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JPS5528160B2
(OSRAM)
*
|
1974-12-16 |
1980-07-25 |
|
|
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JPS5231624A
(en)
*
|
1975-05-15 |
1977-03-10 |
Nippon Telegr & Teleph Corp <Ntt> |
Memory system
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|
US4051354A
(en)
*
|
1975-07-03 |
1977-09-27 |
Texas Instruments Incorporated |
Fault-tolerant cell addressable array
|
|
US4047163A
(en)
*
|
1975-07-03 |
1977-09-06 |
Texas Instruments Incorporated |
Fault-tolerant cell addressable array
|
|
JPS52124826A
(en)
*
|
1976-04-12 |
1977-10-20 |
Fujitsu Ltd |
Memory unit
|
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US4228528B2
(en)
*
|
1979-02-09 |
1992-10-06 |
|
Memory with redundant rows and columns
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|
US4495603A
(en)
*
|
1980-07-31 |
1985-01-22 |
Varshney Ramesh C |
Test system for segmented memory
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US4365318A
(en)
*
|
1980-09-15 |
1982-12-21 |
International Business Machines Corp. |
Two speed recirculating memory system using partially good components
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US4446534A
(en)
*
|
1980-12-08 |
1984-05-01 |
National Semiconductor Corporation |
Programmable fuse circuit
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US4376300A
(en)
*
|
1981-01-02 |
1983-03-08 |
Intel Corporation |
Memory system employing mostly good memories
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US4450524A
(en)
*
|
1981-09-23 |
1984-05-22 |
Rca Corporation |
Single chip microcomputer with external decoder and memory and internal logic for disabling the ROM and relocating the RAM
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US4476546A
(en)
*
|
1982-03-19 |
1984-10-09 |
Fairchild Camera & Instrument Corp. |
Programmable address buffer for partial products
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GB2129585B
(en)
*
|
1982-10-29 |
1986-03-05 |
Inmos Ltd |
Memory system including a faulty rom array
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US4581739A
(en)
*
|
1984-04-09 |
1986-04-08 |
International Business Machines Corporation |
Electronically selectable redundant array (ESRA)
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US4653050A
(en)
*
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1984-12-03 |
1987-03-24 |
Trw Inc. |
Fault-tolerant memory system
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US4922451A
(en)
*
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1987-03-23 |
1990-05-01 |
International Business Machines Corporation |
Memory re-mapping in a microcomputer system
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US5051994A
(en)
*
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1989-04-28 |
1991-09-24 |
International Business Machines Corporation |
Computer memory module
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US5644732A
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*
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1990-07-13 |
1997-07-01 |
Sun Microsystems, Inc. |
Method and apparatus for assigning addresses to a computer system's three dimensional packing arrangement
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JPH09282900A
(ja)
*
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1996-04-11 |
1997-10-31 |
Oki Electric Ind Co Ltd |
メモリモジュール
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US6134172A
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1996-12-26 |
2000-10-17 |
Rambus Inc. |
Apparatus for sharing sense amplifiers between memory banks
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1997-01-29 |
1999-07-13 |
Micron Technology, Inc. |
Error correction chip for memory applications
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1998-03-05 |
2001-12-18 |
Micron Technology, Inc. |
Method for recovery of useful areas of partially defective synchronous memory components
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1998-03-05 |
2001-11-06 |
Micron Technology, Inc. |
Recovery of useful areas of partially defective synchronous memory components
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US6381707B1
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1998-04-28 |
2002-04-30 |
Micron Technology, Inc. |
System for decoding addresses for a defective memory array
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US6381708B1
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1998-04-28 |
2002-04-30 |
Micron Technology, Inc. |
Method for decoding addresses for a defective memory array
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TW446955B
(en)
*
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1998-10-30 |
2001-07-21 |
Siemens Ag |
The read/write memory with self-testing device and its associated test method
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1998-12-21 |
2002-12-17 |
Micron Technology, Inc. |
System and method for storing a tag to identify a functional storage location in a memory device
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1999-07-06 |
2000-11-07 |
Micron Technology, Inc. |
Method and apparatus for efficiently testing rambus memory devices
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1999-07-16 |
2000-12-19 |
Micron Technology Inc. |
Semiconductor memory having multiple redundant columns with offset segmentation boundaries
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2000-03-06 |
2003-06-10 |
Micron Technology, Inc. |
Method and apparatus for recovery of useful areas of partially defective direct rambus rimm components
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2000-04-13 |
2007-09-11 |
Micron Technology, Inc. |
Method and apparatus for storing failing part locations in a module
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2001-12-04 |
2005-04-11 |
삼성전자주식회사 |
용량 변경이 가능한 캐쉬 메모리 및 이를 구비한 프로세서칩
|