PL3627143T3 - Urządzenie do kontroli wyrównania zespołu elektrodowego i wykorzystujący je sposób kontroli wyrównania zespołu elektrodowego - Google Patents

Urządzenie do kontroli wyrównania zespołu elektrodowego i wykorzystujący je sposób kontroli wyrównania zespołu elektrodowego

Info

Publication number
PL3627143T3
PL3627143T3 PL19777062.1T PL19777062T PL3627143T3 PL 3627143 T3 PL3627143 T3 PL 3627143T3 PL 19777062 T PL19777062 T PL 19777062T PL 3627143 T3 PL3627143 T3 PL 3627143T3
Authority
PL
Poland
Prior art keywords
electrode assembly
alignment inspection
same
inspection apparatus
inspection method
Prior art date
Application number
PL19777062.1T
Other languages
English (en)
Inventor
Tai Jin Jung
Cha Hun Ku
Su Taek Jung
Jung Kwan Pyo
Original Assignee
Lg Energy Solution, Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lg Energy Solution, Ltd. filed Critical Lg Energy Solution, Ltd.
Publication of PL3627143T3 publication Critical patent/PL3627143T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01MPROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00Secondary cells; Manufacture thereof
    • H01M10/04Construction or manufacture in general
    • H01M10/0404Machines for assembling batteries
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01MPROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00Secondary cells; Manufacture thereof
    • H01M10/04Construction or manufacture in general
    • H01M10/0413Large-sized flat cells or batteries for motive or stationary systems with plate-like electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01MPROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00Secondary cells; Manufacture thereof
    • H01M10/04Construction or manufacture in general
    • H01M10/0436Small-sized flat cells or batteries for portable equipment
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50Constructional details
    • H04N23/54Mounting of pick-up tubes, electronic image sensors, deviation or focusing coils
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage using batteries
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Secondary Cells (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
PL19777062.1T 2018-03-29 2019-03-22 Urządzenie do kontroli wyrównania zespołu elektrodowego i wykorzystujący je sposób kontroli wyrównania zespołu elektrodowego PL3627143T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020180036851A KR102217201B1 (ko) 2018-03-29 2018-03-29 전극조립체의 얼라인 검사 장치 및 그를 이용한 전극조립체의 얼라인 검사 방법
PCT/KR2019/003406 WO2019190129A1 (ko) 2018-03-29 2019-03-22 전극조립체의 얼라인 검사 장치 및 그를 이용한 전극조립체의 얼라인 검사 방법

Publications (1)

Publication Number Publication Date
PL3627143T3 true PL3627143T3 (pl) 2023-10-02

Family

ID=68060629

Family Applications (1)

Application Number Title Priority Date Filing Date
PL19777062.1T PL3627143T3 (pl) 2018-03-29 2019-03-22 Urządzenie do kontroli wyrównania zespołu elektrodowego i wykorzystujący je sposób kontroli wyrównania zespołu elektrodowego

Country Status (8)

Country Link
US (2) US11307026B2 (pl)
EP (1) EP3627143B1 (pl)
KR (1) KR102217201B1 (pl)
CN (1) CN110832308B (pl)
ES (1) ES2949018T3 (pl)
HU (1) HUE062100T2 (pl)
PL (1) PL3627143T3 (pl)
WO (1) WO2019190129A1 (pl)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102629119B1 (ko) * 2018-05-02 2024-01-26 에스케이온 주식회사 전극판 정렬 상태 검사 시스템 및 방법
DE102020104668A1 (de) * 2020-02-21 2021-08-26 Volkswagen Aktiengesellschaft Inspektionssystem für Batterieelektroden
KR102343421B1 (ko) 2020-04-25 2021-12-27 주식회사 클레버 파우치형 이차 전지용 정렬 장치
WO2021230245A1 (ja) * 2020-05-11 2021-11-18 旭化成株式会社 蓄電デバイス用セパレータの製造方法
CN112018453B (zh) * 2020-09-08 2022-02-01 深圳吉阳智能科技有限公司 复合叠片电芯制作控制方法、复合叠片电芯和锂电池
CN112249795B (zh) * 2020-10-19 2021-10-29 广东利元亨智能装备股份有限公司 贴胶工序实时校正方法、装置、电子设备及可读存储介质
KR102569188B1 (ko) * 2020-12-29 2023-08-21 안보혁 이차전지 검사 장치 및 검사 방법
KR102478650B1 (ko) 2021-02-09 2022-12-19 주식회사 클레버 파우치형 이차전지용 정렬 장치
KR20220114978A (ko) 2021-02-09 2022-08-17 주식회사 클레버 파우치형 이차전지용 흡착 보조장치
KR102413822B1 (ko) 2021-03-02 2022-06-29 주식회사 클레버 파우치형 이차전지용 폴딩면 핫 프레스 장치
KR102375302B1 (ko) 2021-03-09 2022-03-17 주식회사 클레버 파우치형 이차전지용 폴딩면 핫 프레스 시스템
JP7538359B2 (ja) 2022-01-11 2024-08-21 寧徳時代新能源科技股▲分▼有限公司 極性シート捲回隙間の検出方法、その検出装置、その検出システム、電子機器及び不揮発性コンピュータ記憶媒体
EP4407725A1 (en) * 2022-04-12 2024-07-31 Contemporary Amperex Technology Co., Limited Material-strip feeding inspection method and apparatus for stacking machine, and stacking machine, device and medium
KR20240041226A (ko) * 2022-09-22 2024-03-29 주식회사 엘지화학 분리막 열 수축률 평가 장치 및 평가 방법
WO2024155010A1 (ko) * 2023-01-20 2024-07-25 에스케이온 주식회사 전극 검사 시스템 및 방법

