Also Published As
Publication number | Publication date |
---|---|
ZA200410367B (en) | 2006-06-28 |
KR20050013552A (en) | 2005-02-04 |
BR0311244A (en) | 2005-03-15 |
DE10223239A1 (en) | 2003-12-04 |
RU2004138074A (en) | 2005-09-10 |
JP2005526978A (en) | 2005-09-08 |
EP1508030A1 (en) | 2005-02-23 |
WO2003100392A1 (en) | 2003-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |