NL145607B - Vezel met een groot herstel van energie-inhoud en werkwijze voor de vervaardiging ervan. - Google Patents

Vezel met een groot herstel van energie-inhoud en werkwijze voor de vervaardiging ervan.

Info

Publication number
NL145607B
NL145607B NL656504055A NL145607DA NL145607B NL 145607 B NL145607 B NL 145607B NL 656504055 A NL656504055 A NL 656504055A NL 145607D A NL145607D A NL 145607DA NL 145607 B NL145607 B NL 145607B
Authority
NL
Netherlands
Prior art keywords
fiber
procedure
manufacturing
energy content
restoration
Prior art date
Application number
NL656504055A
Other languages
English (en)
Dutch (nl)
Original Assignee
Du Pont
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL145607B publication Critical patent/NL145607B/xx

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/08—Geiger-Müller counter tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J5/00—Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps
    • H01J5/02—Vessels; Containers; Shields associated therewith; Vacuum locks
    • H01J5/18—Windows permeable to X-rays, gamma-rays, or particles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL656504055A 1948-03-27 Vezel met een groot herstel van energie-inhoud en werkwijze voor de vervaardiging ervan. NL145607B (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US17398A US2549987A (en) 1948-03-27 1948-03-27 X-ray diffraction method

Publications (1)

Publication Number Publication Date
NL145607B true NL145607B (nl)

Family

ID=21782365

Family Applications (2)

Application Number Title Priority Date Filing Date
NL72976D NL72976C (de) 1948-03-27
NL656504055A NL145607B (nl) 1948-03-27 Vezel met een groot herstel van energie-inhoud en werkwijze voor de vervaardiging ervan.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
NL72976D NL72976C (de) 1948-03-27

Country Status (6)

Country Link
US (1) US2549987A (de)
BE (1) BE488126A (de)
CH (1) CH272092A (de)
FR (1) FR983754A (de)
GB (1) GB660703A (de)
NL (2) NL145607B (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE503192A (de) * 1950-05-20
US2645720A (en) * 1950-12-13 1953-07-14 Gen Aniline & Film Corp X-ray diffraction device
US2688095A (en) * 1953-06-03 1954-08-31 John H Andrews X-ray camera for underground geological exploration
US2805342A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
US2853618A (en) * 1954-10-27 1958-09-23 Marco John J De Method and apparatus for the use of fluorescent x-rays in powder diffraction
US2887585A (en) * 1955-05-17 1959-05-19 Philips Corp X-ray diffraction method and apparatus
US2996616A (en) * 1957-09-18 1961-08-15 Barth Heinz X-ray diffraction arrangement
DE1210585B (de) * 1960-02-29 1966-02-10 Picker X Ray Corp Waite Mfg Di Roentgenspektralapparat, bestehend aus zwei mit der Strahlung einer gemeinsamen Roentgenroehre betriebenen gleichartigen Spektrometern
AT346629B (de) * 1972-01-28 1978-11-27 Efanov Valery P Verfahren zur roentgendiffraktionstopographier- ung von einkristallen und einrichtung zur durchfuehrung desselben
DE2748501C3 (de) * 1977-10-28 1985-05-30 Born, Eberhard, Dr. Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer
FR2487079A1 (fr) * 1980-07-18 1982-01-22 Anvar Instrument de mesure des fluctuations de l'intensite d'un pinceau de rayons x diffuses par un corps liquide ou solide amorphe
NL8700488A (nl) * 1987-02-27 1988-09-16 Philips Nv Roentgen analyse apparaat met saggitaal gebogen analyse kristal.
DE10228941A1 (de) * 2002-06-28 2004-01-15 Philips Intellectual Property & Standards Gmbh Computer-Tomographiegerät
JP4074874B2 (ja) * 2005-06-30 2008-04-16 株式会社リガク Ｘ線回折装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1164987A (en) * 1914-02-03 1915-12-21 Siemens Ag Method of and apparatus for projecting röntgen images.
US1589833A (en) * 1923-12-21 1926-06-22 Behnken Hermann Measuring device for the examination of electromagnetic waves
DE670322C (de) * 1932-08-28 1939-01-16 Hugo Seemann Dr Vorrichtung zur Aufnahme von Roentgen- und Kathodenstrahldiagrammen von Einkristallen
US2011540A (en) * 1934-04-18 1935-08-13 James F Lee X-ray tube
US2331586A (en) * 1941-11-18 1943-10-12 George G Wasisco X-ray shield
US2386785A (en) * 1942-07-28 1945-10-16 Friedman Herbert Method and means for measuring x-ray diffraction patterns

Also Published As

Publication number Publication date
NL72976C (de)
FR983754A (fr) 1951-06-27
BE488126A (de)
CH272092A (de) 1950-11-30
US2549987A (en) 1951-04-24
GB660703A (en) 1951-11-14

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