NO983884D0 - Sonde for feilaktiveringsanordninger - Google Patents

Sonde for feilaktiveringsanordninger

Info

Publication number
NO983884D0
NO983884D0 NO983884A NO983884A NO983884D0 NO 983884 D0 NO983884 D0 NO 983884D0 NO 983884 A NO983884 A NO 983884A NO 983884 A NO983884 A NO 983884A NO 983884 D0 NO983884 D0 NO 983884D0
Authority
NO
Norway
Prior art keywords
probe
fault
malfunctioning devices
emitter
reference signal
Prior art date
Application number
NO983884A
Other languages
English (en)
Norwegian (no)
Other versions
NO983884L (no
Inventor
Piero Belforte
Flavio Maggioni
Original Assignee
Cselt Centro Studi Lab Telecom
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cselt Centro Studi Lab Telecom filed Critical Cselt Centro Studi Lab Telecom
Publication of NO983884D0 publication Critical patent/NO983884D0/no
Publication of NO983884L publication Critical patent/NO983884L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Valve Device For Special Equipments (AREA)
  • Eye Examination Apparatus (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Control Of Stepping Motors (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
NO983884A 1996-03-06 1998-08-24 Sonde for feilaktiveringsanordninger NO983884L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT96TO000168A IT1285299B1 (it) 1996-03-06 1996-03-06 Sonda per dispositivi attuatori di guasto
PCT/EP1997/001096 WO1997033180A1 (fr) 1996-03-06 1997-03-05 Sonde pour dispositifs d'actionnement de defaillances

Publications (2)

Publication Number Publication Date
NO983884D0 true NO983884D0 (no) 1998-08-24
NO983884L NO983884L (no) 1998-08-24

Family

ID=11414361

Family Applications (1)

Application Number Title Priority Date Filing Date
NO983884A NO983884L (no) 1996-03-06 1998-08-24 Sonde for feilaktiveringsanordninger

Country Status (12)

Country Link
US (1) US6320390B1 (fr)
EP (1) EP0885397B1 (fr)
JP (1) JP3201611B2 (fr)
AT (1) ATE206525T1 (fr)
AU (1) AU708184B2 (fr)
CA (1) CA2248315A1 (fr)
DE (1) DE69707108T2 (fr)
ES (1) ES2166069T3 (fr)
IT (1) IT1285299B1 (fr)
NO (1) NO983884L (fr)
PT (1) PT885397E (fr)
WO (1) WO1997033180A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4275583B2 (ja) * 2004-06-24 2009-06-10 ユーディナデバイス株式会社 電子モジュール
US7609080B2 (en) * 2005-03-22 2009-10-27 Formfactor, Inc. Voltage fault detection and protection

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2363360B1 (de) * 1973-12-20 1975-06-05 Koerting Radio Werke Gmbh, 8211 Grassau Transistorverstärker
US4309657A (en) * 1980-01-09 1982-01-05 Burroughs Corporation Apparatus for analyzing semiconductor memories
JPS57153464A (en) 1981-03-18 1982-09-22 Toshiba Corp Injection type semiconductor integrated logic circuit
JPS62183215A (ja) 1986-02-07 1987-08-11 Hitachi Ltd 半導体集積回路装置
EP0262367A1 (fr) 1986-09-30 1988-04-06 Siemens Aktiengesellschaft Sonde mécanique pour la mesure de signaux électriques dépendants du temps
US4841240A (en) * 1988-01-29 1989-06-20 American Telephone And Telegraph Company, At&T Bell Laboratories Method and apparatus for verifying the continuity between a circuit board and a test fixture

Also Published As

Publication number Publication date
US6320390B1 (en) 2001-11-20
AU708184B2 (en) 1999-07-29
ATE206525T1 (de) 2001-10-15
PT885397E (pt) 2002-03-28
EP0885397B1 (fr) 2001-10-04
WO1997033180A1 (fr) 1997-09-12
ITTO960168A0 (fr) 1996-03-06
AU2024097A (en) 1997-09-22
JP3201611B2 (ja) 2001-08-27
DE69707108T2 (de) 2002-11-07
ES2166069T3 (es) 2002-04-01
CA2248315A1 (fr) 1997-09-12
IT1285299B1 (it) 1998-06-03
NO983884L (no) 1998-08-24
EP0885397A1 (fr) 1998-12-23
JPH11505031A (ja) 1999-05-11
DE69707108D1 (de) 2001-11-08
ITTO960168A1 (it) 1997-09-06

Similar Documents

Publication Publication Date Title
ES8603113A1 (es) Un circuito integrado fotodetector
DE69404337D1 (de) Kapazitiver Beschleunigungsmesser mit Schaltung zur Korrektur des störender Einflusses parasitärer Kapazitäten
DE59107478D1 (de) Pegelumsetzschaltung
DE69127849T2 (de) Bipolarer Transistor
DE69420492T2 (de) Halbleiterschaltkreisbauelement mit reduziertem Einfluss parasitärer Kapazitäten
DE69428407D1 (de) Rauscharmer bipolarer Transistor
DE3783461T2 (de) Kapazitives dehnungsmessgeraet.
KR960012693A (ko) 베이스 접지 트랜지스터 증폭기
NO983884D0 (no) Sonde for feilaktiveringsanordninger
EP0292327A3 (fr) Circuits de protection contre une rupture électrostatique
CA2098028A1 (fr) Source de bruit blanc de faible puissance a circuit integre
DK0602278T3 (da) Bipolar højfrekvenstransistor
IT8522913A0 (it) Dispositivo per minimizzare le capacita' parassite di giunzione di un transistor pnp verticale a collettore isolato.
DE3874949D1 (de) Heterouebergang-bipolartransistor.
DE69128384D1 (de) Heteroübergang-Bipolartransistor
GB1277768A (en) Improvements in or relating to signal transmitting circuit arrangements
DE9018172U1 (de) Sperrschicht-Bipolartransistor-Leistungsmodul
AU570246B2 (en) Integrated injection logic circuit
FR2626406B1 (fr) Transistor bipolaire compatible avec la technologie mos
KR910018973U (ko) 바이폴라 트랜지스터의 구조
RU2004070C1 (ru) Компаратор с однопол рным питанием
JPH0436472U (fr)
NO893331D0 (no) Anordning for avsugning av grunnluft.
SE9601167D0 (sv) Anordning vid hantering av buntar
JPS60150810U (ja) オ−デイオ回路のミユ−テイング回路

Legal Events

Date Code Title Description
FC2A Withdrawal, rejection or dismissal of laid open patent application