NO20065925L - Innretning og fremgangsmate for a detektere riper. - Google Patents

Innretning og fremgangsmate for a detektere riper.

Info

Publication number
NO20065925L
NO20065925L NO20065925A NO20065925A NO20065925L NO 20065925 L NO20065925 L NO 20065925L NO 20065925 A NO20065925 A NO 20065925A NO 20065925 A NO20065925 A NO 20065925A NO 20065925 L NO20065925 L NO 20065925L
Authority
NO
Norway
Prior art keywords
scan line
diffuse
light
quasi
scratches
Prior art date
Application number
NO20065925A
Other languages
English (en)
Inventor
Armin Rudert
Ulrich Pingel
Original Assignee
Isra Surface Vision Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Isra Surface Vision Gmbh filed Critical Isra Surface Vision Gmbh
Publication of NO20065925L publication Critical patent/NO20065925L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Foreliggende oppfinnelse er relatert til innretning og en tilsvarende fremgangsmåte for å detektere riper på overflaten (2) til et materiale, i særlig grad glass. Innretningen innbefatter en belysningsenhet (3) og en opptaksenhet (4), som registrerer en skannelinje (6) på overflaten (2) til materialet og som kan bli forskjøvet i forhold til overflaten (2). For mer presist å identifisere riper innbefatter belysningsenheten (3) i det minste en lysstripe (9), som genererer parallelle lysforekomster på tvers av skannelinjen (6) der forekomstene er diffuse eller kvasidiffuse langs skannelinjen (6) og foretrukket i det minste en lyskilde (16), som genererer et diffust eller kvasidiffust lys på tvers av skannelinjen (6).
NO20065925A 2004-05-29 2006-12-20 Innretning og fremgangsmate for a detektere riper. NO20065925L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102004026375A DE102004026375B4 (de) 2004-05-29 2004-05-29 Vorrichtung und Verfahren zur Detektion von Kratzern
PCT/EP2005/001440 WO2005116616A1 (de) 2004-05-29 2005-02-12 Vorrichtung und verfahren zur detektion von kratzern

Publications (1)

Publication Number Publication Date
NO20065925L true NO20065925L (no) 2007-02-23

Family

ID=34960486

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20065925A NO20065925L (no) 2004-05-29 2006-12-20 Innretning og fremgangsmate for a detektere riper.

Country Status (10)

Country Link
US (1) US7453563B2 (no)
EP (1) EP1751526A1 (no)
JP (1) JP4918032B2 (no)
KR (1) KR100907247B1 (no)
CN (1) CN100590426C (no)
CA (1) CA2567061C (no)
DE (1) DE102004026375B4 (no)
IL (1) IL179385A (no)
NO (1) NO20065925L (no)
WO (1) WO2005116616A1 (no)

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DE102006042117A1 (de) * 2006-09-07 2008-03-27 Dr. Schenk Gmbh Industriemesstechnik Vorrichtung zur optischen Detektion eines Oberflächenfehlers eines Substrats
CA2675456C (en) 2007-01-12 2017-03-07 Synergx Technologies Inc. Bright field and dark field channels, used for automotive glass inspection systems
US7551274B1 (en) 2007-02-28 2009-06-23 Lite Sentry Corporation Defect detection lighting system and methods for large glass sheets
DE102007037812B4 (de) 2007-08-10 2023-03-16 Carl Zeiss Optotechnik GmbH Verfahren und Vorrichtung zur Detektion von Oberflächenfehlern eines Bauteils
DE102007045323A1 (de) * 2007-09-21 2009-04-09 Siemens Ag Anordnung und Verfahren zur optischen Detektion von Unebenheiten einer Glasscheibe
WO2010029549A1 (en) * 2008-09-12 2010-03-18 Ceramicam Ltd. Surface scanning device
DE102010021853B4 (de) 2010-05-28 2012-04-26 Isra Vision Ag Einrichtung und Verfahren zur optischen Überprüfung eines Gegenstands
CN101995412B (zh) * 2010-08-30 2012-09-05 中国科学院计算技术研究所 一种鲁棒的玻璃划伤缺陷检测方法及其装置
CN102401802A (zh) * 2010-09-08 2012-04-04 上海宝钢工业检测公司 轧辊表面磨削质量光检查方法
MX2014007827A (es) 2011-12-31 2014-08-01 Saint Gobain Sistema de iluminacion para detectar la imperfeccion en un sustrato transparente y un sistema de deteccion que incluye el mismo.
CN103868929B (zh) * 2013-11-29 2017-01-25 中广核研究院有限公司 密封面缺陷三维检测方法
CN105300884A (zh) * 2015-11-05 2016-02-03 苏州威盛视信息科技有限公司 一种散射线性光源检测装置
CN113376164A (zh) * 2020-03-10 2021-09-10 觉芯电子(无锡)有限公司 一种表面划痕检测方法及装置
JP2022003325A (ja) * 2020-06-23 2022-01-11 株式会社小糸製作所 表面検査装置および表面検査システム
CN113916908A (zh) * 2021-09-03 2022-01-11 苏州鑫格雅电子科技有限公司 一种提高玻璃物性表面处理后用划痕检测装置及其检测方法
CN114310395B (zh) * 2022-01-13 2022-12-06 广东韶钢松山股份有限公司 一种检测金属工件表面划痕深度的装置及方法
US11867630B1 (en) 2022-08-09 2024-01-09 Glasstech, Inc. Fixture and method for optical alignment in a system for measuring a surface in contoured glass sheets

