PL1740975T3 - Obrazowanie wysokiej rozdzielczości - Google Patents
Obrazowanie wysokiej rozdzielczościInfo
- Publication number
- PL1740975T3 PL1740975T3 PL05735755T PL05735755T PL1740975T3 PL 1740975 T3 PL1740975 T3 PL 1740975T3 PL 05735755 T PL05735755 T PL 05735755T PL 05735755 T PL05735755 T PL 05735755T PL 1740975 T3 PL1740975 T3 PL 1740975T3
- Authority
- PL
- Poland
- Prior art keywords
- high resolution
- resolution imaging
- imaging
- resolution
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
- G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Studio Devices (AREA)
- Image Processing (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB0409572.5A GB0409572D0 (en) | 2004-04-29 | 2004-04-29 | High resolution imaging |
EP05735755.0A EP1740975B1 (en) | 2004-04-29 | 2005-04-15 | High resolution imaging |
PCT/GB2005/001464 WO2005106531A1 (en) | 2004-04-29 | 2005-04-15 | High resolution imaging |
Publications (1)
Publication Number | Publication Date |
---|---|
PL1740975T3 true PL1740975T3 (pl) | 2015-10-30 |
Family
ID=32408245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL05735755T PL1740975T3 (pl) | 2004-04-29 | 2005-04-15 | Obrazowanie wysokiej rozdzielczości |
Country Status (16)
Country | Link |
---|---|
US (1) | US7792246B2 (pl) |
EP (1) | EP1740975B1 (pl) |
JP (1) | JP4926944B2 (pl) |
KR (2) | KR101265755B1 (pl) |
CN (1) | CN1985188B (pl) |
AU (1) | AU2005238692B2 (pl) |
BR (1) | BRPI0510457A (pl) |
CA (1) | CA2564597C (pl) |
DK (1) | DK1740975T3 (pl) |
EA (1) | EA011004B1 (pl) |
ES (1) | ES2540928T3 (pl) |
GB (1) | GB0409572D0 (pl) |
PL (1) | PL1740975T3 (pl) |
PT (1) | PT1740975E (pl) |
SI (1) | SI1740975T1 (pl) |
WO (1) | WO2005106531A1 (pl) |
Families Citing this family (51)
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US7456780B1 (en) * | 2006-07-26 | 2008-11-25 | Science Applications International Corporation | Method and system for developing and using an image reconstruction algorithm for detecting and imaging moving targets |
JP4789260B2 (ja) * | 2006-08-23 | 2011-10-12 | エスアイアイ・ナノテクノロジー株式会社 | 荷電粒子ビーム装置及びアパーチャの軸調整方法 |
GB0709796D0 (en) | 2007-05-22 | 2007-06-27 | Phase Focus Ltd | Three dimensional imaging |
JP4997334B2 (ja) * | 2007-11-02 | 2012-08-08 | ウェイヴフロント アナリシス インコーポレイテッド | 超解像を達成するための新規なデジタル方法を有する光学顕微鏡 |
GB0724448D0 (en) * | 2007-12-17 | 2008-01-30 | Phase Focus Ltd | Method and apparatus for providing image data |
US8218061B2 (en) * | 2008-09-04 | 2012-07-10 | Csr Technology Inc. | Apparatus, method, and manufacture for iterative auto-focus using depth-from-defocus |
GB0817650D0 (en) * | 2008-09-26 | 2008-11-05 | Phase Focus Ltd | Improvements in the field of imaging |
GB0822149D0 (en) | 2008-12-04 | 2009-01-14 | Univ Sheffield | Provision of image data |
GB0906449D0 (en) | 2009-04-15 | 2009-05-20 | Phase Focus Ltd | Improvements in imaging |
WO2011053631A1 (en) | 2009-10-28 | 2011-05-05 | Alentic Microscience Inc. | Microscopy imaging |
US9075225B2 (en) | 2009-10-28 | 2015-07-07 | Alentic Microscience Inc. | Microscopy imaging |
US20140152801A1 (en) | 2009-10-28 | 2014-06-05 | Alentic Microscience Inc. | Detecting and Using Light Representative of a Sample |
US8542313B2 (en) * | 2010-01-27 | 2013-09-24 | Csr Technology Inc. | Depth from defocus calibration |
