NL1026741A1 - Schermring voor detectorarray met rechtstreekse licht-naar-elektron omzetting. - Google Patents

Schermring voor detectorarray met rechtstreekse licht-naar-elektron omzetting.

Info

Publication number
NL1026741A1
NL1026741A1 NL1026741A NL1026741A NL1026741A1 NL 1026741 A1 NL1026741 A1 NL 1026741A1 NL 1026741 A NL1026741 A NL 1026741A NL 1026741 A NL1026741 A NL 1026741A NL 1026741 A1 NL1026741 A1 NL 1026741A1
Authority
NL
Netherlands
Prior art keywords
detector array
direct light
electron conversion
screen ring
screen
Prior art date
Application number
NL1026741A
Other languages
English (en)
Other versions
NL1026741C2 (nl
Inventor
Wen Li
Jianguo Zhao
Original Assignee
Ge Med Sys Global Tech Co Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ge Med Sys Global Tech Co Llc filed Critical Ge Med Sys Global Tech Co Llc
Publication of NL1026741A1 publication Critical patent/NL1026741A1/nl
Application granted granted Critical
Publication of NL1026741C2 publication Critical patent/NL1026741C2/nl

Links

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
    • A61B6/02—Devices for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computerised tomographs
    • A61B6/032—Transmission computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14659—Direct radiation imagers structures
NL1026741A 2003-08-01 2004-07-29 Schermring voor detectorarray met rechtstreekse licht-naar-elektron omzetting. NL1026741C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/633,119 US6928144B2 (en) 2003-08-01 2003-08-01 Guard ring for direct photo-to-electron conversion detector array
US63311903 2003-08-01

Publications (2)

Publication Number Publication Date
NL1026741A1 true NL1026741A1 (nl) 2005-02-02
NL1026741C2 NL1026741C2 (nl) 2007-03-09

Family

ID=34080739

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1026741A NL1026741C2 (nl) 2003-08-01 2004-07-29 Schermring voor detectorarray met rechtstreekse licht-naar-elektron omzetting.

Country Status (5)

Country Link
US (1) US6928144B2 (nl)
JP (1) JP5016188B2 (nl)
CN (1) CN100457036C (nl)
DE (1) DE102004036316B4 (nl)
NL (1) NL1026741C2 (nl)

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US7676073B2 (en) * 2006-08-29 2010-03-09 Siemens Medical Solutions Usa, Inc. System and method for reducing circular artifacts in tomographic imaging
US7486764B2 (en) * 2007-01-23 2009-02-03 General Electric Company Method and apparatus to reduce charge sharing in pixellated energy discriminating detectors
US9087755B2 (en) * 2007-04-24 2015-07-21 Koninklijke Philips N.V. Photodiodes and fabrication thereof
US8614423B2 (en) * 2009-02-02 2013-12-24 Redlen Technologies, Inc. Solid-state radiation detector with improved sensitivity
US9202961B2 (en) 2009-02-02 2015-12-01 Redlen Technologies Imaging devices with solid-state radiation detector with improved sensitivity
US8165266B2 (en) * 2009-09-10 2012-04-24 General Electric Company Transverse scanning bone densitometer and detector used in same
US20110108703A1 (en) * 2009-11-10 2011-05-12 Orbotech Medical Solutions Ltd. Segmented guard strip
JP5683850B2 (ja) * 2010-01-28 2015-03-11 富士フイルム株式会社 放射線検出素子、及び放射線画像撮影装置
US9423515B2 (en) * 2011-08-30 2016-08-23 Koninklijke Philips N.V. Photon counting detector
US20130049151A1 (en) * 2011-08-31 2013-02-28 General Electric Company Anode-illuminated radiation detector
CN104081223B (zh) * 2011-12-27 2017-06-09 皇家飞利浦有限公司 用于pet探测器的区块安装
JP6231778B2 (ja) * 2013-06-05 2017-11-15 キヤノン株式会社 電気デバイスおよび放射線検査装置
JP6433644B2 (ja) 2013-06-07 2018-12-05 シーメンス アクチエンゲゼルシヤフトＳｉｅｍｅｎｓ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ 半導体ウェハのダイシング方法
JP5886793B2 (ja) 2013-06-11 2016-03-16 浜松ホトニクス株式会社 固体撮像装置
DE102013217941A1 (de) * 2013-09-09 2015-03-12 Siemens Aktiengesellschaft Röntgendetektor und Verfahren
EP2871496B1 (en) 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
CN104749606A (zh) 2013-12-27 2015-07-01 同方威视技术股份有限公司 高纯锗探测器
WO2016087423A1 (en) * 2014-12-05 2016-06-09 Koninklijke Philips N.V. X-ray detector device for inclined angle x-ray radiation
WO2016167311A1 (ja) * 2015-04-15 2016-10-20 株式会社カネカ イオンビーム用の荷電変換膜
JP6185098B2 (ja) * 2016-02-12 2017-08-23 浜松ホトニクス株式会社 固体撮像装置
CN106324649B (zh) * 2016-08-31 2023-09-15 同方威视技术股份有限公司 半导体探测器
US10156645B2 (en) * 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
EP3355355B1 (en) * 2017-01-27 2019-03-13 Detection Technology Oy Asymmetrically positioned guard ring contacts
WO2019019041A1 (en) * 2017-07-26 2019-01-31 Shenzhen Xpectvision Technology Co., Ltd. METHODS OF MAKING AND USING X-RAY DETECTORS
JP6873414B2 (ja) 2017-10-17 2021-05-19 株式会社リガク 処理装置、方法およびプログラム
US10813607B2 (en) * 2018-06-27 2020-10-27 Prismatic Sensors Ab X-ray sensor, method for constructing an x-ray sensor and an x-ray imaging system comprising such an x-ray sensor
FR3105444B1 (fr) * 2019-12-24 2022-01-07 Commissariat Energie Atomique Procédé de détermination d'un biais affectant des pixels d'un détecteur pixellisé de rayonnement ionisant
DE102020111562A1 (de) 2020-04-28 2021-10-28 Arnold & Richter Cine Technik Gmbh & Co. Betriebs Kg Bildsensor
DE102020211327A1 (de) 2020-09-09 2022-03-10 Siemens Healthcare Gmbh DC-Motor, Liege mit DC-Motor und Verfahren zum Betreiben eines DC-Motors
CN113229833A (zh) * 2021-05-29 2021-08-10 西北工业大学 一种骨密度仪用的x射线探测器
WO2023153262A1 (ja) * 2022-02-09 2023-08-17 株式会社ジャパンディスプレイ 検出装置
WO2023189717A1 (ja) * 2022-03-29 2023-10-05 株式会社ジャパンディスプレイ 検出装置

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Also Published As

Publication number Publication date
JP5016188B2 (ja) 2012-09-05
NL1026741C2 (nl) 2007-03-09
DE102004036316A1 (de) 2005-02-17
JP2005057281A (ja) 2005-03-03
US20050023475A1 (en) 2005-02-03
DE102004036316B4 (de) 2016-08-04
CN1579328A (zh) 2005-02-16
CN100457036C (zh) 2009-02-04
US6928144B2 (en) 2005-08-09

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AD1A A request for search or an international type search has been filed
RD2N Patents in respect of which a decision has been taken or a report has been made (novelty report)

Effective date: 20061108

PD2B A search report has been drawn up
MM Lapsed because of non-payment of the annual fee

Effective date: 20200801