DE2916159C2 - - Google Patents

Info

Publication number
DE2916159C2
DE2916159C2 DE19792916159 DE2916159A DE2916159C2 DE 2916159 C2 DE2916159 C2 DE 2916159C2 DE 19792916159 DE19792916159 DE 19792916159 DE 2916159 A DE2916159 A DE 2916159A DE 2916159 C2 DE2916159 C2 DE 2916159C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19792916159
Other versions
DE2916159A1 (de
Inventor
Hajime Chofu Jp Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HAJIME INDUSTRIES Ltd TOKIO/TOKYO JP
Original Assignee
HAJIME INDUSTRIES Ltd TOKIO/TOKYO JP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HAJIME INDUSTRIES Ltd TOKIO/TOKYO JP filed Critical HAJIME INDUSTRIES Ltd TOKIO/TOKYO JP
Priority to DE19792916159 priority Critical patent/DE2916159A1/de
Publication of DE2916159A1 publication Critical patent/DE2916159A1/de
Application granted granted Critical
Publication of DE2916159C2 publication Critical patent/DE2916159C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/14—Quality control systems
DE19792916159 1979-04-20 1979-04-20 Inspektionseinrichtung Granted DE2916159A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19792916159 DE2916159A1 (de) 1979-04-20 1979-04-20 Inspektionseinrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19792916159 DE2916159A1 (de) 1979-04-20 1979-04-20 Inspektionseinrichtung

Publications (2)

Publication Number Publication Date
DE2916159A1 DE2916159A1 (de) 1980-10-30
DE2916159C2 true DE2916159C2 (de) 1987-04-23

Family

ID=6068895

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19792916159 Granted DE2916159A1 (de) 1979-04-20 1979-04-20 Inspektionseinrichtung

Country Status (1)

Country Link
DE (1) DE2916159A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3027775A1 (de) * 1980-07-23 1982-02-04 Eckehardt Dipl.-Chem. 8550 Forchheim Strich Verfahren zur optischen ueberpruefung schnell bewegter homogener materialbahnen auf fehlerstellen
CA1193709A (en) * 1980-11-17 1985-09-17 Gary G. Wagner Operator programmable inspection apparatus
IT1172646B (it) * 1983-09-21 1987-06-18 M S Sistemi Automatici Srl Apparato per rilevare la colorazione di corpi piani in movimento ed atto ad elaborare dei segnali elettrici che variano in funzione della qualita del colore dei detti corpi apparato particolarmente adatto per automatizzare la scelta delle mattonelle di ceramica all'atto della produzione
US4626677A (en) * 1984-09-27 1986-12-02 Esm International, Inc. Continuous normalizer for an electronic circuit that compensates for external and internal drifts factors
DE3612256C2 (de) * 1986-04-11 1998-05-14 Twi Tech Wissenschaftliche Ind Verfahren und Einrichtung zur optoelektronischen Qualitätskontrolle
KR920702765A (ko) * 1989-06-20 1992-10-06 리챠드 에이취. 버나이크 공압 작동 밸브 데이타 취득기
US5231469A (en) * 1990-12-27 1993-07-27 Combustion Engineering, Inc. Laser position indicator for valve stem
DE10001429A1 (de) * 2000-01-15 2001-07-19 Volkswagen Ag Vorrichtung zur Kalibrierung optischer Meßsysteme und Verfahren zur Herstellung der Vorrichtung

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3969577A (en) * 1974-10-15 1976-07-13 Westinghouse Electric Corporation System for evaluating similar objects

Also Published As

Publication number Publication date
DE2916159A1 (de) 1980-10-30

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8125 Change of the main classification

Ipc: G06K 9/64

D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee