MX2014007827A - Sistema de iluminacion para detectar la imperfeccion en un sustrato transparente y un sistema de deteccion que incluye el mismo. - Google Patents
Sistema de iluminacion para detectar la imperfeccion en un sustrato transparente y un sistema de deteccion que incluye el mismo.Info
- Publication number
- MX2014007827A MX2014007827A MX2014007827A MX2014007827A MX2014007827A MX 2014007827 A MX2014007827 A MX 2014007827A MX 2014007827 A MX2014007827 A MX 2014007827A MX 2014007827 A MX2014007827 A MX 2014007827A MX 2014007827 A MX2014007827 A MX 2014007827A
- Authority
- MX
- Mexico
- Prior art keywords
- line
- light sources
- spot light
- transparent substrate
- defect
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21K—NON-ELECTRIC LIGHT SOURCES USING LUMINESCENCE; LIGHT SOURCES USING ELECTROCHEMILUMINESCENCE; LIGHT SOURCES USING CHARGES OF COMBUSTIBLE MATERIAL; LIGHT SOURCES USING SEMICONDUCTOR DEVICES AS LIGHT-GENERATING ELEMENTS; LIGHT SOURCES NOT OTHERWISE PROVIDED FOR
- F21K9/00—Light sources using semiconductor devices as light-generating elements, e.g. using light-emitting diodes [LED] or lasers
- F21K9/20—Light sources comprising attachment means
- F21K9/27—Retrofit light sources for lighting devices with two fittings for each light source, e.g. for substitution of fluorescent tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO THE FORM OR THE KIND OF THE LIGHT SOURCES OR OF THE COLOUR OF THE LIGHT EMITTED
- F21Y2103/00—Elongate light sources, e.g. fluorescent tubes
- F21Y2103/10—Elongate light sources, e.g. fluorescent tubes comprising a linear array of point-like light-generating elements
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F21—LIGHTING
- F21Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO THE FORM OR THE KIND OF THE LIGHT SOURCES OR OF THE COLOUR OF THE LIGHT EMITTED
- F21Y2115/00—Light-generating elements of semiconductor light sources
- F21Y2115/10—Light-emitting diodes [LED]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8812—Diffuse illumination, e.g. "sky"
- G01N2021/8816—Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0633—Directed, collimated illumination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/105—Purely optical scan
Landscapes
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Optics & Photonics (AREA)
- General Engineering & Computer Science (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
La invención se refiere a un dispositivo de iluminación para proporcionar iluminación casi isotrópica y de manera particular a un sistema de iluminación para detectar el defecto en un substrato transparente y un sistema de detección que comprende el mismo. De acuerdo con una modalidad de la invención, se proporciona un sistema de iluminación para detectar la imperfección en un substrato transparente, que comprende un receptáculo de fuente de luz en forma de barra; una pluralidad de unas primeras fuentes de luz de punto, cada una que emite una respectiva primera luz, las respectivas primeras luces que están sustancialmente en paralelo la una a la otra y las primeras fuentes de luz que se ordenan con una primera línea de fuentes de luz de punto a lo largo de la dirección longitudinal del receptáculo; y una pluralidad de unas segundas fuentes de luz de punto, cada una que emite una respectiva segunda luz, las respectivas segundas luces que están sustancialmente en paralelo la una a la otra y las segundas fuentes de luz que se ordenan con una segunda línea de fuentes de luz de punto a lo largo de la dirección longitudinal del receptáculo, en donde la primera línea de fuentes de luz de punto y la segunda línea de fuentes de luz de punto se ordenan sustancialmente en una línea, la primer línea de fuentes de luz de punto y la segunda línea de fuentes de luz de punto se colocan en la diferencia media del receptáculo en la dirección longitudinal, la primera luz y la segunda luz convergen a la línea de exploración, y las proyecciones de las primeras y segundas luces, las cuales convergen en cada punto sobre la línea de exploración, en un plano P que pasa la línea de exploración y perpendicular al sustrato transparente se colocan en lados distintos de una línea en el plano P, el cual pasa el punto y es perpendicular a la línea de exploración.