NL1015740C1 - Stralingsanalysetoestel voorzien van een regelbare collimator. - Google Patents
Stralingsanalysetoestel voorzien van een regelbare collimator. Download PDFInfo
- Publication number
- NL1015740C1 NL1015740C1 NL1015740A NL1015740A NL1015740C1 NL 1015740 C1 NL1015740 C1 NL 1015740C1 NL 1015740 A NL1015740 A NL 1015740A NL 1015740 A NL1015740 A NL 1015740A NL 1015740 C1 NL1015740 C1 NL 1015740C1
- Authority
- NL
- Netherlands
- Prior art keywords
- collimator
- radiation
- radiation beam
- plates
- channels
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP99202443 | 1999-07-23 | ||
EP99202443 | 1999-07-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL1015740C1 true NL1015740C1 (nl) | 2000-09-27 |
Family
ID=8240490
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL1015740A NL1015740C1 (nl) | 1999-07-23 | 2000-07-19 | Stralingsanalysetoestel voorzien van een regelbare collimator. |
Country Status (4)
Country | Link |
---|---|
US (1) | US6444993B1 (ja) |
JP (2) | JP4925500B2 (ja) |
DE (1) | DE10035917B4 (ja) |
NL (1) | NL1015740C1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7127037B2 (en) * | 2002-07-26 | 2006-10-24 | Bede Scientific Instruments Ltd. | Soller slit using low density materials |
US7139366B1 (en) * | 2005-05-31 | 2006-11-21 | Osmic, Inc. | Two-dimensional small angle x-ray scattering camera |
DE102008060070B4 (de) * | 2008-12-02 | 2010-10-14 | Bruker Axs Gmbh | Röntgenoptisches Element und Diffraktometer mit einer Sollerblende |
KR101772324B1 (ko) | 2016-04-18 | 2017-08-28 | 고려대학교 산학협력단 | 가변형 핀홀 콜리메이터 및 이를 이용한 방사선 영상 장치 |
JP7009230B2 (ja) * | 2018-01-23 | 2022-01-25 | 株式会社日立ビルシステム | 非破壊検査装置及び非破壊検査方法 |
DE102021103037B3 (de) | 2021-02-09 | 2022-03-31 | Bruker Axs Gmbh | Verstellbarer segmentierter Kollimator |
EP4246536A1 (en) * | 2022-03-17 | 2023-09-20 | Malvern Panalytical B.V. | A parallel plate x-ray collimator having a variable acceptance angle and an x-ray analysis apparatus |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4127398A (en) * | 1963-09-18 | 1978-11-28 | Ni-Tec, Inc. | Multiple-channel tubular devices |
US4205228A (en) * | 1978-07-03 | 1980-05-27 | Galileo Electro-Optics Corp. | Far field imaging |
FI64999C (fi) * | 1980-09-22 | 1984-02-10 | Instrumentarium Oy | Spaltkollimator foer panoramaroentgenavbildningsanordning |
US4419585A (en) * | 1981-02-26 | 1983-12-06 | Massachusetts General Hospital | Variable angle slant hole collimator |
US4419763A (en) * | 1981-06-01 | 1983-12-06 | Siemens Gammasonics, Inc. | Variable slanted channel collimator |
JPH0481684A (ja) * | 1990-07-25 | 1992-03-16 | Hitachi Ltd | 放射能測定装置 |
US5192869A (en) * | 1990-10-31 | 1993-03-09 | X-Ray Optical Systems, Inc. | Device for controlling beams of particles, X-ray and gamma quanta |
US5165106A (en) * | 1991-06-06 | 1992-11-17 | Siemens Medical Laboratories, Inc. | Contour collimator |
JP2674675B2 (ja) * | 1991-11-01 | 1997-11-12 | 株式会社島津製作所 | 蛍光x線分析装置 |
JPH06308293A (ja) * | 1993-04-28 | 1994-11-04 | Shimadzu Corp | ソーラスリット |
JPH09281300A (ja) * | 1996-04-10 | 1997-10-31 | Ishikawajima Harima Heavy Ind Co Ltd | スリット装置 |
JPH1038823A (ja) * | 1996-07-19 | 1998-02-13 | Rigaku Ind Co | 蛍光x線分析装置 |
JPH10227898A (ja) * | 1997-02-12 | 1998-08-25 | Rigaku Corp | X線分析装置のソーラースリット装置 |
US5920073A (en) * | 1997-04-22 | 1999-07-06 | Schlumberger Technologies, Inc. | Optical system |
-
2000
- 2000-07-19 NL NL1015740A patent/NL1015740C1/nl not_active IP Right Cessation
- 2000-07-21 DE DE10035917A patent/DE10035917B4/de not_active Expired - Lifetime
- 2000-07-21 US US09/621,524 patent/US6444993B1/en not_active Expired - Lifetime
- 2000-07-21 JP JP2000221190A patent/JP4925500B2/ja not_active Expired - Lifetime
-
2011
- 2011-11-17 JP JP2011251958A patent/JP5127976B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE10035917B4 (de) | 2008-07-31 |
US6444993B1 (en) | 2002-09-03 |
DE10035917A1 (de) | 2001-03-01 |
JP4925500B2 (ja) | 2012-04-25 |
JP5127976B2 (ja) | 2013-01-23 |
JP2012042484A (ja) | 2012-03-01 |
JP2001091699A (ja) | 2001-04-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6874835B2 (ja) | X線分光分析装置 | |
KR102104067B1 (ko) | X선 산란계측 장치 | |
JP5127976B2 (ja) | 可変コリメータを有する放射分析用装置 | |
US6359964B1 (en) | X-ray analysis apparatus including a parabolic X-ray mirror and a crystal monochromator | |
JP2007206076A (ja) | X線による検査対象の非破壊分析方法および測定装置 | |
US9417341B2 (en) | Device and method for determining the energetic composition of electromagnetic waves | |
JP2023139005A (ja) | 小角x線散乱計測計 | |
US5684857A (en) | Method for GE-XRF X-ray analysis of materials, and apparatus for carrying out the method | |
KR20160137951A (ko) | 빔 생성 유닛 및 x선 소각 산란 장치 | |
EP2859336B1 (en) | X-ray beam system offering 1d and 2d beams | |
RU137951U1 (ru) | Устройство для рентгеновского микроанализа | |
US20140098940A1 (en) | Method and apparatus for investigating the x-ray radiographic properties of samples | |
EP2634566B1 (en) | Microdiffraction | |
JP3968350B2 (ja) | X線回折装置及び方法 | |
JP2010286346A (ja) | 分光器 | |
JP6862710B2 (ja) | X線回折装置 | |
EP3845892B1 (en) | X-ray scattering apparatus | |
US20230296536A1 (en) | Parallel plate x-ray collimator having a variable acceptance angle and an x-ray analysis apparatus | |
JP2010197187A (ja) | X線分析装置 | |
WO1997025614A1 (en) | X-ray analysis apparatus including a rotatable primary collimator | |
JPS6353457A (ja) | 二次元走査型状態分析装置 | |
JP2002093594A (ja) | X線管およびx線分析装置 | |
RU2370757C2 (ru) | Устройство для исследования совершенства структуры монокристаллических слоев | |
Bjeoumikhov et al. | Capillary optics for X-rays |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
SD | Assignments of patents |
Owner name: PANALYTIC B.V. |
|
VD2 | Discontinued due to expiration of the term of protection |
Effective date: 20060719 |