NL8503152A - Dosismeter voor ioniserende straling. - Google Patents

Dosismeter voor ioniserende straling. Download PDF

Info

Publication number
NL8503152A
NL8503152A NL8503152A NL8503152A NL8503152A NL 8503152 A NL8503152 A NL 8503152A NL 8503152 A NL8503152 A NL 8503152A NL 8503152 A NL8503152 A NL 8503152A NL 8503152 A NL8503152 A NL 8503152A
Authority
NL
Netherlands
Prior art keywords
dosimeter according
dosimeter
anode wires
measuring chamber
cathode
Prior art date
Application number
NL8503152A
Other languages
English (en)
Dutch (nl)
Original Assignee
Optische Ind De Oude Delft Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optische Ind De Oude Delft Nv filed Critical Optische Ind De Oude Delft Nv
Priority to NL8503152A priority Critical patent/NL8503152A/nl
Priority to US06/931,538 priority patent/US4896041A/en
Priority to EP86202003A priority patent/EP0227134B1/fr
Priority to DE8686202003T priority patent/DE3671319D1/de
Priority to IL80649A priority patent/IL80649A0/xx
Priority to CN86108601A priority patent/CN1014934B/zh
Priority to JP61272741A priority patent/JPH06100656B2/ja
Priority to IN892/CAL/86A priority patent/IN168082B/en
Publication of NL8503152A publication Critical patent/NL8503152A/nl
Priority to JP6073655A priority patent/JPH07174856A/ja

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/02—Ionisation chambers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2935—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using ionisation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
NL8503152A 1985-11-15 1985-11-15 Dosismeter voor ioniserende straling. NL8503152A (nl)

Priority Applications (9)

Application Number Priority Date Filing Date Title
NL8503152A NL8503152A (nl) 1985-11-15 1985-11-15 Dosismeter voor ioniserende straling.
US06/931,538 US4896041A (en) 1985-11-15 1986-11-14 Dosimeter for ionizing radiation
EP86202003A EP0227134B1 (fr) 1985-11-15 1986-11-14 Appareil de radiographie par diaphragme à fente
DE8686202003T DE3671319D1 (de) 1985-11-15 1986-11-14 Roentgenaufnahmegeraet mit schlitzblenden.
IL80649A IL80649A0 (en) 1985-11-15 1986-11-14 Dosimeter for ionizing radiation
CN86108601A CN1014934B (zh) 1985-11-15 1986-11-15 用于狭缝辐射照相设备的辐射剂量计
JP61272741A JPH06100656B2 (ja) 1985-11-15 1986-11-15 Ｘ線写真装置
IN892/CAL/86A IN168082B (fr) 1985-11-15 1986-12-09
JP6073655A JPH07174856A (ja) 1985-11-15 1994-04-12 Ｘ線写真方法および装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8503152A NL8503152A (nl) 1985-11-15 1985-11-15 Dosismeter voor ioniserende straling.
NL8503152 1985-11-15

Publications (1)

Publication Number Publication Date
NL8503152A true NL8503152A (nl) 1987-06-01

Family

ID=19846877

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8503152A NL8503152A (nl) 1985-11-15 1985-11-15 Dosismeter voor ioniserende straling.

Country Status (8)