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2011/085131 WO2013097215A1 (en) | 2011-12-31 | 2011-12-31 | An illumination system for detecting the defect in a transparent substrate and a detection system including the same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MX2014007827A true MX2014007827A (es) | 2014-08-01 |
Family
ID=48696272
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2014007827A MX2014007827A (es) | 2011-12-31 | 2011-12-31 | Sistema de iluminacion para detectar la imperfeccion en un sustrato transparente y un sistema de deteccion que incluye el mismo. |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8958063B2 (es) |
| EP (1) | EP2798337A4 (es) |
| JP (1) | JP2015506470A (es) |
| KR (1) | KR20140108712A (es) |
| BR (1) | BR112014014353A2 (es) |
| MX (1) | MX2014007827A (es) |
| WO (1) | WO2013097215A1 (es) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107091807B (zh) * | 2017-07-03 | 2023-08-15 | 苏州康鸿智能装备股份有限公司 | 一种3d曲面玻璃屏检测面光源 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07243988A (ja) * | 1994-03-04 | 1995-09-19 | Toshiba Corp | 表面検査装置 |
| JPH0829138A (ja) * | 1994-07-20 | 1996-02-02 | Fujitsu Ltd | パターン検査装置及び方法 |
| JPH09189665A (ja) * | 1996-01-10 | 1997-07-22 | Nippon Sheet Glass Co Ltd | 欠点検査装置に用いる暗視野照明装置 |
| JPH11242002A (ja) * | 1998-02-25 | 1999-09-07 | Lintec Corp | 観測装置 |
| JPH11337504A (ja) * | 1998-05-26 | 1999-12-10 | Central Glass Co Ltd | ガラス板の欠陥識別検査方法および装置 |
| JP2002214158A (ja) * | 2001-01-19 | 2002-07-31 | Central Glass Co Ltd | 透明板状体の欠点検出方法および検出装置 |
| JP2004101311A (ja) * | 2002-09-09 | 2004-04-02 | Matsushita Electric Ind Co Ltd | ラインセンサカメラ用の照明装置および照明方法 |
| JP2004233189A (ja) * | 2003-01-30 | 2004-08-19 | Fujitsu Ltd | 照明装置及び検査装置 |
| JP2004317470A (ja) * | 2003-04-11 | 2004-11-11 | Nippon Electro Sensari Device Kk | 透明板欠陥検査装置 |
| DE102004026375B4 (de) * | 2004-05-29 | 2007-03-22 | Isra Glass Vision Gmbh | Vorrichtung und Verfahren zur Detektion von Kratzern |
| JP4615532B2 (ja) * | 2007-03-06 | 2011-01-19 | 株式会社メック | 欠陥検査装置、照明装置 |
| US7710557B2 (en) * | 2007-04-25 | 2010-05-04 | Hitachi High-Technologies Corporation | Surface defect inspection method and apparatus |
| JP4748133B2 (ja) * | 2007-09-28 | 2011-08-17 | パナソニック株式会社 | 検査装置 |
| CN201527404U (zh) * | 2009-04-24 | 2010-07-14 | 湖南科创信息技术股份有限公司 | 表面压纹玻璃瑕疵在线检测装置 |
| CN101900689A (zh) * | 2009-05-27 | 2010-12-01 | 北京京东方光电科技有限公司 | 玻璃基板破损检出设备和方法 |
-
2011
- 2011-12-31 KR KR1020147021121A patent/KR20140108712A/ko not_active Application Discontinuation
- 2011-12-31 JP JP2014549293A patent/JP2015506470A/ja active Pending
- 2011-12-31 EP EP11878545.0A patent/EP2798337A4/en not_active Withdrawn
- 2011-12-31 BR BR112014014353A patent/BR112014014353A2/pt not_active IP Right Cessation
- 2011-12-31 WO PCT/CN2011/085131 patent/WO2013097215A1/en active Application Filing
- 2011-12-31 MX MX2014007827A patent/MX2014007827A/es active IP Right Grant
- 2011-12-31 US US14/369,384 patent/US8958063B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US8958063B2 (en) | 2015-02-17 |
| EP2798337A4 (en) | 2015-11-04 |
| BR112014014353A2 (pt) | 2017-06-13 |
| EP2798337A1 (en) | 2014-11-05 |
| US20140347657A1 (en) | 2014-11-27 |
| JP2015506470A (ja) | 2015-03-02 |
| KR20140108712A (ko) | 2014-09-12 |
| WO2013097215A1 (en) | 2013-07-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG | Grant or registration |