PT2564154E - Instrumento espectrométrico - Google Patents

Instrumento espectrométrico

Info

Publication number
PT2564154E
PT2564154E PT127176808T PT12717680T PT2564154E PT 2564154 E PT2564154 E PT 2564154E PT 127176808 T PT127176808 T PT 127176808T PT 12717680 T PT12717680 T PT 12717680T PT 2564154 E PT2564154 E PT 2564154E
Authority
PT
Portugal
Prior art keywords
face
incident
beamsplitter
propagation
path
Prior art date
Application number
PT127176808T
Other languages
English (en)
Inventor
Jacob Folkenberg
Hans Larsen
Original Assignee
Foss Analytical As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Foss Analytical As filed Critical Foss Analytical As
Publication of PT2564154E publication Critical patent/PT2564154E/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/45Interferometric spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/45Interferometric spectrometry
    • G01J3/453Interferometric spectrometry by correlation of the amplitudes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/45Interferometric spectrometry
    • G01J3/453Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4535Devices with moving mirror
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02015Interferometers characterised by the beam path configuration

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
PT127176808T 2011-05-02 2012-04-26 Instrumento espectrométrico PT2564154E (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP2011056934 2011-05-02

Publications (1)

Publication Number Publication Date
PT2564154E true PT2564154E (pt) 2013-12-05

Family

ID=46022220

Family Applications (1)

Application Number Title Priority Date Filing Date
PT127176808T PT2564154E (pt) 2011-05-02 2012-04-26 Instrumento espectrométrico

Country Status (16)

Country Link
US (1) US8593637B2 (pt)
JP (1) JP5714773B2 (pt)
KR (1) KR101828100B1 (pt)
CN (1) CN102906535B (pt)
AR (1) AR089921A1 (pt)
AU (1) AU2012241106C1 (pt)
BR (1) BR112012028396B1 (pt)
CA (1) CA2791411C (pt)
DK (1) DK2564154T3 (pt)
ES (1) ES2436363T3 (pt)
MX (1) MX2013000643A (pt)
PT (1) PT2564154E (pt)
RU (1) RU2586393C2 (pt)
UA (1) UA111063C2 (pt)
WO (1) WO2012150172A1 (pt)
ZA (1) ZA201208023B (pt)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8766191B2 (en) * 2009-10-06 2014-07-01 The Curators Of The University Of Missouri External/internal optical adapter for FTIR spectrophotometer
EP3154412B1 (en) * 2014-06-11 2021-09-08 Cellview Imaging Inc. Angular separation of scan channels
BR112017013621B1 (pt) * 2015-02-02 2021-03-09 Foss Analytical A/S sistema de espectrômetro e método para compensar perturbações periódicas de tempo de um interferograma gerado pelo sistema de espectrômetro
JP2017191071A (ja) * 2016-04-15 2017-10-19 キヤノン株式会社 分光データ処理装置、撮像装置、分光データ処理方法および分光データ処理プログラム
CN111551520B (zh) * 2020-05-24 2021-04-27 清华大学 一种级联吸收路径气体浓度复用探测的方法及装置
CN112945385A (zh) * 2021-01-26 2021-06-11 同济大学 一种多反射干涉自动测量系统
CN116297320B (zh) * 2023-05-09 2023-09-08 北京易兴元石化科技有限公司 用于煤质分析的近红外光谱系统及煤质分析方法

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU935716A1 (ru) * 1980-10-10 1982-06-15 Предприятие П/Я Р-6681 Интерференционный спектрометр
US4444501A (en) * 1982-02-12 1984-04-24 The United States Of America As Represented By The Secretary Of Commerce Stabilization mechanism for optical interferometer
JPS63168522A (ja) * 1986-12-30 1988-07-12 Shimadzu Corp 干渉計の調整装置
JPS63269024A (ja) * 1987-04-27 1988-11-07 Fuji Electric Co Ltd 干渉分光分析装置
JPH0346523A (ja) * 1989-07-14 1991-02-27 Sumitomo Electric Ind Ltd フーリェ変換型分光器用信号処理装置
JPH05231939A (ja) * 1992-02-21 1993-09-07 Hitachi Ltd ステップスキャンフーリエ変換赤外分光装置
US5539518A (en) * 1993-09-13 1996-07-23 The United States Of America As Represented By The United States Department Of Energy Method for determining and displaying the spacial distribution of a spectral pattern of received light
JPH07209085A (ja) * 1994-01-19 1995-08-11 Yokogawa Electric Corp フーリエ分光器
JPH07286902A (ja) * 1994-04-18 1995-10-31 Yokogawa Electric Corp フーリエ分光器
JP3314618B2 (ja) * 1996-06-24 2002-08-12 横河電機株式会社 移動鏡駆動回路
JPH11142243A (ja) * 1997-11-13 1999-05-28 Yokogawa Electric Corp 干渉計及びこれを用いたフーリエ変換型分光装置
DE10159721B4 (de) * 2001-12-05 2004-07-22 Bruker Optik Gmbh Digitales FTIR-Spektrometer
US6654125B2 (en) 2002-04-04 2003-11-25 Inlight Solutions, Inc Method and apparatus for optical spectroscopy incorporating a vertical cavity surface emitting laser (VCSEL) as an interferometer reference
US7012695B2 (en) * 2003-07-18 2006-03-14 Chemimage Corporation Method and apparatus for multiwavelength imaging spectrometer
WO2006066581A1 (en) 2004-12-21 2006-06-29 Foss Analytical A/S A method for standardising a spectrometer
JP2007114017A (ja) * 2005-10-19 2007-05-10 Shimadzu Corp 干渉計
EP2151248A1 (en) * 2008-07-30 2010-02-10 Johann Bauer Improved pre-mRNA trans-splicing molecule (RTM) molecules and their uses
US7894072B1 (en) * 2008-11-10 2011-02-22 The United States Of America As Represented By The Secretary Of The Navy Laser-based gas differential spectral analysis
US20120002210A1 (en) 2009-04-28 2012-01-05 Foss Analytical A/S Optical interferometer
US8169616B2 (en) * 2010-02-16 2012-05-01 Agilent Technologies Australia (M) Pty Ltd Interferometer step scanning systems and methods

Also Published As

Publication number Publication date
DK2564154T3 (da) 2013-11-18
AU2012241106C1 (en) 2014-01-16
US20130188192A1 (en) 2013-07-25
ZA201208023B (en) 2014-01-29
US8593637B2 (en) 2013-11-26
KR101828100B1 (ko) 2018-02-09
CN102906535B (zh) 2016-01-20
KR20140022715A (ko) 2014-02-25
CN102906535A (zh) 2013-01-30
UA111063C2 (uk) 2016-03-25
RU2586393C2 (ru) 2016-06-10
ES2436363T3 (es) 2013-12-30
JP2014523517A (ja) 2014-09-11
WO2012150172A1 (en) 2012-11-08
CA2791411A1 (en) 2012-11-02
BR112012028396A2 (pt) 2018-10-16
AR089921A1 (es) 2014-10-01
CA2791411C (en) 2017-03-21
MX2013000643A (es) 2013-03-22
AU2012241106B2 (en) 2013-07-18
JP5714773B2 (ja) 2015-05-07
AU2012241106A1 (en) 2012-11-22
NZ602603A (en) 2014-06-27
RU2012142137A (ru) 2014-10-10
BR112012028396B1 (pt) 2021-02-02

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