NL1023152A1 - Beeldsensoren met offsetaanpassing en verwante werkwijzen. - Google Patents

Beeldsensoren met offsetaanpassing en verwante werkwijzen.

Info

Publication number
NL1023152A1
NL1023152A1 NL1023152A NL1023152A NL1023152A1 NL 1023152 A1 NL1023152 A1 NL 1023152A1 NL 1023152 A NL1023152 A NL 1023152A NL 1023152 A NL1023152 A NL 1023152A NL 1023152 A1 NL1023152 A1 NL 1023152A1
Authority
NL
Netherlands
Prior art keywords
image sensors
related methods
offset adjustment
offset
adjustment
Prior art date
Application number
NL1023152A
Other languages
English (en)
Other versions
NL1023152C2 (nl
Inventor
Jung-Hyun Nam
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of NL1023152A1 publication Critical patent/NL1023152A1/nl
Application granted granted Critical
Publication of NL1023152C2 publication Critical patent/NL1023152C2/nl

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H04N25/633—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current by using optical black pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
NL1023152A 2002-05-14 2003-04-11 Beeldsensoren met offsetaanpassing en verwante werkwijzen. NL1023152C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020020026435A KR100833177B1 (ko) 2002-05-14 2002-05-14 자동적으로 오프 셋을 조정할 수 있는 신호변환회로 및 그방법
KR20020026435 2002-05-14

Publications (2)

Publication Number Publication Date
NL1023152A1 true NL1023152A1 (nl) 2003-11-17
NL1023152C2 NL1023152C2 (nl) 2005-06-16

Family

ID=29398521

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1023152A NL1023152C2 (nl) 2002-05-14 2003-04-11 Beeldsensoren met offsetaanpassing en verwante werkwijzen.

Country Status (6)

Country Link
US (2) US7242820B2 (nl)
KR (1) KR100833177B1 (nl)
CN (1) CN1297136C (nl)
FR (1) FR2839842B1 (nl)
NL (1) NL1023152C2 (nl)
TW (1) TW595208B (nl)

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US7948532B2 (en) * 2006-05-19 2011-05-24 Jai Corporation Solid-state image-pickup device signal processing apparatus with signal compensation circuit
JP4971834B2 (ja) * 2007-03-01 2012-07-11 キヤノン株式会社 撮像装置及び撮像システム
US20080218616A1 (en) * 2007-03-08 2008-09-11 Nokia Corporation Method and apparatus for video acquisition
JP4929090B2 (ja) * 2007-07-26 2012-05-09 パナソニック株式会社 固体撮像装置およびその駆動方法
US7907079B1 (en) * 2008-02-21 2011-03-15 Foveon, Inc. Delta sigma modulator for analog-to-digital converter
CN101409553B (zh) * 2008-11-20 2010-12-08 四川和芯微电子股份有限公司 一种相位延迟线器
JP5304410B2 (ja) * 2009-04-17 2013-10-02 ソニー株式会社 Ａｄ変換装置、固体撮像素子、およびカメラシステム
JP2010258827A (ja) * 2009-04-24 2010-11-11 Sony Corp 黒レベル補正回路および固体撮像装置
US8310580B2 (en) * 2009-07-27 2012-11-13 Sony Corporation Solid-state imaging device and camera system for suppressing occurrence of quantization vertical streaks
US9948878B2 (en) 2010-04-23 2018-04-17 Flir Systems, Inc. Abnormal clock rate detection in imaging sensor arrays
KR20120115860A (ko) * 2011-04-11 2012-10-19 에스케이하이닉스 주식회사 집적회로
US8830361B2 (en) 2012-04-12 2014-09-09 Taiwan Semiconductor Manufacturing Company, Ltd. Method of reducing column fixed pattern noise
WO2014093721A2 (en) * 2012-12-14 2014-06-19 Flir Systems, Inc. Abnormal clock rate detection in imaging sensor arrays
US8957994B2 (en) * 2013-03-15 2015-02-17 Samsung Electronics Co., Ltd. CDS circuit and analog-digital converter using dithering, and image sensor having same
KR102003909B1 (ko) * 2013-06-14 2019-07-25 에스케이하이닉스 주식회사 픽셀 신호 처리 장치 및 그를 이용한 씨모스 이미지 센서
KR102057575B1 (ko) * 2013-07-25 2019-12-20 삼성전자주식회사 이미지 센서 및 그것의 제어 방법
KR102075093B1 (ko) 2013-08-14 2020-03-03 삼성전자주식회사 이미지 센서, 아날로그-디지털 컨버터 및 아날로그-디지털 변환 방법
CN103595411A (zh) * 2013-10-14 2014-02-19 天津市晶奇微电子有限公司 Cmos图像传感器单斜adc数字相关双采样电路
US10165209B2 (en) * 2014-07-25 2018-12-25 Rambus Inc. Low-noise, high dynamic-range image sensor
KR102332942B1 (ko) * 2015-11-27 2021-12-01 에스케이하이닉스 주식회사 전력 소모 감소를 위한 카운팅 장치 및 그를 이용한 아날로그-디지털 변환 장치와 씨모스 이미지 센서
US9762825B2 (en) * 2015-12-30 2017-09-12 Omnivision Technologies, Inc. Method and system for reducing analog-to-digital conversion time for dark signals
KR102546186B1 (ko) * 2016-05-18 2023-06-22 에스케이하이닉스 주식회사 이미지 센싱 장치 및 그의 구동 방법
JP6530736B2 (ja) * 2016-10-18 2019-06-12 キヤノン株式会社 撮像装置及びその制御方法
KR102507208B1 (ko) * 2018-01-10 2023-03-07 삼성디스플레이 주식회사 유기 발광 표시 장치 및 그 구동방법
CN112449125B (zh) * 2019-08-29 2022-06-17 天津大学青岛海洋技术研究院 一种基于自适应阈值调整的图像传感器读出电路
CN112867120B (zh) * 2021-04-25 2021-08-20 杭州涂鸦信息技术有限公司 低功耗控制系统、方法、计算机设备和可读存储介质
CN114951046A (zh) * 2022-05-10 2022-08-30 苏州天准科技股份有限公司 一种锁存计数触发设备及系统

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Also Published As

Publication number Publication date
KR100833177B1 (ko) 2008-05-28
US20030214597A1 (en) 2003-11-20
TW200306739A (en) 2003-11-16
NL1023152C2 (nl) 2005-06-16
US7242820B2 (en) 2007-07-10
CN1297136C (zh) 2007-01-24
FR2839842A1 (fr) 2003-11-21
KR20030088323A (ko) 2003-11-19
US7310452B2 (en) 2007-12-18
US20070229126A1 (en) 2007-10-04
CN1458792A (zh) 2003-11-26
FR2839842B1 (fr) 2006-03-10
TW595208B (en) 2004-06-21

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AD1A A request for search or an international type search has been filed
RD2N Patents in respect of which a decision has been taken or a report has been made (novelty report)

Effective date: 20050411

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MM Lapsed because of non-payment of the annual fee

Effective date: 20150501