NL8401975A - Inrichting voor het testen en bewerken van halfgeleiderschijven. - Google Patents

Inrichting voor het testen en bewerken van halfgeleiderschijven. Download PDF

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Publication number
NL8401975A
NL8401975A NL8401975A NL8401975A NL8401975A NL 8401975 A NL8401975 A NL 8401975A NL 8401975 A NL8401975 A NL 8401975A NL 8401975 A NL8401975 A NL 8401975A NL 8401975 A NL8401975 A NL 8401975A
Authority
NL
Netherlands
Prior art keywords
semiconductor
suction nozzles
plane
testing
semiconductor wafer
Prior art date
Application number
NL8401975A
Other languages
English (en)
Dutch (nl)
Original Assignee
Jenoptik Jena Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jenoptik Jena Gmbh filed Critical Jenoptik Jena Gmbh
Publication of NL8401975A publication Critical patent/NL8401975A/nl

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70716—Stages
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
    • H10P72/53—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment using optical controlling means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
NL8401975A 1983-07-01 1984-06-21 Inrichting voor het testen en bewerken van halfgeleiderschijven. NL8401975A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DD25267683 1983-07-01
DD83252676A DD233284A3 (de) 1983-07-01 1983-07-01 Aufnahmetisch zum pruefen und bearbeiten von halbleiterscheiben

Publications (1)

Publication Number Publication Date
NL8401975A true NL8401975A (nl) 1985-02-01

Family

ID=5548750

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8401975A NL8401975A (nl) 1983-07-01 1984-06-21 Inrichting voor het testen en bewerken van halfgeleiderschijven.

Country Status (5)

Country Link
US (1) US4583847A (de)
DD (1) DD233284A3 (de)
FR (1) FR2548353A1 (de)
NL (1) NL8401975A (de)
SU (1) SU1359662A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4775877A (en) * 1985-10-29 1988-10-04 Canon Kabushiki Kaisha Method and apparatus for processing a plate-like workpiece
US4676649A (en) * 1985-11-27 1987-06-30 Compact Spindle Bearing Corp. Multi-axis gas bearing stage assembly
JPH0722112B2 (ja) * 1987-07-30 1995-03-08 キヤノン株式会社 マスクホルダ並びにそれを用いたマスクの搬送方法
KR100208739B1 (ko) * 1993-07-08 1999-07-15 다나카 아키히로 작업편과 마스크의 간극설정방법 및 간극설정기구
JP3401769B2 (ja) * 1993-12-28 2003-04-28 株式会社ニコン 露光方法、ステージ装置、及び露光装置
JP3689949B2 (ja) * 1995-12-19 2005-08-31 株式会社ニコン 投影露光装置、及び該投影露光装置を用いたパターン形成方法
US6111706A (en) * 1998-07-09 2000-08-29 Gerber Coburn Optical Inc. Adjustable lens support assembly
DE19858428C2 (de) * 1998-12-17 2002-09-12 Leica Microsystems Koordinaten-Messanordnung
DE19948797C2 (de) * 1999-10-11 2001-11-08 Leica Microsystems Substrathalter und Verwendung des Substrathalters in einem hochgenauen Messgerät
JP4469462B2 (ja) * 2000-05-25 2010-05-26 株式会社ニコン キャリア形状測定機
US6736361B2 (en) * 2001-09-04 2004-05-18 Nline Corporation Semiconductor wafer positioning system and method
US9435626B2 (en) * 2011-08-12 2016-09-06 Corning Incorporated Kinematic fixture for transparent part metrology
JP5932296B2 (ja) * 2011-11-02 2016-06-08 株式会社ディスコ 加工装置
FR3067105A1 (fr) * 2017-06-01 2018-12-07 Peugeot Citroen Automobiles Sa Appareil de controle du profil d’une lame d’un dispositif de sertissage

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2388371A1 (fr) * 1977-04-20 1978-11-17 Thomson Csf Procede d'alignement, dans un photorepeteur, d'une plaquette semi-conductrice et des motifs a y projeter et photorepeteur mettant en oeuvre un tel procede
FR2429447A1 (fr) * 1978-06-23 1980-01-18 Thomson Csf Systeme optique de projection muni d'un positionneur de plaque
JPS57117238A (en) * 1981-01-14 1982-07-21 Nippon Kogaku Kk <Nikon> Exposing and baking device for manufacturing integrated circuit with illuminometer
US4431304A (en) * 1981-11-25 1984-02-14 Mayer Herbert E Apparatus for the projection copying of mask patterns on a workpiece

Also Published As

Publication number Publication date
FR2548353A1 (fr) 1985-01-04
SU1359662A1 (ru) 1987-12-15
DD233284A3 (de) 1986-02-26
US4583847A (en) 1986-04-22

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