NO970171L - Fremgangsmåte og innretning til optisk nærfelt-rastermikroskopi på prövelegemer i væsker - Google Patents

Fremgangsmåte og innretning til optisk nærfelt-rastermikroskopi på prövelegemer i væsker

Info

Publication number
NO970171L
NO970171L NO970171A NO970171A NO970171L NO 970171 L NO970171 L NO 970171L NO 970171 A NO970171 A NO 970171A NO 970171 A NO970171 A NO 970171A NO 970171 L NO970171 L NO 970171L
Authority
NO
Norway
Prior art keywords
field
liquid test
test bodies
sample surface
liquid
Prior art date
Application number
NO970171A
Other languages
English (en)
Other versions
NO970171D0 (no
Inventor
Michael Mertesdorf
Stefan Kirstein
Monika Schoenhoff
Frauke Lohr
Original Assignee
Huels Chemische Werke Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Huels Chemische Werke Ag filed Critical Huels Chemische Werke Ag
Publication of NO970171D0 publication Critical patent/NO970171D0/no
Publication of NO970171L publication Critical patent/NO970171L/no

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04Fine scanning or positioning
    • G01Q10/06Circuits or algorithms therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00Methods or apparatus for measurement or analysis of nanostructures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00Monitoring the movement or position of the probe
    • G01Q20/02Monitoring the movement or position of the probe by optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/08Means for establishing or regulating a desired environmental condition within a sample chamber
    • G01Q30/12Fluid environment
    • G01Q30/14Liquid environment
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/20Fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22Probes, their manufacture, or their related instrumentation, e.g. holders

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Vanlige metoder til nærfelt-rastermikroskopi på prøvelegemer i væsker forutsetter forekomsten av et tilstrekkelig glatt, reflekterende prøveoverflate for deteksjon av svingningsbevegelsen til lyslederfiber-spissen og dermed regulering av avstanden mellom spissen og overflaten.Ved en fremgangsmåte i henhold til oppfinnelsen ved hvilken svingningsbevegelsen foretrukket detekteres ved hjelp av en lysstråle hovedsakelig parallelt til prøveoverflaten uten refleksjon ved prøveoverflaten, kan vilkårlige prøver i nær sagt hver væske undersøkes.Anvendelser til undersøkelse av ved væsken på prøveoverflaten fremkalte forandringer.
NO970171A 1996-08-03 1997-01-15 Fremgangsmåte og innretning til optisk nærfelt-rastermikroskopi på prövelegemer i væsker NO970171L (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19631498A DE19631498A1 (de) 1996-08-03 1996-08-03 Verfahren und Vorrichtung zur optischen Rasternahfeldmikroskopie an Probekörpern in Flüssigkeiten

Publications (2)

Publication Number Publication Date
NO970171D0 NO970171D0 (no) 1997-01-15
NO970171L true NO970171L (no) 1998-02-04

Family

ID=7801775

Family Applications (1)

Application Number Title Priority Date Filing Date
NO970171A NO970171L (no) 1996-08-03 1997-01-15 Fremgangsmåte og innretning til optisk nærfelt-rastermikroskopi på prövelegemer i væsker

Country Status (9)

Country Link
US (1) US5838000A (no)
EP (1) EP0822435A1 (no)
JP (1) JPH1082790A (no)
CA (1) CA2195838A1 (no)
CZ (1) CZ19297A3 (no)
DE (1) DE19631498A1 (no)
HU (1) HUP9700129A3 (no)
IL (1) IL120037A0 (no)
NO (1) NO970171L (no)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6043485A (en) * 1997-10-30 2000-03-28 Fuji Photo Film Co., Ltd. Sample analyzer
TW396279B (en) * 1998-09-09 2000-07-01 Nat Science Council Shear force feedback structure capable of performing large area scanning, near-field optical microscope using the structure and its scanning method
US6621079B1 (en) 1999-07-02 2003-09-16 University Of Virginia Patent Foundation Apparatus and method for a near field scanning optical microscope in aqueous solution
US6479817B1 (en) * 2000-03-28 2002-11-12 Advanced Micro Devices, Inc. Cantilever assembly and scanning tip therefor with associated optical sensor
US6452161B1 (en) 2000-03-28 2002-09-17 Advanced Micro Devices, Inc. Scanning probe microscope having optical fiber spaced from point of hp
US6888135B2 (en) 2000-10-18 2005-05-03 Nec Corporation Scanning probe microscope with probe formed by single conductive material
JP3793430B2 (ja) * 2001-07-18 2006-07-05 株式会社日立製作所 近接場光を用いた光学装置
DE102006043352A1 (de) * 2006-09-15 2008-03-27 Westfälische Wilhelms-Universität Münster Einrichtung zum Abtasten einer von einer Flüssigkeit bedeckten Probenoberfläche
CN101173885B (zh) * 2006-10-30 2010-05-12 中国科学院化学研究所 微区稳态/瞬态光电检测与扫描成像的近场光学显微镜系统
JP6014502B2 (ja) * 2013-01-25 2016-10-25 株式会社日立製作所 走査プローブ顕微鏡およびこれを用いた試料の観察方法
US10238369B2 (en) * 2014-06-10 2019-03-26 The Johns Hopkins University Real time ultrasound thermal dose monitoring system for tumor ablation therapy
WO2016125207A1 (ja) * 2015-02-06 2016-08-11 オリンパス株式会社 光ファイバスキャナ及び走査型内視鏡装置
FR3036050B1 (fr) * 2015-05-13 2017-06-09 Univ Strasbourg Dispositif de traitement laser et station de travail comportant un tel dispositif
US9418421B1 (en) * 2015-09-26 2016-08-16 Nastaran Neishaboori Automation of biopsy specimen handling
JP6832735B2 (ja) * 2016-08-18 2021-02-24 オリンパス株式会社 顕微鏡
EP3324194B1 (en) * 2016-11-22 2019-06-26 Anton Paar GmbH Imaging a gap between sample and probe of a scanning probe microscope in substantially horizontal side view
WO2018122916A1 (ja) * 2016-12-26 2018-07-05 オリンパス株式会社 光ファイバ走査装置および内視鏡

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5254854A (en) * 1991-11-04 1993-10-19 At&T Bell Laboratories Scanning microscope comprising force-sensing means and position-sensitive photodetector
IL107807A0 (en) 1993-11-30 1994-02-27 Aaron Lewis Simple microamplitude vibration detector
US5479024A (en) 1994-08-11 1995-12-26 The Regents Of The University Of California Method and apparatus for performing near-field optical microscopy
JP2936311B2 (ja) 1994-09-09 1999-08-23 セイコーインスツルメンツ株式会社 液中観察機能付き走査型近視野原子間力顕微鏡
US5485536A (en) 1994-10-13 1996-01-16 Accuphotonics, Inc. Fiber optic probe for near field optical microscopy
TW280928B (no) * 1994-10-24 1996-07-11 At & T Corp

Also Published As

Publication number Publication date
HUP9700129A2 (hu) 1998-04-28
CZ19297A3 (cs) 1998-02-18
NO970171D0 (no) 1997-01-15
IL120037A0 (en) 1997-04-15
HU9700129D0 (en) 1997-02-28
EP0822435A1 (de) 1998-02-04
HUP9700129A3 (en) 1999-11-29
DE19631498A1 (de) 1998-02-05
US5838000A (en) 1998-11-17
JPH1082790A (ja) 1998-03-31
CA2195838A1 (en) 1998-02-04

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