NL1015740C1 - Stralingsanalysetoestel voorzien van een regelbare collimator. - Google Patents

Stralingsanalysetoestel voorzien van een regelbare collimator. Download PDF

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Publication number
NL1015740C1
NL1015740C1 NL1015740A NL1015740A NL1015740C1 NL 1015740 C1 NL1015740 C1 NL 1015740C1 NL 1015740 A NL1015740 A NL 1015740A NL 1015740 A NL1015740 A NL 1015740A NL 1015740 C1 NL1015740 C1 NL 1015740C1
Authority
NL
Netherlands
Prior art keywords
collimator
radiation
radiation beam
plates
channels
Prior art date
Application number
NL1015740A
Other languages
English (en)
Dutch (nl)
Inventor
Vladimir Kogan
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Application granted granted Critical
Publication of NL1015740C1 publication Critical patent/NL1015740C1/nl

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
NL1015740A 1999-07-23 2000-07-19 Stralingsanalysetoestel voorzien van een regelbare collimator. NL1015740C1 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP99202443 1999-07-23
EP99202443 1999-07-23

Publications (1)

Publication Number Publication Date
NL1015740C1 true NL1015740C1 (nl) 2000-09-27

Family

ID=8240490

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1015740A NL1015740C1 (nl) 1999-07-23 2000-07-19 Stralingsanalysetoestel voorzien van een regelbare collimator.

Country Status (4)

Country Link
US (1) US6444993B1 (ja)
JP (2) JP4925500B2 (ja)
DE (1) DE10035917B4 (ja)
NL (1) NL1015740C1 (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7127037B2 (en) * 2002-07-26 2006-10-24 Bede Scientific Instruments Ltd. Soller slit using low density materials
US7139366B1 (en) * 2005-05-31 2006-11-21 Osmic, Inc. Two-dimensional small angle x-ray scattering camera
DE102008060070B4 (de) * 2008-12-02 2010-10-14 Bruker Axs Gmbh Röntgenoptisches Element und Diffraktometer mit einer Sollerblende
KR101772324B1 (ko) 2016-04-18 2017-08-28 고려대학교 산학협력단 가변형 핀홀 콜리메이터 및 이를 이용한 방사선 영상 장치
JP7009230B2 (ja) * 2018-01-23 2022-01-25 株式会社日立ビルシステム 非破壊検査装置及び非破壊検査方法
DE102021103037B3 (de) 2021-02-09 2022-03-31 Bruker Axs Gmbh Verstellbarer segmentierter Kollimator
EP4246536A1 (en) * 2022-03-17 2023-09-20 Malvern Panalytical B.V. A parallel plate x-ray collimator having a variable acceptance angle and an x-ray analysis apparatus

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4127398A (en) * 1963-09-18 1978-11-28 Ni-Tec, Inc. Multiple-channel tubular devices
US4205228A (en) * 1978-07-03 1980-05-27 Galileo Electro-Optics Corp. Far field imaging
FI64999C (fi) * 1980-09-22 1984-02-10 Instrumentarium Oy Spaltkollimator foer panoramaroentgenavbildningsanordning
US4419585A (en) * 1981-02-26 1983-12-06 Massachusetts General Hospital Variable angle slant hole collimator
US4419763A (en) * 1981-06-01 1983-12-06 Siemens Gammasonics, Inc. Variable slanted channel collimator
JPH0481684A (ja) * 1990-07-25 1992-03-16 Hitachi Ltd 放射能測定装置
US5192869A (en) * 1990-10-31 1993-03-09 X-Ray Optical Systems, Inc. Device for controlling beams of particles, X-ray and gamma quanta
US5165106A (en) * 1991-06-06 1992-11-17 Siemens Medical Laboratories, Inc. Contour collimator
JP2674675B2 (ja) * 1991-11-01 1997-11-12 株式会社島津製作所 蛍光ｘ線分析装置
JPH06308293A (ja) * 1993-04-28 1994-11-04 Shimadzu Corp ソーラスリット
JPH09281300A (ja) * 1996-04-10 1997-10-31 Ishikawajima Harima Heavy Ind Co Ltd スリット装置
JPH1038823A (ja) * 1996-07-19 1998-02-13 Rigaku Ind Co 蛍光ｘ線分析装置
JPH10227898A (ja) * 1997-02-12 1998-08-25 Rigaku Corp Ｘ線分析装置のソーラースリット装置
US5920073A (en) * 1997-04-22 1999-07-06 Schlumberger Technologies, Inc. Optical system

Also Published As

Publication number Publication date
DE10035917B4 (de) 2008-07-31
US6444993B1 (en) 2002-09-03
DE10035917A1 (de) 2001-03-01
JP4925500B2 (ja) 2012-04-25
JP5127976B2 (ja) 2013-01-23
JP2012042484A (ja) 2012-03-01
JP2001091699A (ja) 2001-04-06

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Legal Events

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Owner name: PANALYTIC B.V.

VD2 Discontinued due to expiration of the term of protection

Effective date: 20060719