GB201006593D0 (en) | 2010-04-20 | 2010-06-02 | Phase Focus Ltd | Characteristic determination |
US8264400B2 (en) | 2010-06-03 | 2012-09-11 | Raytheon Company | Signature matching method and apparatus |
GB2481589B (en) | 2010-06-28 | 2014-06-11 | Phase Focus Ltd | Calibration of a probe in ptychography |
US8644697B1 (en) | 2010-08-13 | 2014-02-04 | Csr Technology Inc. | Method for progressively determining depth from defocused images |
GB201016088D0 (en) | 2010-09-24 | 2010-11-10 | Phase Focus Ltd | Improvements in imaging |
GB201020516D0 (en) | 2010-12-03 | 2011-01-19 | Univ Sheffield | Improvements in providing image data |
KR20140039151A (ko) * | 2011-01-06 | 2014-04-01 | 더 리전트 오브 더 유니버시티 오브 캘리포니아 | 무렌즈 단층 촬영 이미징 장치들 및 방법들 |
GB201107053D0 (en) | 2011-04-27 | 2011-06-08 | Univ Sheffield | Improvements in providing image data |
GB201112119D0 (en) | 2011-07-14 | 2011-08-31 | Univ Sheffield | Method and apparatus for position determination |
US9501834B2 (en) | 2011-08-18 | 2016-11-22 | Qualcomm Technologies, Inc. | Image capture for later refocusing or focus-manipulation |
TWI457598B (zh) * | 2012-01-20 | 2014-10-21 | Academia Sinica | 光學模組及顯微鏡 |
GB201201140D0 (en) | 2012-01-24 | 2012-03-07 | Phase Focus Ltd | Method and apparatus for determining object characteristics |
GB201207800D0 (en) | 2012-05-03 | 2012-06-13 | Phase Focus Ltd | Improvements in providing image data |
EP2690648B1 (en) * | 2012-07-26 | 2014-10-15 | Fei Company | Method of preparing and imaging a lamella in a particle-optical apparatus |
GB201215558D0 (en) * | 2012-08-31 | 2012-10-17 | Phase Focus Ltd | Improvements in phase retrieval |
US8896747B2 (en) | 2012-11-13 | 2014-11-25 | Qualcomm Technologies, Inc. | Depth estimation based on interpolation of inverse focus statistics |
US10502666B2 (en) | 2013-02-06 | 2019-12-10 | Alentic Microscience Inc. | Sample processing improvements for quantitative microscopy |
US10237528B2 (en) | 2013-03-14 | 2019-03-19 | Qualcomm Incorporated | System and method for real time 2D to 3D conversion of a video in a digital camera |
EP3014330B1 (en) | 2013-06-26 | 2024-01-03 | Alentic Microscience Inc. | Sample processing improvements for microscopy |
EP2887381B1 (en) * | 2013-12-18 | 2016-09-21 | Fei Company | Method of investigating the wavefront of a charged-particle beam |
KR101522474B1 (ko) * | 2013-12-20 | 2015-05-21 | 한국항공우주연구원 | 영상 해상도 개선 방법 및 영상 해상도 개선 장치 |
KR20150076306A (ko) * | 2013-12-26 | 2015-07-07 | 한국원자력의학원 | 최적의 양전자 단층촬영을 위해 최적 에너지 윈도우를 결정하는 장치 및 방법 |
GB201414063D0 (en) * | 2014-08-08 | 2014-09-24 | Univ Sheffield | Methods and apparatus for determining image data |
CN104155320B (zh) * | 2014-08-22 | 2018-08-10 | 南京大学 | 一种时间分辨重叠关联成像术 |
CN104132952B (zh) * | 2014-08-22 | 2017-05-17 | 南京大学 | 时间分辨重叠关联成像术 |
KR101960403B1 (ko) | 2014-08-28 | 2019-03-20 | 에이에스엠엘 네델란즈 비.브이. | 검사 장치, 검사 방법 및 제조 방법 |
GB201507454D0 (en) | 2015-04-30 | 2015-06-17 | Phase Focus Ltd | Method and apparatus for determining temporal behaviour of an object |
EP3106862B1 (en) * | 2015-06-18 | 2019-01-16 | FEI Company | Method of ptychographic imaging |
WO2017025373A1 (en) | 2015-08-12 | 2017-02-16 | Asml Netherlands B.V. | Inspection apparatus, inspection method and manufacturing method |
