MX150612A - Mejoras en aparato de inspeccion para control de calidad de articulos manufacturados - Google Patents

Mejoras en aparato de inspeccion para control de calidad de articulos manufacturados

Info

Publication number
MX150612A
MX150612A MX190132A MX19013281A MX150612A MX 150612 A MX150612 A MX 150612A MX 190132 A MX190132 A MX 190132A MX 19013281 A MX19013281 A MX 19013281A MX 150612 A MX150612 A MX 150612A
Authority
MX
Mexico
Prior art keywords
inspection device
quality control
manufactured items
items
manufactured
Prior art date
Application number
MX190132A
Other languages
English (en)
Spanish (es)
Inventor
Gary G Wagner
Lawrence F Berridge Jr
Original Assignee
Inspection Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspection Technology Inc filed Critical Inspection Technology Inc
Publication of MX150612A publication Critical patent/MX150612A/es

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/987—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns with the intervention of an operator
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
MX190132A 1980-11-17 1981-11-16 Mejoras en aparato de inspeccion para control de calidad de articulos manufacturados MX150612A (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US20774880A 1980-11-17 1980-11-17

Publications (1)

Publication Number Publication Date
MX150612A true MX150612A (es) 1984-05-30

Family

ID=22771840

Family Applications (1)

Application Number Title Priority Date Filing Date
MX190132A MX150612A (es) 1980-11-17 1981-11-16 Mejoras en aparato de inspeccion para control de calidad de articulos manufacturados

Country Status (5)

Country Link
JP (1) JPS57146378A (it)
CA (1) CA1193709A (it)
DE (1) DE3145832A1 (it)
IT (1) IT1139710B (it)
MX (1) MX150612A (it)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
FR2559581B1 (fr) * 1984-02-10 1986-07-11 Siderurgie Fse Inst Rech Procede et installation de detection de defauts de surface sur une bande en cours de defilement
US4696047A (en) * 1985-02-28 1987-09-22 Texas Instruments Incorporated Apparatus for automatically inspecting electrical connecting pins
DE3612256C2 (de) * 1986-04-11 1998-05-14 Twi Tech Wissenschaftliche Ind Verfahren und Einrichtung zur optoelektronischen Qualitätskontrolle
DE19646694A1 (de) 1996-11-12 1998-05-14 Heuft Systemtechnik Gmbh Verfahren zum Testen der Zuverlässigkeit eines Prüfgerätes, insbesondere eines Leerflascheninspektors
DE19646678A1 (de) * 1996-11-12 1998-05-14 Heuft Systemtechnik Gmbh Verfahren zum Testen der Zuverlässigkeit eines Prüfgerätes, insbesondere eines Leerflascheninspektors
JP2002018680A (ja) 2000-07-10 2002-01-22 Mitsubishi Electric Corp 工作機械

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4025202A (en) * 1975-08-07 1977-05-24 Ball Brothers Service Corporation Method and apparatus for inspecting the bottoms of hollow glass articles
JPS5399731A (en) * 1977-02-14 1978-08-31 Barry Wehmiller Co Method of and device for electronically analyzing image of article to be illuminated
JPS6037949B2 (ja) * 1978-06-14 1985-08-29 株式会社東芝 画像表示装置
JPS55119782A (en) * 1979-03-09 1980-09-13 Daihen Corp Pattern automatic inspection method
DE2916159C2 (de) * 1979-04-20 1987-04-23 Hajime Industries, Ltd., Tokio/Tokyo Inspektionseinrichtung

Also Published As

Publication number Publication date
IT8125038A0 (it) 1981-11-12
IT1139710B (it) 1986-09-24
JPS57146378A (en) 1982-09-09
CA1193709A (en) 1985-09-17
DE3145832A1 (de) 1982-09-23

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