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US3814946A (en) * 1972-12-04 1974-06-04 Asahi Glass Co Ltd Method of detecting defects in transparent and semitransparent bodies
DE2261460A1 (de) * 1972-12-15 1974-06-20 Asahi Glass Co Ltd Verfahren und vorrichtung zum aufzeigen von optischen, fehlerhaften stellen in einem durchlaessigen oder halbdurchlaessigen koerper
JPS6211135A (ja) * 1985-06-24 1987-01-20 Hitachi Electronics Eng Co Ltd 透明試料板の表面検査装置
JPH0640076B2 (ja) * 1988-10-20 1994-05-25 三菱レイヨン株式会社 ライン状光源を用いた欠陥検査装置
JPH03210460A (ja) * 1990-01-13 1991-09-13 Matsushita Electric Works Ltd 表面検査装置
FR2697086B1 (fr) * 1992-10-20 1994-12-09 Thomson Csf Procédé et dispositif d'inspection de matériau transparent.
JP3379805B2 (ja) * 1993-05-13 2003-02-24 オリンパス光学工業株式会社 表面欠陥検査装置
JP3659952B2 (ja) * 1993-05-13 2005-06-15 オリンパス株式会社 表面欠陥検査装置
JP3170598B2 (ja) * 1995-03-16 2001-05-28 株式会社サキコーポレーション 外観検査装置
US5745176A (en) 1995-10-12 1998-04-28 Ppt Vision, Inc. Machine-vision illumination system and method for delineating a lighted volume from an unlighted volume
JP3726150B2 (ja) * 1997-06-12 2005-12-14 株式会社ダイレクトコミュニケーションズ 微細領域の照明装置
US6256091B1 (en) * 1997-08-25 2001-07-03 Nippon Maxis Co., Ltd. Transparent substrate mounting platform, transparent substrate scratch inspection device, transparent substrate bevelling inspection method and device, and transparent substrate inspection method
JP4189061B2 (ja) * 1998-07-10 2008-12-03 株式会社Ｉｈｉ コンクリート表面のクラック検出方法
US6161941A (en) * 1998-08-24 2000-12-19 Intelligent Reasoning Systems, Inc. Light array system and method for illumination of objects imaged by imaging systems
CA2252308C (en) * 1998-10-30 2005-01-04 Image Processing Systems, Inc. Glass inspection system
JP2001165864A (ja) * 1999-12-10 2001-06-22 Fuji Photo Film Co Ltd 表面検査装置及び方法
JP2001221745A (ja) * 2000-02-10 2001-08-17 Nippon Steel Corp 疵検査用照明装置
JP2002014058A (ja) * 2000-06-30 2002-01-18 Matsushita Electric Ind Co Ltd 検査方法及び装置
JP3580493B2 (ja) * 2000-08-11 2004-10-20 株式会社サキコーポレーション 走査ヘッドおよびそれを利用可能な外観検査方法および装置
JP4030716B2 (ja) * 2000-11-01 2008-01-09 シーケーディ株式会社 錠剤の外観検査装置およびｐｔｐ包装機
JP2002214144A (ja) * 2001-01-15 2002-07-31 Nippon Steel Corp 疵検査用照明装置
JP2004045592A (ja) * 2002-07-10 2004-02-12 Matsushita Electric Ind Co Ltd 球状体の観察装置
JP4387089B2 (ja) * 2002-08-30 2009-12-16 株式会社日立製作所 欠陥検査装置および欠陥検査方法
JP2004233189A (ja) * 2003-01-30 2004-08-19 Fujitsu Ltd 照明装置及び検査装置

Also Published As

Publication number Publication date
IL179385A (en) 2011-02-28
EP1751526A1 (de) 2007-02-14
CN1961208A (zh) 2007-05-09
KR100907247B1 (ko) 2009-07-10
IL179385A0 (en) 2007-03-08
WO2005116616A1 (de) 2005-12-08
KR20070083397A (ko) 2007-08-24
JP4918032B2 (ja) 2012-04-18
CN100590426C (zh) 2010-02-17
DE102004026375B4 (de) 2007-03-22
CA2567061C (en) 2015-06-16
US20070252996A1 (en) 2007-11-01
JP2008501105A (ja) 2008-01-17
DE102004026375A1 (de) 2005-12-22
CA2567061A1 (en) 2005-12-08
US7453563B2 (en) 2008-11-18

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