PL1705473T3 - Urządzenie pomiarowe do pomiaru właściwości refrakcyjnych soczewek optycznych - Google Patents
Urządzenie pomiarowe do pomiaru właściwości refrakcyjnych soczewek optycznychInfo
- Publication number
- PL1705473T3 PL1705473T3 PL06000542T PL06000542T PL1705473T3 PL 1705473 T3 PL1705473 T3 PL 1705473T3 PL 06000542 T PL06000542 T PL 06000542T PL 06000542 T PL06000542 T PL 06000542T PL 1705473 T3 PL1705473 T3 PL 1705473T3
- Authority
- PL
- Poland
- Prior art keywords
- measuring
- optical lenses
- refraction properties
- lens
- measuring device
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Eyeglasses (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE200520004934 DE202005004934U1 (de) | 2005-03-23 | 2005-03-23 | Messeinrichtung zum Messen der Refraktionseigenschaften optischer Linsen |
DE202005009847U DE202005009847U1 (de) | 2005-03-23 | 2005-06-21 | Messeinrichtung zum Messen der Refraktionseigenschaften optischer Linsen |
EP06000542A EP1705473B1 (de) | 2005-03-23 | 2006-01-12 | Messeinrichtung zum Messen der Refraktionseigenschaften optischer Linsen |
Publications (1)
Publication Number | Publication Date |
---|---|
PL1705473T3 true PL1705473T3 (pl) | 2011-05-31 |
Family
ID=35220286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL06000542T PL1705473T3 (pl) | 2005-03-23 | 2006-01-12 | Urządzenie pomiarowe do pomiaru właściwości refrakcyjnych soczewek optycznych |
Country Status (6)
Country | Link |
---|---|
US (1) | US7456941B2 (pl) |
EP (1) | EP1705473B1 (pl) |
JP (1) | JP4878191B2 (pl) |
AT (1) | ATE491932T1 (pl) |
DE (2) | DE202005009847U1 (pl) |
PL (1) | PL1705473T3 (pl) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101050997B (zh) * | 2006-04-07 | 2010-05-12 | 鸿富锦精密工业(深圳)有限公司 | 镜头杂散光检测装置及方法 |
CN101221087A (zh) * | 2007-01-09 | 2008-07-16 | 鸿富锦精密工业(深圳)有限公司 | 镜片光反射率检测装置及镜片组装设备 |
DE102008060589B4 (de) | 2008-12-05 | 2015-06-03 | Schneider Gmbh & Co. Kg | Verfahren zum Bearbeiten und Berechnen einer als Halbfertigfabrikat ausgebildeten optischen Linse |
CN103487239B (zh) * | 2013-10-11 | 2015-11-25 | 杭州奥普特光学有限公司 | 手持式镜片面焦度测量装置 |
CN103624012B (zh) * | 2013-11-29 | 2016-01-20 | 广州视睿电子科技有限公司 | Led灯管检测系统 |
JP2021033036A (ja) * | 2019-08-23 | 2021-03-01 | 東海光学株式会社 | 累進屈折力レンズの不明な領域の光学性能を補間するための補間方法 |
KR20240029853A (ko) * | 2022-08-29 | 2024-03-07 | 아이오솔루션(주) | 광통신 렌즈 성능 평가용 치구 및 이를 이용한 렌즈의 성능 평가 방법 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63169535A (ja) * | 1987-01-07 | 1988-07-13 | Fuji Xerox Co Ltd | 解像度測定装置 |
JP3161787B2 (ja) * | 1991-11-30 | 2001-04-25 | 株式会社ニデック | レンズ屈折力分布観察装置 |
JPH10507825A (ja) * | 1994-06-14 | 1998-07-28 | ヴィジョニクス・リミテッド | 光要素をマッピングするための装置 |
US5523836A (en) * | 1994-11-02 | 1996-06-04 | Minix; Marcus S. | Method and apparatus for orienting a lens' refractive characteristics and lay-out properties |
JP3497024B2 (ja) * | 1995-10-02 | 2004-02-16 | 株式会社トプコン | レンズ特定装置 |
JPH09257644A (ja) * | 1996-03-26 | 1997-10-03 | Topcon Corp | レンズメーター |
US6195164B1 (en) * | 1997-11-06 | 2001-02-27 | Visx, Incorporated | Systems and methods for calibrating laser ablations |
DE10014334C2 (de) * | 2000-03-24 | 2002-03-21 | Zeiss Carl | Vorrichtung und Verfahren zur ortsaufgelösten Brechkraft-Bestimmung |
JP2002174565A (ja) * | 2000-12-06 | 2002-06-21 | Canon Inc | 収差測定装置 |
JP4327412B2 (ja) * | 2002-06-06 | 2009-09-09 | 株式会社日立製作所 | 波面収差測定装置及び露光装置 |
JP2004205438A (ja) * | 2002-12-26 | 2004-07-22 | Hitachi Kokusai Electric Inc | レンズ測定器 |
-
2005
- 2005-06-21 DE DE202005009847U patent/DE202005009847U1/de not_active Expired - Lifetime
-
2006
- 2006-01-12 PL PL06000542T patent/PL1705473T3/pl unknown
- 2006-01-12 AT AT06000542T patent/ATE491932T1/de not_active IP Right Cessation
- 2006-01-12 EP EP06000542A patent/EP1705473B1/de not_active Not-in-force
- 2006-01-12 DE DE502006008488T patent/DE502006008488D1/de active Active
- 2006-03-23 JP JP2006081342A patent/JP4878191B2/ja not_active Expired - Fee Related
- 2006-03-23 US US11/389,337 patent/US7456941B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP1705473B1 (de) | 2010-12-15 |
JP2006267109A (ja) | 2006-10-05 |
DE202005009847U1 (de) | 2005-10-20 |
EP1705473A3 (de) | 2007-11-21 |
JP4878191B2 (ja) | 2012-02-15 |
US7456941B2 (en) | 2008-11-25 |
ATE491932T1 (de) | 2011-01-15 |
DE502006008488D1 (de) | 2011-01-27 |
EP1705473A2 (de) | 2006-09-27 |
US20060238748A1 (en) | 2006-10-26 |
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