WO2017157645A1 (en) | 2016-03-15 | 2017-09-21 | Stichting Vu | Inspection method, inspection apparatus and illumination method and apparatus |
EP3270404A1 (en) * | 2016-07-13 | 2018-01-17 | FEI Company | Method of imaging a specimen using ptychography |
GB201612855D0 (en) | 2016-07-25 | 2016-09-07 | Phase Focus Ltd | Method and apparatus for seed point determination |
US10631815B2 (en) * | 2017-05-10 | 2020-04-28 | General Electric Company | Scatter correction technique for use with a radiation detector |
CN111065333B (zh) | 2017-07-31 | 2024-04-16 | 劳伦斯·利弗莫尔国家安全有限责任公司 | 会聚x射线成像装置和方法 |
GB2579634B (en) | 2018-12-07 | 2023-01-11 | Phase Focus Ltd | Method and apparatus for determining temporal behaviour of an object |
KR102247277B1 (ko) * | 2020-08-25 | 2021-05-03 | 주식회사 내일해 | 측정 대상 물체의 3차원 형상 정보 생성 방법 |
CN114235799B (zh) * | 2021-11-17 | 2023-11-17 | 南方科技大学 | 用于获取纯物体函数的方法及装置 |
CN117974454A (zh) * | 2022-10-30 | 2024-05-03 | 珠海乘数信息科技有限公司 | 高分辨成像中物体透射函数和入射波的恢复方法、系统和存储介质 |
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-
2004
- 2004-04-29 GB GBGB0409572.5A patent/GB0409572D0/en not_active Ceased
-
2005
- 2005-04-15 AU AU2005238692A patent/AU2005238692B2/en not_active Ceased
- 2005-04-15 BR BRPI0510457-2A patent/BRPI0510457A/pt not_active IP Right Cessation
- 2005-04-15 EA EA200602003A patent/EA011004B1/ru not_active IP Right Cessation
- 2005-04-15 KR KR1020127030291A patent/KR101265755B1/ko active IP Right Grant
- 2005-04-15 PT PT57357550T patent/PT1740975E/pt unknown
- 2005-04-15 WO PCT/GB2005/001464 patent/WO2005106531A1/en active Application Filing
- 2005-04-15 CA CA2564597A patent/CA2564597C/en not_active Expired - Fee Related
- 2005-04-15 JP JP2007510096A patent/JP4926944B2/ja active Active
- 2005-04-15 US US11/587,627 patent/US7792246B2/en active Active
- 2005-04-15 KR KR1020067024879A patent/KR101226210B1/ko active IP Right Grant
- 2005-04-15 PL PL05735755T patent/PL1740975T3/pl unknown
- 2005-04-15 SI SI200531976T patent/SI1740975T1/sl unknown
- 2005-04-15 EP EP05735755.0A patent/EP1740975B1/en active Active
- 2005-04-15 DK DK05735755.0T patent/DK1740975T3/en active
- 2005-04-15 CN CN200580021066.8A patent/CN1985188B/zh active Active
- 2005-04-15 ES ES05735755.0T patent/ES2540928T3/es active Active
Also Published As
Publication number | Publication date |
---|---|
US7792246B2 (en) | 2010-09-07 |
SI1740975T1 (sl) | 2015-08-31 |
CN1985188A (zh) | 2007-06-20 |
KR20070005003A (ko) | 2007-01-09 |
EP1740975B1 (en) | 2015-06-03 |
JP4926944B2 (ja) | 2012-05-09 |
DK1740975T3 (en) | 2015-07-27 |
AU2005238692A2 (en) | 2005-11-10 |
US20080095312A1 (en) | 2008-04-24 |
PT1740975E (pt) | 2015-09-10 |
KR20130001319A (ko) | 2013-01-03 |
WO2005106531A1 (en) | 2005-11-10 |
CA2564597A1 (en) | 2005-11-10 |
AU2005238692B2 (en) | 2010-09-30 |
CN1985188B (zh) | 2015-02-18 |
KR101265755B1 (ko) | 2013-05-24 |
BRPI0510457A (pt) | 2007-11-06 |
EP1740975A1 (en) | 2007-01-10 |
KR101226210B1 (ko) | 2013-01-28 |
EA011004B1 (ru) | 2008-12-30 |
EA200602003A1 (ru) | 2007-12-28 |
AU2005238692A1 (en) | 2005-11-10 |
CA2564597C (en) | 2014-06-17 |
JP2007534956A (ja) | 2007-11-29 |
GB0409572D0 (en) | 2004-06-02 |
ES2540928T3 (es) | 2015-07-14 |
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