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100315117B1 (ko) * 1999-09-30 2001-11-24 김순택 글래스 얼라인먼트 검사 시스템
KR100841662B1 (ko) * 2006-06-23 2008-06-26 주식회사 고영테크놀러지 모아레와 스테레오를 이용한 3차원형상 측정시스템 및 방법
KR101190122B1 (ko) * 2008-10-13 2012-10-11 주식회사 고영테크놀러지 다중파장을 이용한 3차원형상 측정장치 및 측정방법
KR101015808B1 (ko) * 2009-03-27 2011-02-22 한국영상기술(주) 본딩 전극 선폭 측정 장치 및 방법
JP5438368B2 (ja) * 2009-04-28 2014-03-12 Ckd株式会社 積層電池の製造過程に用いられる検査装置
KR101334121B1 (ko) 2009-10-26 2013-11-29 에스케이이노베이션 주식회사 전지의 전극 검사장치 및 방법
JP6022177B2 (ja) * 2011-04-07 2016-11-09 日産自動車株式会社 電極位置検出装置および電極位置検出方法
JP2013161580A (ja) 2012-02-02 2013-08-19 Toyota Motor Corp 電極基材の検査方法
JP5988474B2 (ja) 2012-03-01 2016-09-07 東レエンジニアリング株式会社 積層シート材料の端面を検査する装置
JP5696076B2 (ja) * 2012-03-21 2015-04-08 株式会社東芝 半導体装置の検査装置及び半導体装置の検査方法
KR101609425B1 (ko) * 2013-09-26 2016-04-05 주식회사 엘지화학 매거진을 이용한 전극조립체의 제조방법
JP6237362B2 (ja) * 2014-03-14 2017-11-29 株式会社豊田自動織機 シート状物の積層装置
KR101956348B1 (ko) 2015-01-13 2019-03-08 에리 파워 가부시키가이샤 전극 적층체에 있어서의 전극판의 위치 어긋남 검출 방법 및 그 장치
KR102079233B1 (ko) 2015-11-17 2020-02-19 주식회사 엘지화학 전극 조립체
KR101730469B1 (ko) * 2015-12-21 2017-04-27 주식회사 디에이테크놀로지 이차전지의 고속 셀 스택 제조장치
CN105929460A (zh) * 2016-05-07 2016-09-07 合肥国轩高科动力能源有限公司 一种电极组件对齐检测装置及其检测方法
US10346969B1 (en) * 2018-01-02 2019-07-09 Amazon Technologies, Inc. Detecting surface flaws using computer vision

Also Published As

Publication number Publication date
KR20190114322A (ko) 2019-10-10
CN110832308A (zh) 2020-02-21
KR102217201B1 (ko) 2021-02-18
US20220214164A1 (en) 2022-07-07
ES2949018T3 (es) 2023-09-25
HUE062100T2 (hu) 2023-09-28
EP3627143A1 (en) 2020-03-25
WO2019190129A1 (ko) 2019-10-03
EP3627143B1 (en) 2023-06-14
US11307026B2 (en) 2022-04-19
US11781859B2 (en) 2023-10-10
US20200370882A1 (en) 2020-11-26
CN110832308B (zh) 2023-04-11
EP3627143A4 (en) 2020-10-21

Similar Documents

Publication Publication Date Title
HUE062100T2 (hu) Irányítottság ellenõrzõ berendezés elektróda összeállításhoz és irányítottság ellenõrzõ eljárás elektróda összeállításhoz, ugyanannak a használatával
PL3565052T3 (pl) System i sposób kontroli stanu wyrównania płyty elektrodowej
GB201804719D0 (en) Apparatus and method
SG11202101036PA (en) Testing apparatus and testing method
GB2594412B (en) Radiation inspection apparatus and radiation inspection method
SG11202008944XA (en) Method for visual inspection and apparatus thereof
HUE065776T2 (hu) Egységcella beállító berendezés és elektróda elrendezés elõállítására szolgáló eljárás a berendezés alkalmazásával
HUE057056T2 (hu) Eljárás és berendezés elektródák összeszerelésére
GB201805309D0 (en) Method and apparatus
GB201809631D0 (en) Measurement method and apparatus
GB201807489D0 (en) Apparatus and method
KR102067412B9 (ko) 치매 평가 방법 및 이를 이용한 장치
EP3779419A4 (en) NON-DESTRUCTIVE INSPECTION PROCESS AND APPARATUS
GB201801762D0 (en) Apparatus and method
EP3640629C0 (en) DEVICE AND METHOD FOR FOCUSLESS INSPECTION
EP4038573A4 (en) INSPECTION PROCEDURE AND DEVICE
GB2573030B (en) Connection apparatus and method
GB2574574B (en) Inspection method and associated apparatus
GB2572781B (en) Inspection Method And Associated Apparatus
GB201806008D0 (en) Inspection method and associated apparatus
GB201811199D0 (en) Improved weld inspection system and method
GB201809440D0 (en) An apparatus and method
GB201807043D0 (en) Apparatus and method
GB201912253D0 (en) Inspection apparatus and method
GB2577237B (en) Skinprint analysis method and apparatus