Country Link
US (1) US4896041A (fr)
EP (1) EP0227134B1 (fr)
JP (2) JPH06100656B2 (fr)
CN (1) CN1014934B (fr)
DE (1) DE3671319D1 (fr)
IL (1) IL80649A0 (fr)
IN (1) IN168082B (fr)
NL (1) NL8503152A (fr)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0358646A1 (fr) * 1987-03-26 1990-03-21 Deutsches Elektronen-Synchrotron DESY Cable coaxial avec grille de protection utile comme chambre d'ionisation
NL8701122A (nl) * 1987-05-12 1988-12-01 Optische Ind De Oude Delft Nv Inrichting voor spleetradiografie met beeldharmonisatie.
JPH06290507A (ja) * 1992-08-03 1994-10-18 Fujitsu Ten Ltd テープたるみ除去装置及びその方法
US5308987A (en) * 1993-02-01 1994-05-03 The United States Of America As Represented By The United States Department Of Energy Microgap x-ray detector
US5508526A (en) * 1995-02-01 1996-04-16 Keithley Instruments, Inc. Dual entrance window ion chamber for measuring X-ray exposure
JP5129115B2 (ja) * 2005-04-01 2013-01-23 クゥアルコム・インコーポレイテッド 高帯域バーストの抑制のためのシステム、方法、および装置
JP4638294B2 (ja) * 2005-07-28 2011-02-23 京セラ株式会社 金属線材固定用セラミック枠体
SE529241C2 (sv) * 2005-10-26 2007-06-05 Tetra Laval Holdings & Finance Sensor samt system för avkänning av en elektronstråle
EP2924470B1 (fr) 2008-04-07 2017-09-13 Mirion Technologies, Inc. Appareil, systèmes et procédés de dosimétrie
US9587349B2 (en) 2008-04-30 2017-03-07 Xyleco, Inc. Textiles and methods and systems for producing textiles
US8911833B2 (en) * 2008-04-30 2014-12-16 Xyleco, Inc. Textiles and methods and systems for producing textiles
US7867358B2 (en) 2008-04-30 2011-01-11 Xyleco, Inc. Paper products and methods and systems for manufacturing such products
CN102687040B (zh) * 2009-11-18 2015-04-29 圣戈本陶瓷及塑料股份有限公司 用于电离辐射检测的系统和方法
CN105093263B (zh) * 2015-06-04 2017-08-29 西北核技术研究所 基于气体正比室的单粒子径迹成像装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3852610A (en) * 1973-02-26 1974-12-03 Varian Associates Transmission ion chamber
FR2251830B1 (fr) * 1973-11-20 1976-10-01 Commissariat Energie Atomique
US4031396A (en) * 1975-02-28 1977-06-21 General Electric Company X-ray detector
US4032784A (en) * 1975-08-04 1977-06-28 The Gerber Scientific Instrument Company Method and apparatus for examining a body by a beam of x-rays or other penetrating radiation
DE2546948C3 (de) * 1975-10-20 1980-05-29 Siemens Ag, 1000 Berlin Und 8000 Muenchen Röntgendiagnostikanlage für Röntgenaufnahmen mit Mitteln zur organprogrammierten Einstellung der Aufnahmewerte sowie mit einem Röntgenbelichtungsautomaten
DE2556699A1 (de) * 1975-12-17 1977-06-23 Philips Patentverwaltung Roentgengenerator mit belichtungsautomatik
JPS5350787A (en) * 1976-10-20 1978-05-09 Hitachi Medical Corp Xxray detector
JPS5365744A (en) * 1976-11-24 1978-06-12 Nippon Chemical Ind Coated plastic glasses flame
JPS5365774A (en) * 1976-11-25 1978-06-12 Toshiba Corp Radiant ray detector
US4119853A (en) * 1977-06-09 1978-10-10 General Electric Company Multicell X-ray detector
JPS5438789A (en) * 1977-09-02 1979-03-23 Hitachi Medical Corp Tomography
DE2824333A1 (de) * 1978-06-02 1979-12-13 Muenchener Apparatebau Fuer El Zaehlrohr
US4230944A (en) * 1979-02-09 1980-10-28 Advanced Instrument Development, Inc. X-ray system exposure control with ion chamber
US4558223A (en) * 1981-03-02 1985-12-10 Sysmed, Inc. Electronic x-ray recording
DE3121176A1 (de) * 1981-05-27 1982-12-16 Siemens AG, 1000 Berlin und 8000 München Geraet zur bereichsweisen aufnahme von roentgenbildern
NL8400845A (nl) * 1984-03-16 1985-10-16 Optische Ind De Oude Delft Nv Inrichting voor spleetradiografie.

Also Published As

Publication number Publication date
IL80649A0 (en) 1987-02-27
CN1014934B (zh) 1991-11-27
JPH06100656B2 (ja) 1994-12-12
CN86108601A (zh) 1987-06-17
IN168082B (fr) 1991-02-02
JPH07174856A (ja) 1995-07-14
EP0227134A1 (fr) 1987-07-01
DE3671319D1 (de) 1990-06-21
US4896041A (en) 1990-01-23
EP0227134B1 (fr) 1990-05-16
JPS62119490A (ja) 1987-05-30

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BV The patent application has lapsed