NL1036313A1 - Device manufacturing method and lithographic apparatus. - Google Patents
Device manufacturing method and lithographic apparatus. Download PDFInfo
- Publication number
- NL1036313A1 NL1036313A1 NL1036313A NL1036313A NL1036313A1 NL 1036313 A1 NL1036313 A1 NL 1036313A1 NL 1036313 A NL1036313 A NL 1036313A NL 1036313 A NL1036313 A NL 1036313A NL 1036313 A1 NL1036313 A1 NL 1036313A1
- Authority
- NL
- Netherlands
- Prior art keywords
- device manufacturing
- lithographic apparatus
- lithographic
- manufacturing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
- G03F7/70116—Off-axis setting using a programmable means, e.g. liquid crystal display [LCD], digital micromirror device [DMD] or pupil facets
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70591—Testing optical components
- G03F7/706—Aberration measurement
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US919407P | 2007-12-27 | 2007-12-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL1036313A1 true NL1036313A1 (nl) | 2009-06-30 |
Family
ID=40797839
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL1036313A NL1036313A1 (nl) | 2007-12-27 | 2008-12-12 | Device manufacturing method and lithographic apparatus. |
Country Status (3)
Country | Link |
---|---|
US (1) | US8049864B2 (nl) |
JP (1) | JP5060464B2 (nl) |
NL (1) | NL1036313A1 (nl) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2317386B1 (en) * | 2008-12-23 | 2012-07-11 | Carl Zeiss SMT GmbH | Illumination system of a microlithographic projection exposure apparatus |
US8164046B2 (en) * | 2009-07-16 | 2012-04-24 | Carl Zeiss Smt Gmbh | Illumination system for illuminating a mask in a microlithographic projection exposure apparatus |
DE102010044969A1 (de) * | 2010-09-10 | 2012-03-15 | Carl Zeiss Smt Gmbh | Verfahren zum Betreiben einer Projektionsbelichtungsanlage sowie Steuervorrichtung |
US8823921B2 (en) | 2011-08-19 | 2014-09-02 | Ultratech, Inc. | Programmable illuminator for a photolithography system |
US8823930B2 (en) * | 2012-08-07 | 2014-09-02 | Carl Zeiss Industrielle Messtechnik Gmbh | Apparatus and method for inspecting an object |
US9335206B2 (en) * | 2012-08-30 | 2016-05-10 | Kla-Tencor Corporation | Wave front aberration metrology of optics of EUV mask inspection system |
DE102013217269A1 (de) * | 2013-08-29 | 2015-03-05 | Carl Zeiss Smt Gmbh | Mikrospiegel-Array |
US9739719B2 (en) * | 2014-10-31 | 2017-08-22 | Kla-Tencor Corporation | Measurement systems having linked field and pupil signal detection |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH113849A (ja) * | 1997-06-12 | 1999-01-06 | Sony Corp | 可変変形照明フィルタ及び半導体露光装置 |
US6737662B2 (en) | 2001-06-01 | 2004-05-18 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method, device manufactured thereby, control system, computer program, and computer program product |
JP3796464B2 (ja) * | 2002-04-24 | 2006-07-12 | キヤノン株式会社 | 投影光学系の収差計測方法 |
WO2005069079A1 (de) * | 2004-01-16 | 2005-07-28 | Carl Zeiss Smt Ag | Vorrichtung und verfahren zur wellenfrontvermessung eines optischen abbildungssystems und mikrolithographie-projektionsbelichtungsanlage |
US7308368B2 (en) * | 2004-09-15 | 2007-12-11 | Asml Netherlands B.V. | Method and apparatus for vibration detection, method and apparatus for vibration analysis, lithographic apparatus, device manufacturing method, and computer program |
US20070081138A1 (en) * | 2005-10-11 | 2007-04-12 | Asml Netherlands B.V. | Lithographic projection apparatus, device manufacturing methods and mask for use in a device manufacturing method |
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2008
- 2008-12-12 NL NL1036313A patent/NL1036313A1/nl active Search and Examination
- 2008-12-19 JP JP2008323014A patent/JP5060464B2/ja active Active
- 2008-12-29 US US12/345,105 patent/US8049864B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP5060464B2 (ja) | 2012-10-31 |
JP2009158959A (ja) | 2009-07-16 |
US8049864B2 (en) | 2011-11-01 |
US20090168039A1 (en) | 2009-07-02 |
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AD1A | A request for search or an international type search has been filed |